“ X100” Series ( TTL ), 5.0 VDC
High Reliability Hybrid Microcircuit Crystal Oscillators
( Similar to M55310/16 )
Features
•
•
•
•
•
•
Ruggedized Crystal Mount
Tristate Output Option
100% Screening Options
Low Phase Noise
Hermetically Sealed Metal Package
ECCN: EAR99
.200 Max
(5.08)
.225 + .025
–
(5.72 + .64)
–
.100 + .005
–
(2.54 + .13)
–
Pin 1 is identified
with a Sq. Corner
PIN #
FUNCTION
1
.507 Max
(12.88)
14
+
.600 – .005
(15.24 + .13)
–
.877 Max
(22.28)
8
7
.300 + .005
–
(7.62 + .13)
–
.018 + .002
–
(4.57 + .05)
–
Applications
•
•
•
•
•
High Shock & Vibration Applications
Navigation Systems
Aerospace Instrumentation
Industrial Controls
Gun Launched Munitions
14
7
8
9
All Others
B+
GND/CASE
OUTPUT
**E/D (Optional)
N/C
Package Specifications & Outline:
•
•
•
•
•
•
•
•
Dimensions: Inches (mm)
Header & Leads Material: Kovar
Cover Material: Nickel
Seal: Hermetic – Resistance Welded
Weight: 4.0 Gms typical, 5.0 Gms Max.
o
Thermal Resistance, Junction to Case ( θ
JC
): 22 C / Watt
o
Lead Soldering, Temp./Time: 260 C, 10 Secs. Max.
Header Finish: 100 to 250 μ inches nickel
Lead Finish: 50 to 80 μ inches gold over 100 to 250 μ inches nickel
E/D ( Enable/Disable ) Input:
A “Low”
level at the input disables the Output
into a high impedance state.
E/D
Input has internal pull-up. It can
be left floating or connected to Vdd.
** Enable/Disable
Option is available for
frequency > 100 KHz
Hot Solder Tinning per MIL-PRF-55310 is optional at additional cost.
Contact Xsis Electronics
at xsis@xsis.com for any special requirements.
ORDERING INFORMATION
( Please build your part number from options below ) :
P/N EXAMPLE:
X143G – 883B – 24.000 MHz
=
5.0 V TTL, + 50 PPM over -55 C to +125 C,
Tristate Output, 883B Screening, 24.000 MHz
o
o
X1
Model #
4
3
G
883B
24.000 MHz
Output Frequency
Frequency Stability
Options
1 = + 0.1%
2 = + 500 PPM
3
4
5
6
7
=
=
=
=
=
+ 100 PPM
+ 50 PPM
+ 20 PPM *
+ 10 PPM *
+ 25 PPM *
100% Screening Options
Operating Temp. Range
Options
1
2
3
4
5
6
=
=
=
=
=
=
0 C
- 40
o
C
- 55
o
C
- 55
o
C
- 40
o
C
- 20
o
C
o
to + 70 C
to + 85
o
C
to +125
o
C
to +105
o
C
to + 95
o
C
to + 70
o
C
o
Tristate Options
G
= Tristate
Blank = No Tristate
883B = Mil - Screening
H
= HI-REL Screening
Blank = No Screening
MIL Screening
is same as
MIL-PRF-55310 Class B Screening
HI-REL Screening
is similar to
MIL-PRF-55310 Class S Screening
Rev 09 /15
* Frequency Stability Options 5, 6 & 7 are not
available for all operating temperature ranges.
Page 1 of 4
Tel. 913-631-0448 Fax. 913-631-1170, www.xsis.com, email xsis@xsis.com
Xsis Electronics, Inc.,
12620 W. 63rd St., Shawnee, KS 66216
“ X100” Series ( TTL ), 5.0 VDC
High Reliability Hybrid Microcircuit Crystal Oscillators
( Similar to M55310/16 )
Electrical Specifications:
Parameter
Output Frequency Range
Frequency Accuracy at +25
o
C
Frequency Stability Vs Temperature
Operating Temperature Range
Supply Voltage (Vdd)
60.0 Hz
5.1 MHz
25.1 MHz
40.1 MHz
60.1 MHz
Specification Limits
60Hz - 100 MHz
+ 15 PPM
See Ordering Information on Page 1
See Ordering Information on Page 1
+ 5 VDC + 10%
- 5.0 MHz
- 25 MHz
- 40 MHz
- 60 MHz
- 100 MHz
30 mA
15 mA
25 mA
35 mA
50 mA
Max.
Max.
Max.
Max.
Max.
Input Current (no Load )
Output Waveform
Output Duty Cycle ( at 1.4V Output Level )
Output High Level
Output Low Level
Output Load
Square Wave, TTL Compatible
60/40% Max.
2.5 V Min.
0.5 V Max.
TTL, 10 Loads Max.
< 20 MHz 15 nS Max.
> 20 MHz 5 nS Max.
( 0.8 to 2.0V Output Levels)
E/D Input > 3.5 Vdd or Open : Normal Output
E/D Input < 0.8V: High Impedance
< 10 MHz 15 mS Max.
> 10 MHz 10 mS Max.
0.15 pS rms Typical
+ 4 PPM Max. for + 10% change in Supply Voltage
+ 3 PPM Max. first year, + 2 PPM Max. per year thereafter
+ 7 VDC
-65
o
C to +125
o
C
Rise & Fall Times ( Typical Load )
Enable/Disable ( E/D)
Start-Up Time
Phase Jitter
( 10 KHz - 20 MHz Integrated)
Freq. Stability Vs Supply Voltage
Aging at 70
o
C
Absolute Maximum Applied Voltage
Storage Temperature
For special requirements, such as, tighter output symmetry, faster start-up time, PIND screening, etc.,
please contact Xsis Electronics at xsis@xsis.com or call us at 913-631-0448.
Rev 09 /15
Page 2 of 4
Tel. 913-631-0448 Fax. 913-631-1170, www.xsis.com, email xsis@xsis.com
Xsis Electronics, Inc.,
12620 W. 63rd St., Shawnee, KS 66216
“ X100” Series ( TTL ), 5.0 VDC
High Reliability Hybrid Microcircuit Crystal Oscillators
( Similar to M55310/16 )
Packaging:
ESD protective conductive foam tray.
Thermal Characteristics:
Junction to case Thermal Constant ( θ
JC
): 22 C / Watt
o
Junction to Ambient ( Device floating in free air) Thermal Constant ( θ
JA
): 85 C / Watt
o
Hi-Rel Screening:
When HI-REL option is selected, Xsis Oscillators are subjected to 100% screening similar to Class “S” screening in
accordance with MIL-PRF-55310. Refer to www.xsis.com for additional details about HI-REL screening.
Typical Phase Noise (dbc/Hz):
Output Frequency
10 MHz
25 MHz
50 MHz
96 MHz
100 MHz
10 Hz
-109
-100
-89
-80
-77
100 Hz
-140
-127
-117
-107
-104
1 KHz
-157
-151
-148
-139
-133
10 KHz
-162
-158
-157
-151
-145
100 KHz
-163
-160
-159
-156
-151
1 MHz
-164
-162
-160
-158
-155
Environmental Specifications:
X100 series oscillators are designed to meet or exceed the Environmental tests specified below. Customized screening and
environmental testing are also available to meet your special requirements.
Test
Vibration
Shock
Temperature Cycling
Thermal Shock
Seal ( Fine and Gross )
Burn-in
Frequency Aging
Altitude
Constant Acceleration
Moisture Resistance
Solderability
Resistance to Soldering Heat
Resistance to Solvents
Internal Water Vapor Content
ESD Classification
Moisture Sensitivity Level
Test Conditions
0.06” DA, 30 G peak, 10 - 2000 Hz, MIL-STD-202, Method 204, Cond. G
1500 G, 0.5 mS, half-Sine, MIL-STD-883, Method 2002, Cond. B
MIL-STD-883, Method 1010, Cond. C
MIL-STD-202, Method 107, Cond. B
MIL-STD-883, Method 1014 Cond. A & C
160 Hours, 125 C, Nominal Supply Voltage & Load
30 days at 70 C, + 1.5 PPM Max.
MIL-STD-202, Method 105, Cond. C
MIL-STD-883, Method 2001, 5000 G
MIL-STD-202, Method 106, Vibration Sub Cycle Omitted
MIL-STD-202, Method 208
MIL-STD-202, Method 210, Cond B. or C as applicable
MIL-STD-202, Method 215
MIL-STD-883, Method 1018
MIL-STD-883, Method 3015, Class 1C, HBM 1000 to 1999
J-STD-020, MSL=1
o
o
Rev 09 /15
Page 3 of 4
Tel. 913-631-0448 Fax. 913-631-1170, www.xsis.com, email xsis@xsis.com
Xsis Electronics, Inc.,
12620 W. 63rd St., Shawnee, KS 66216
“ X100” Series ( TTL ), 5.0 VDC
High Reliability Hybrid Microcircuit Crystal Oscillators
( Similar to M55310/16 )
TTL Test Circuit – 10 TTL Loads
B+
RL
TTL Output Waveform
OUTPUT
MA
14
8
T
R
T
F
High Level
2.0 VDC
Power
Supply
DVM
C
DUT
9
7
RS
CL
GND
1.4 VDC
0.8 VDC
Low Level
T
H
C = .01 OR .1 uF
E/D Input
0 VDC
C
L
= 20 PF, Includes Probe Capacitance
R
L
= 270 Ohms; R
S
= 6 K Ohms
All Diodes are 1N4148 or Equivalent
E/D ( Enable/Disable ) Input
has an internal pull-up
resistor. It can be left floating or connected to Vdd.
T
Symmetry =
T
H
x 100 %
T
Typical Freq. Stability Vs. Temperature
50
40
30
X143 - 883B - 6.400 MHz
Frequenc y Stability – PPM
20
10
0
-10
-20
-30
-40
-50
-60
-50
-40
-30
-20
-10
0
10
20
30
40
50
60
70
80
90
100
110
120
130
Temperature
-
C
o
Rev 09 /15
Page 4 of 4
Tel. 913-631-0448 Fax. 913-631-1170, www.xsis.com, email xsis@xsis.com
Xsis Electronics, Inc.,
12620 W. 63rd St., Shawnee, KS 66216
