High Performance Memory Testing：Design Principles, Fault Modeling and Self-Test

作者：R. Dean Adams

Dealing primarily with embedded memory, Adams (of IBM\'s Design-For- Test department) explains the design considerations of built-in memory self-test on computer chips that evaluates the correctness of memory outputs and the determination of defect rates. His discussion is based on the assumption that proper self test of memories involves the understanding of memory design equally as much as the understanding of memory test.