If Military/Aerospace specified devices are required,
please contact the National Semiconductor Sales Office/
Distributors for availability and specifications.
Storage Temperature (T
STG
)
−65˚C to +150˚C
Maximum Junction Temperature (T
j
)
Ceramic
+175˚C
V
EE
Pin Potential to
Ground Pin
−7.0V to +0.5V
V
TTL
Pin Potential to
Ground Pin
−0.5V to +6.0V
ECL Input Voltage (DC)
V
EE
to +0.5V
ECL Output Current
(DC Output HIGH)
−50 mA
TTL Input Voltage (Note 6)
−0.5V to +6.0V
TTL Input Current (Note 6)
−30 mA to +5.0 mA
Voltage Applied to Output in HIGH State
TRI-STATE Output
Current Applied to TTL
Output in LOW State (Max)
ESD (Note 5)
−0.5V to +5.5V
Twice the Rated I
OL
(mA)
≥2000V
Recommended Operating
Conditions
Case Temperature (T
C
)
Military
ECL Supply Voltage (V
EE
)
TTL Supply Voltage (V
TTL
)
–55˚C to +125˚C
−5.7V to −4.2V
+4.5V to +5.5V
Note 4:
Absolute maximum ratings are those values beyond which the de-
vice may be damaged or have its useful life impaired. Functional operation
under these conditions is not implied.
Note 5:
ESD testing conforms to MIL-STD-883, Method 3015.
Note 6:
Either voltage limit or current limit is sufficient to protect inputs.
Military Version
TTL-to-ECL DC Electrical Characteristics
V
EE
= −4.2V to −5.7V, V
CC
= V
CCA
= GND, T
C
= −55˚C to +125˚C, V
TTL
= +4.5V to +5.5V
Symbol
V
OH
Parameter
Output HIGH Voltage
Min
−1025
−1085
V
OL
Output LOW Voltage
−1830
−1830
Cutoff Voltage
Max
−870
−870
−1620
−1555
−1950
−1850
V
OHC
Output HIGH Voltage
−1035
−1085
V
OLC
Output LOW Voltage
−1610
−1555
V
IH
V
IL
I
IH
Input HIGH Voltage
Input LOW Voltage
Input HIGH Current
Breakdown Test
I
IL
V
FCD
I
EE
Input LOW Current
Input Clamp
Diode Voltage
V
EE
Supply Current
−206
−70
mA
−1.0
−1.2
2.0
0.8
70
1.0
Units
mV
mV
mV
mV
mV
mV
mV
mV
mV
mV
V
V
µA
mA
mA
V
T
C
0˚C to
+125˚C
−55˚C
0˚C to
+125˚C
−55˚C
0˚C to
+125˚C
−55˚C
0˚C to
+125˚C
−55˚C
0˚C to
+125˚C
−55˚C
−55˚C to
+125˚C
−55˚C to
+125˚C
−55˚C to
125˚C
−55˚C to
+125˚C
−55˚C to
+125˚C
−55˚C to
+125˚ C
−55˚C to
+125˚C
OE and DIR High
Inputs Open
V
EE
= −4.2V to −5.7V
I
IN
= −18 mA
V
IN
= +0.5V
(Notes 7, 8,
9)
(Notes 7, 8,
9)
(Notes 7, 8,
9)
V
IN
= +5.5V
V
IN
= +2.7V
Over V
TTL
, V
EE
, T
C
Range
Over V
TTL
, V
EE
, T
C
Range
(Notes 7, 8,
9, 10)
(Notes 7, 8,
9, 10)
(Notes 7, 8,
9)
V
IN
= V
IH
(Min)
or V
IL
(Max)
Loading with
50Ω0 to −2.0V
(Notes 7, 8,
9)
OE or DIR Low
V
IN
= V
IH
(Max)
or V
IL
(Min)
Conditions
Loading with
50Ω to −2.0V
Notes
(Notes 7, 8,
9)
www.national.com
4
Military Version
ECL-to-TTL DC Electrical Characteristics
V
EE
= −4.2V to −5.7V, V
CC
= V
CCA
= GND, T
C
= −55˚C to +125˚C, C
L
= 50 pF, V
TTL
= +4.5V to + 5.5V
Symbol
V
OH
V
OL
V
IH
V
IL
I
IH
I
IL
I
OZHT
I
OZLT
I
OS
I
TTL
Parameter
Output HIGH Voltage
Output LOW Voltage
Input HIGH Voltage
Input LOW Voltage
Input HIGH Current
Input LOW Current
TRI-STATE Current
Output High
TRI-STATE Current
Output Low
Output Short-Circuit
CURRENT
V
TTL
Supply Current
70
47
70
mA
mA
mA
−60
−150
mA
−1.0
mA
0.50
70
−1165
Min
2.5
2.4
0.5
−870
mV
mV
mV
µA
µA
µA
Max Units
mV
T
C
0˚C to +125˚C
−55˚C
−55˚C
+125˚C
−55˚C
+125˚C
−1830 −1475
350
500
−55˚C to
+125˚C
0˚C to
+125˚C
−55˚C to
+125˚C
−55˚C to
+125˚C
−55˚C to
+125˚C
−55˚C to
+125˚C
−55˚C to
+125˚C
TTL Outputs Low
TTL Output High
TTL Output in TRI-STATE
(Notes 7, 8, 9)
V
OUT
= 0.0V, V
TTL
= +5.5V
(Notes 7, 8, 9)
V
OUT
= +0.5V
(Notes 7, 8, 9)
Guaranteed HIGH Signal
for All Inputs
Guaranteed LOW Signal
for All Inputs
V
EE
= −5.7V
V
IN
= V
IH
(Max)
V
EE
= −4.2V
V
IN
= V
IL
(Min)
V
OUT
= +2.7V
(Notes 7, 8, 9, 10)
(Notes 7, 8, 9)
(Notes 7, 8, 9)
(Notes 7, 8, 9)
(Notes 7, 8, 9, 10)
I
OL
= 24 mA, V
TTL
= 4.50V
I
OH
Conditions
= −1 mA, V
TTL
= 4.50V
Notes
(Notes 7, 8, 9)
Note 7:
F100K 300 Series cold temperature testing is performed by temperature soaking (to guarantee junction temperature equals −55˚C), then testing immediately
without allowing for the junction temperature to stabilize due to heat dissipation after power-up. This provides “cold start” specs which can be considered a worst case
condition at cold temperatures.
Note 8:
Screen tested 100% on each device at −55˚C, +25˚C, and +125˚C, Subgroups, 1, 2 3, 7, and 8.
Note 9:
Sample tested (Method 5005, Table I) on each manufactured lot at −55˚C, +25˚C, and +125˚C, Subgroups A1, 2, 3, 7, and 8.
Note 10:
Guaranteed by applying specified input condition and testing V
