首页 > 器件类别 > 分立半导体 > 晶体管

2N7002KFN3

60V N-Channel Enhancement Mode MOSFET - ESD Protected

器件类别:分立半导体    晶体管   

厂商名称:强茂(PANJIT)

厂商官网:http://www.panjit.com.tw/

器件标准:

下载文档
器件参数
参数名称
属性值
是否无铅
不含铅
是否Rohs认证
符合
零件包装代码
DFN
包装说明
CHIP CARRIER, R-XBCC-N3
针数
3
Reach Compliance Code
compli
ECCN代码
EAR99
其他特性
ULTRA-LOW RESISTANCE
外壳连接
DRAIN
配置
SINGLE WITH BUILT-IN DIODE
最小漏源击穿电压
60 V
最大漏极电流 (ID)
0.115 A
最大漏源导通电阻
3 Ω
FET 技术
METAL-OXIDE SEMICONDUCTOR
最大反馈电容 (Crss)
5 pF
JESD-30 代码
R-XBCC-N3
元件数量
1
端子数量
3
工作模式
ENHANCEMENT MODE
封装主体材料
UNSPECIFIED
封装形状
RECTANGULAR
封装形式
CHIP CARRIER
峰值回流温度(摄氏度)
NOT SPECIFIED
极性/信道类型
N-CHANNEL
认证状态
Not Qualified
表面贴装
YES
端子形式
NO LEAD
端子位置
BOTTOM
处于峰值回流温度下的最长时间
NOT SPECIFIED
晶体管应用
SWITCHING
晶体管元件材料
SILICON
Base Number Matches
1
文档预览
2N7002KFN3
60V N-Channel Enhancement Mode MOSFET - ESD Protected
FEATURES
• R
DS(ON)
, V
GS
@10V,I
DS
@500mA=3Ω
0.026(0.65)
0.021(0.55)
DFN 3L
0.042(1.05)
0.037(0.95)
Unit : inch(mm)
• R
DS(ON)
, V
GS
@4.5V,I
DS
@200mA=4Ω
• Advanced Trench Process Technology
• High Density Cell Design For Ultra Low On-Resistance
• Specially Designed for Battery Operated Systems, Solid-State Relays
Drivers : Relays, Displays, Lamps, Solenoids, Memories, etc.
• ESD Protected 2KV HBM
• In compliance with EU RoHS 2002/95/EC directives
• Very Low Leakage Current In Off Condition
0.0 22 (0.55)
0.047(0.45)
0.002(0.05) MAX.
0.013(0.32)
0.008(0.22)
0.022(0.55)
0.047(0.45)
0.014(0.36)
0.013(0.32)
0.008(0.22)
0.0 14 (0.20)
MECHANICALDATA
• Case: DFN 3L Package
• Terminals : Solderable per MIL-STD-750,Method 2026
• Marking : AU
0.0 08 (0.20)
0.004(0.10)
0.0 08 (0.20)
2
3
1
Maximum RATINGS and Thermal Characteristics (T
A
=25
O
C unless otherwise noted )
PA RA M E TE R
D ra i n-S o urc e Vo lta g e
G a te -S o ur c e Vo lta g e
C o nti nuo us D ra i n C urr e nt
P uls e d D r a i n C urr e nt
1)
S ym b o l
V
DS
V
GS
I
D
I
D M
T
A
=2 5
O
C
T
A
=7 5
O
C
P
D
T
J
,T
S TG
R
θ
JA
Li mi t
60
+2 0
11 5
800
200
150
-5 5 to + 1 5 0
883
0.004(0.10)
Uni ts
V
V
mA
mA
mW
O
M a xi m um P o we r D i s s i p a ti o n
O p e r a ti ng J unc ti o n a nd S to r a g e Te m p e ra tur e
Ra ng e
Junction-to Ambient Thermal Resistance(PCB mounted)
2
C
O
C /W
Note: 1. Maximum DC current limited by the package
2. Surface mounted on FR4 board, t < 5 sec
PAN JIT RESERVES THE RIGHT TO IMPROVE PRODUCT DESIGN,FUNCTIONS AND RELIABILITY WITHOUT NOTICE
September 03.2010-REV.00
PAGE . 1
2N7002KFN3
ELECTRICALCHARACTERISTICS
P a ra m e te r
S ta ti c
D ra i n-S o urc e B re a k d o wn
Vo lta g e
G a te Thre s ho ld Vo lta g e
D ra i n-S o urc e On-S ta te
Re s i s ta nc e
D ra i n-S o urc e On-S ta te
Re s i s ta nc e
Ze r o Ga te Vo lta g e D ra i n
C ur re nt
Gate Body Leakage
Forward Transconductance
Dynamic
To ta l Ga te C ha r g e
Tur n- On D e la y Ti m e
Tur n- Off D e la y Ti m e
Inp ut C a p a c i ta nc e
O utp ut C a p a c i ta nc e
Re ve r s e Tra ns fe r
C a p a c i ta nc e
S o urc e - D r a i n D i o d e
D i o d e F o rwa r d Vo lta g e
C o nti nuo us D i o d e F o r wa rd
C ur re nt
P uls e d D i o d e F o r wa rd
C ur re nt
V
SD
I
s
I
s M
I
S
=2 0 0 m A , V
GS
=0 V
-
-
-
-
-
0 .8 2
-
-
1 .3
11 5
800
V
mA
mA
Q
g
t
on
t
o ff
C
iss
C
oss
C
rss
V
D S
= 2 5 V, V
GS
=0 V
f=1 .0 M H
Z
V
D S
= 1 5 V, I
D
= 2 0 0 m A
V
GS
=4.5V
V
DD
=30V , R
L
=150Ω
I
D
=200mA , V
GEN
=10V
R
G
=10Ω
-
-
-
-
-
-
-
-
-
-
-
-
0 .8
20
ns
40
35
10
5
pF
nC
B V
DSS
V
GS ( th)
R
D S ( o n)
R
D S ( o n)
I
D S S
I
GS S
g
fS
V
GS
=0 V, I
D
=1 0
μ
A
V
D S
=V
GS
, I
D
=2 5 0
μ
A
V
GS
=4.5V, I
D
=200mA
V
GS
=10V, I
D
=500mA
V
DS
=60V, V
GS
=0V
V
GS
=+2 0 V, V
D S
=0 V
V
D S
= 1 5 V, I
D
= 2 5 0 m A
60
1
-
-
-
-
100
-
-
-
-
-
-
-
-
2 .5
4 .0
Ω
3.0
1
+1 0
-
μ
A
μ
A
mS
V
V
S ym b o l
Te s t C o nd i ti o n
M i n.
Typ .
M a x.
Uni ts
Switching
Test Circuit
V
IN
V
DD
R
L
V
OUT
Gate Charge
Test Circuit
V
GS
V
DD
R
L
R
G
1mA
R
G
September 03.2010-REV.00
PAGE . 2
2N7002KFN3
Typical Characteristics Curves (T
A
=25 C,unless otherwise noted)
O
I
D
- Drain-to-Source Current (A)
V
GS
= 6.0~10V
1
5.0V
5.0V
I
D
- Drain Source Current (A)
1.2
1.2
1
0.8
0.6
0.4
0.2
0
0
V
DS
=10V
0.8
0.6
0.4
4.0V
4.0V
3.0V
3.0V
0
0
1
2
3
4
5
T
J
=25
0.2
1
2
3
4
5
6
V
DS
- Drain-to-Source Voltage (V)
V
GS
- Gate-to-Source Voltage (V)
Fig. 1-TYPICAL FORWARD CHARACTERISTIC
FIG.1- Output Characteristic
FIG.2- Transfer Characteristic
5
5
R
DS(ON)
- On-Resistance (
W
)
R
DS(ON)
- On-Resistance (
W
)
4
3
V
GS
= 4.5V
2
1
0
4
3
I
D
=500m A
I
I
D
=200mA
D
=200m A
2
1
V
GS
=10V
0
0
0.2
0.4
0.6
0.8
1
2
3
4
5
6
7
8
9
10
I
D
- Drain Current (A)
V
GS
- Gate-to-Source Voltage (V)
FIG.3- On Resistance vs Drain Current
FIG.4- On Resistance vs Gate to Source Voltage
R
DS(ON)
- On-Resistance(Normalized)
1.8
V
GS
=10V
1.6
1.4
1.2
1
0.8
0.6
-50
I
D
=500mA
-25
0
25
50
75
100
o
125
150
T
J
- Junction Temperature ( C)
FIG.5- On Resistance vs Junction Temperature
September 03.2010-REV.00
PAGE . 3
2N7002KFN3
10
Vgs
Qg
V
GS
- Gate-to-Source Voltage (V)
8
6
4
2
0
V
DS
=10V
I
D
=250mA
Vgs(th)
Qg(th)
Qgs
Qsw
0
0.2
0.4
0.6
0.8
1
Qgd
Qg
Q
g
- Gate Charge (nC)
Fig.6 - Gate Charge Waveform
V
th
- G-S Threshold Voltage (NORMALIZED)
Fig.7 - Gate Charge
I
D
=250mA
1.1
1
0.9
0.8
0.7
-50
BV
DSS
- Breakdown Voltage (V)
1.2
88
86
84
82
80
78
76
74
72
-50
ID = 250uA
-25
0
25
50
75
100
125
150
-25
0
25
50
75
100
125
150
T
J
- Junction Temperature (
o
C)
T
J
- Junction Temperature (
o
C)
Fig.8 - Threshold Voltage vs Temperature
Fig.9 - Breakdown Voltage vs Junction Temperature
10
V
GS
=0V
I
S
- Source Current (A)
1
0.1
T
J
=125
25
-55
0.01
0.2
0.4
0.6
0.8
1
1.2
1.4
1.6
V
SD
- Source-to-Drain Voltage (V)
Fig.10 - Source-Drain Diode Forward Voltage
September 03.2010-REV.00
PAGE . 4
2N7002KFN3
MOUNTING PAD LAYOUT
DFN 3L
0.043
(1.10)
0.017
(0.42)
0.010
(0.26)
0.02 8
(0.70)
0.004
(0.10)
0.02 7
(0.68)
ORDER INFORMATION
• Packing information
T/R - 8K per 7" plastic Reel
LEGAL STATEMENT
Copyright PanJit International, Inc 2010
The information presented in this document is believed to be accurate and reliable. The specifications and information herein
are subject to change without notice. Pan Jit makes no warranty, representation or guarantee regarding the suitability of its
products for any particular purpose. Pan Jit products are not authorized for use in life support devices or systems. Pan Jit
does not convey any license under its patent rights or rights of others.
September 03.2010-REV.00
0.010
(0.25)
0.024
(0.60)
PAGE . 5
查看更多>
答题抽奖:Mentor Tessent Automotive相关测试解决方案
活动详情答题抽奖:MentorTessentAutomotive相关测试解决方案乘用车中的电子部分持续快速增长,驱动这一现象的主要因素是乘用车中集成了各种高级安全功能。整个行业向全自动驾驶汽车的转变有望进一步增加此类安全功能的数量,进而增加电子部分的比重。为帮助企业满足ISO26262标准强制要求的质量和可靠性指标,MentorTessent产品系列提供了一套全面的测试解决方案。而且MentorTessent产品保持不断创新,满足市场最严格的要求和应对市场最残酷的挑战。...
EEWORLD社区 综合技术交流
解读x86、ARM和MIPS三种主流芯片架构(转)
转自http://www.eepw.com.cn/article/268232.htm指令集可分为复杂指令集(CISC)和精简指令集(RISC)两部分,代表架构分别是x86、ARM和MIPS。ARMRISC是为了提高处理器运行速度而设计的芯片体系,它的关键技术在于流水线操作即在一个时钟周期里完成多条指令。相较复杂指令集CISC而言,以RISC为架构体系的ARM指令集的指令格式统一、种类少、寻址方式少,简单的指令意味着相应硬件线路可以尽量做到最佳化,从而提高执行速率。...
白丁 综合技术交流
逛展全攻略 | 11.6-8深圳年度芯片×封测×嵌入式大展终于来了!
ELEXCON2022深圳国际电子展暨嵌入式系统展第六届中国系统级封装大会暨展览在全力做好疫情防控的基础上11.6-8联袂登场深圳会展中心(福田)年度芯片+封测+嵌入式系统大展400+品牌展商、近20场高端论坛前瞻预见新产品、新趋势、新业态!展会时间/地点11月6日09:00-17:0011月7日09:00-17:0011月8日09:00-16:30深圳会展中心(福田)1/...
eric_wang 综合技术交流
【直播FAQ】Keysight HDMI 2.1b 测试技术研讨会
直播主题:HDMI2.1b测试技术研讨会直播时间:2024年3月29日(周五)下午14:00-16:00直播介绍:HDMI规范HDMI2.1b是最新版HDMI规范,支持一系列更高的视频分辨率和刷新频率,包括8K60和4K120以及高达10K的分辨率。同时支持动态HDR格式,带宽能力增加到48GbpsHDMI。只需一根升级线缆即可与HDMI生态系统无缝集成。本期研讨会将会对HDMI2.1b设计仿真更新、规范更新及测试解决方案更新...
EEWORLD社区 综合技术交流
采用pyTorch训练CNN的讨论
采用pyTorch训练CNN,既可以在CPU上,也可以在GPU上训练。1、安装支持GPU的pyTorch;2、使用pytorch中的函数判断是否支持GPU:g_support=torch.cunda.is_available()ifg_support:device=torch.device('cuda:0')else:device...
ljg2np 综合技术交流