AN79N00 Series
3-pin Negative Output Voltage Regulator (300mA Type)
s
Overview
The AN79N00 series is 3-pin fixed negative output volt-
age regulators. Stabilized fixed output voltage is obtained
from unstable DC input voltage without using any exter-
nal components. 12 types of output voltage are available
; –4V, –5V, –6V, –7V, –8V, –9V, –10V, –12V, –15V,
–18V, –20V and –24V. They can be used widely in power
circuits with current capacitance up to 300mA.
Unit:mm
8.0
3.05
+0.5
– 0.1
3.8
1.94
0.75±0.25
s
Features
• No external components
• Output voltage : –4V, –5V, –6V, –7V, –8V, –9V,
–10V, –12V, –15V, –18V, –20V, –24V
• Short-circuit current limiting built-in
• Thermal overload protection built-in
• Output transistor safe area compensation
15.0min.
11.5max.
0.5±0.25
1.44
2.3
4.6
3.5max.
0.5±0.1
1.76
1 : Common
2 : Input
3 : Output
1
2
3
JEDEC : TO-126 (SSIP003-P-0000E)
s
Block Diagram
1
R
1
+
Voltage
Reference
Error Amp.
R
2
–
3
Starter
Thermal
Protection
Current
Limiter
R
SC
2
Input
Q
1
Pass Tr.
Output
Common
s
Absolute Maximum Ratings (Ta=25˚C)
Parameter
Input voltage
Power dissipation
Operating ambient temperature
Storage temperature
Symbol
V
I
P
D
T
opr
T
stg
Rating
–35 *
1
–40
8 *
3
*
2
Unit
V
V
W
˚C
˚C
–20 to +80
–55 to +150
*1 AN79N04, AN79N05, AN79N06, AN79N07, AN79N08, AN79N09, AN79N10, AN79N12, AN79N15, AN79N18
*2 AN79N20, AN79N24
*3 Follow the derating curve, When T
j
exceeds 150˚C, the internal circuit cuts off the output.
s
Electrical Characteristics (Ta=25˚C)
·
AN79N04 (–4V Type)
Output voltage
Parameter
Output voltage tolerance
Line regulation
Load regulation
Bias current
Input bias current fluctuation
Load bias current fluctuation
Output noise voltage
Ripple rejection ratio
Minimum input/output voltage difference
Output short circuit current
Peak output current
Output voltage temperature coefficient
Symbol
V
O
V
O
REG
IN
REG
L
I
Bias
∆I
Bias (IN)
∆I
Bias (L)
V
no
RR
V
DIF (min.)
I
O (Short)
I
O (Peak)
∆V
O
/Ta
T
j
=25˚C
Condition
V
I
=–6 to –25V, I
O
=5 to 200mA
V
I
=–6 to –25V, T
j
=25˚C
V
I
=–7 to –17V, T
j
=25˚C
I
O
=1 to 300mA, T
j
=25˚C
I
O
=5 to 200mA, T
j
=25˚C
T
j
=25˚C
V
I
=–7 to –25V, T
j
=25˚C
I
O
=5 to 200mA, T
j
=25˚C
f=10Hz to 100kHz
V
I
=–7 to –17V, I
O
=50mA,
f=120Hz
I
O
=200mA, T
j
=25˚C
V
I
=–35V, T
j
=25˚C
T
j
=25˚C
I
O
=5mA
min
–3.84
–3.8
typ
–4
9
4
20
10
3
max
–4.16
–4.2
40
20
80
40
5
0.5
0.1
Unit
V
V
mV
mV
mV
mV
mA
mA
mA
µV
dB
100
60
1.1
10
500
– 0.4
V
mA
mA
mV/˚C
Note 1) The specified condition T
j
=25˚C means that the test should be carried out with the test time so short (within 10ms) that the
drift in characteristic value due to the rise in chip junction temperature can be ignored.
Note 2) When not specified, V
I
=–9V, I
O
=100mA, C
I
=2µF, C
O
=1µF and T
j
=0 to 125˚C
s
Electrical Characteristics (Ta=25˚C)
·
AN79N05 (–5V Type)
Parameter
Output voltage
Output voltage tolerance
Line regulation
Load regulation
Bias current
Input bias current fluctuation
Load bias current fluctuation
Output noise voltage
Ripple rejection ratio
Minimum input/output voltage difference
Output short circuit current
Peak output current
Output voltage temperature coefficient
Symbol
V
O
V
O
REG
IN
REG
L
I
Bias
∆I
Bias (IN)
∆I
Bias (L)
V
no
RR
V
DIF (min.)
I
O (Short)
I
O (Peak)
∆V
O
/Ta
T
j
=25˚C
V
I
=–7 to –25V, I
O
=5 to 200mA
V
I
=–7 to –25V, T
j
=25˚C
V
I
=–8 to –18V, T
j
=25˚C
I
O
=1 to 300mA, T
j
=25˚C
I
O
=5 to 200mA, T
j
=25˚C
T
j
=25˚C
V
I
=–8 to –25V, T
j
=25˚C
I
O
=5 to 200mA, T
j
=25˚C
f=10Hz to 100kHz
V
I
=–8 to –18V, I
O
=50mA,
f=120Hz
I
O
=200mA, T
j
=25˚C
V
I
=–35V, T
j
=25˚C
T
j
=25˚C
I
O
=5mA
125
60
1.1
10
500
– 0.4
Condition
min
–4.8
–4.75
10
5
20
10
3
typ
–5
max
–5.2
–5.25
50
30
100
50
5
0.5
0.1
Unit
V
V
mV
mV
mV
mV
mA
mA
mA
µV
dB
V
mA
mA
mV/˚C
Note 1) The specified condition T
j
=25˚C means that the test should be carried out with the test time so short (within 10ms) that the
drift in characteristic value due to the rise in chip junction temperature can be ignored.
Note 2) When not specified, V
I
=–10V, I
O
=100mA, C
I
=2µF, C
O
=1µF and T
j
=0 to 125˚C
·
AN79N06 (–6V Type)
Parameter
Output voltage
Output voltage tolerance
Line regulation
Load regulation
Bias current
Input bias current fluctuation
Load bias current fluctuation
Output noise voltage
Ripple rejection ratio
Minimum input/output voltage difference
Output short circuit current
Peak output current
Output voltage temperature coefficient
Symbol
V
O
V
O
REG
IN
REG
L
I
Bias
∆I
Bias (IN)
∆I
Bias (L)
V
no
RR
V
DIF (min.)
I
O (Short)
I
O (Peak)
∆V
O
/Ta
T
j
=25˚C
V
I
=–8 to –25V, I
O
=5 to 200mA
V
I
=–8 to –25V, T
j
=25˚C
V
I
=–9 to –19V, T
j
=25˚C
I
O
=1 to 300mA, T
j
=25˚C
I
O
=5 to 200mA, T
j
=25˚C
T
j
=25˚C
V
I
=–9 to –25V, T
j
=25˚C
I
O
=5 to 200mA, T
j
=25˚C
f=10Hz to 100kHz
V
I
=–9 to –19V, I
O
=50mA,
f=120Hz
I
O
=200mA, T
j
=25˚C
V
I
=–35V, T
j
=25˚C
T
j
=25˚C
I
O
=5mA
150
60
1.1
10
500
– 0.4
Condition
min
–5.75
–5.7
11
6
20
10
3
typ
–6
max
–6.25
–6.3
60
40
120
60
5
0.5
0.1
Unit
V
V
mV
mV
mV
mV
mA
mA
mA
µV
dB
V
mA
mA
mV/˚C
Note 1) The specified condition T
j
=25˚C means that the test should be carried out with the test time so short (within 10ms) that the
drift in characteristic value due to the rise in chip junction temperature can be ignored.
Note 2) When not specified, V
I
=–11V, I
O
=100mA, C
I
=2µF, C
O
=1µF and T
j
=0 to 125˚C
s
Electrical Characteristics (Ta=25˚C)
·
AN79N07 (–7V Type)
Output voltage
Parameter
Output voltage tolerance
Line regulation
Load regulation
Bias current
Input bias current fluctuation
Load bias current fluctuation
Output noise voltage
Ripple rejection ratio
Minimum input/output voltage difference
Output short circuit current
Peak output current
Output voltage temperature coefficient
Symbol
V
O
V
O
REG
IN
REG
L
I
Bias
∆I
Bias (IN)
∆I
Bias (L)
V
no
RR
V
DIF (min.)
I
O (Short)
I
O (Peak)
∆V
O
/Ta
T
j
=25˚C
Condition
V
I
=–9 to –25V, I
O
=5 to 200mA
V
I
=–9 to –25V, T
j
=25˚C
V
I
=–10 to –20V, T
j
=25˚C
I
O
=1 to 300mA, T
j
=25˚C
I
O
=5 to 200mA, T
j
=25˚C
T
j
=25˚C
V
I
=–10 to –25V, T
j
=25˚C
I
O
=5 to 200mA, T
j
=25˚C
f=10Hz to 100kHz
V
I
=–10 to –20V, I
O
=50mA,
f=120Hz
I
O
=200mA, T
j
=25˚C
V
I
=–35V, T
j
=25˚C
T
j
=25˚C
I
O
=5mA
min
–6.7
–6.65
typ
–7
12
7
20
10
3
max
–7.3
–7.35
70
35
140
70
5
0.5
0.1
Unit
V
V
mV
mV
mV
mV
mA
mA
mA
µV
dB
175
59
1.1
10
500
– 0.5
V
mA
mA
mV/˚C
Note 1) The specified condition T
j
=25˚C means that the test should be carried out with the test time so short (within 10ms) that the
drift in characteristic value due to the rise in chip junction temperature can be ignored.
Note 2) When not specified, V
I
=–12V, I
O
=100mA, C
I
=2µF, C
O
=1µF and T
j
=0 to 125˚C
·
AN79N08 (–8V Type)
Parameter
Output voltage
Output voltage tolerance
Line regulation
Load regulation
Bias current
Input bias current fluctuation
Load bias current fluctuation
Output noise voltage
Ripple rejection ratio
Minimum input/output voltage difference
Output short circuit current
Peak output current
Output voltage temperature coefficient
Symbol
V
O
V
O
REG
IN
REG
L
I
Bias
∆I
Bias (IN)
∆I
Bias (L)
V
no
RR
V
DIF (min.)
I
O (Short)
I
O (Peak)
∆V
O
/Ta
T
j
=25˚C
V
I
=–10.5 to –25V, I
O
=5 to 200mA
V
I
=–10.5 to –25V, T
j
=25˚C
V
I
=–11 to –21V, T
j
=25˚C
I
O
=1 to 300mA, T
j
=25˚C
I
O
=5 to 200mA, T
j
=25˚C
T
j
=25˚C
V
I
=–10.5 to –25V, T
j
=25˚C
I
O
=5 to 200mA, T
j
=25˚C
f=10Hz to 100kHz
V
I
=–11.5 to –21.5V,
I
O
=50mA,f=120Hz
I
O
=200mA, T
j
=25˚C
V
I
=–35V, T
j
=25˚C
T
j
=25˚C
I
O
=5mA
200
59
1.1
10
500
– 0.6
Condition
min
–7.7
–7.6
13
8
25
10
3
typ
–8
max
–8.3
–8.4
80
40
160
80
5
0.5
0.1
Unit
V
V
mV
mV
mV
mV
mA
mA
mA
µV
dB
V
mA
mA
mV/˚C
Note 1) The specified condition T
j
=25˚C means that the test should be carried out with the test time so short (within 10ms) that the
drift in characteristic value due to the rise in chip junction temperature can be ignored.
Note 2) When not specified, V
I
=–14V, I
O
=100mA, C
I
=2µF, C
O
=1µF and T
j
=0 to 125˚C
s
Electrical Characteristics (Ta=25˚C)
·
AN79N09 (–9V Type)
Output voltage
Parameter
Output voltage tolerance
Line regulation
Load regulation
Bias current
Input bias current fluctuation
Load bias current fluctuation
Output noise voltage
Ripple rejection ratio
Minimum input/output voltage difference
Output short circuit current
Peak output current
Output voltage temperature coefficient
Symbol
V
O
V
O
REG
IN
REG
L
I
Bias
∆I
Bias (IN)
∆I
Bias (L)
V
no
RR
V
DIF (min.)
I
O (Short)
I
O (Peak)
∆V
O
/Ta
T
j
=25˚C
Condition
V
I
=–11.5 to –26V, I
O
=5 to 200mA
V
I
=–11.5 to –26V, T
j
=25˚C
V
I
=–12 to –22V, T
j
=25˚C
I
O
=1 to 300mA, T
j
=25˚C
I
O
=5 to 200mA, T
j
=25˚C
T
j
=25˚C
V
I
=–11.5 to –26V, T
j
=25˚C
I
O
=5 to 200mA, T
j
=25˚C
f=10Hz to 100kHz
V
I
=–12 to –22V, I
O
=50mA,
f=120Hz
I
O
=200mA, T
j
=25˚C
V
I
=–35V, T
j
=25˚C
T
j
=25˚C
I
O
=5mA
min
–8.65
–8.55
typ
–9
14
9
25
10
3
max
–9.35
–9.45
80
50
180
90
5
0.5
0.1
Unit
V
V
mV
mV
mV
mV
mA
mA
mA
µV
dB
225
58
1.1
10
500
– 0.6
V
mA
mA
mV/˚C
Note 1) The specified condition T
j
=25˚C means that the test should be carried out with the test time so short (within 10ms) that the
drift in characteristic value due to the rise in chip junction temperature can be ignored.
Note 2) When not specified, V
I
=–15V, I
O
=100mA, C
I
=2µF, C
O
=1µF and T
j
=0 to 125˚C
·
AN79N10 (–10V Type)
Parameter
Output voltage
Output voltage tolerance
Line regulation
Load regulation
Bias current
Input bias current fluctuation
Load bias current fluctuation
Output noise voltage
Ripple rejection ratio
Minimum input/output voltage difference
Output short circuit current
Peak output current
Output voltage temperature coefficient
Symbol
V
O
V
O
REG
IN
REG
L
I
Bias
∆I
Bias (IN)
∆I
Bias (L)
V
no
RR
V
DIF (min.)
I
O (Short)
I
O (Peak)
∆V
O
/Ta
T
j
=25˚C
V
I
=–12.5 to –27V, I
O
=5 to 200mA
V
I
=–12.5 to –27V, T
j
=25˚C
V
I
=–13 to –23V, T
j
=25˚C
I
O
=1 to 300mA, T
j
=25˚C
I
O
=5 to 200mA, T
j
=25˚C
T
j
=25˚C
V
I
=–12.5 to –27V, T
j
=25˚C
I
O
=5 to 200mA, T
j
=25˚C
f=10Hz to 100kHz
V
I
=–13 to –23V,
I
O
=50mA,f=120Hz
I
O
=200mA, T
j
=25˚C
V
I
=–35V, T
j
=25˚C
T
j
=25˚C
I
O
=5mA
250
58
1.1
10
500
– 0.7
Condition
min
–9.6
–9.5
15
10
25
10
3.0
typ
–10
max
–10.4
–10.5
80
50
200
100
5
0.5
0.1
Unit
V
V
mV
mV
mV
mV
mA
mA
mA
µV
dB
V
mA
mA
mV/˚C
Note 1) The specified condition T
j
=25˚C means that the test should be carried out with the test time so short (within 10ms) that the
drift in characteristic value due to the rise in chip junction temperature can be ignored.
Note 2) When not specified, V
I
=–16V, I
O
=100mA, C
I
=2µF, C
O
=1µF and T
j
=0 to 125˚C
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