首页 > 器件类别 > 存储 > 存储

AS6YB51216-70BI

Standard SRAM, 512KX16, 70ns, CMOS, PBGA48, 7 X 9 MM, CSP, FBGA-48

器件类别:存储    存储   

厂商名称:ALSC [Alliance Semiconductor Corporation]

下载文档
器件参数
参数名称
属性值
是否Rohs认证
不符合
厂商名称
ALSC [Alliance Semiconductor Corporation]
零件包装代码
BGA
包装说明
TFBGA,
针数
48
Reach Compliance Code
unknown
ECCN代码
3A991.B.2.A
最长访问时间
70 ns
JESD-30 代码
R-PBGA-B48
长度
9 mm
内存密度
8388608 bit
内存集成电路类型
STANDARD SRAM
内存宽度
16
湿度敏感等级
1
功能数量
1
端子数量
48
字数
524288 words
字数代码
512000
工作模式
ASYNCHRONOUS
最高工作温度
85 °C
最低工作温度
-40 °C
组织
512KX16
封装主体材料
PLASTIC/EPOXY
封装代码
TFBGA
封装形状
RECTANGULAR
封装形式
GRID ARRAY, THIN PROFILE, FINE PITCH
并行/串行
PARALLEL
峰值回流温度(摄氏度)
225
认证状态
Not Qualified
座面最大高度
1.2 mm
最大供电电压 (Vsup)
2.2 V
最小供电电压 (Vsup)
1.65 V
标称供电电压 (Vsup)
1.8 V
表面贴装
YES
技术
CMOS
温度等级
INDUSTRIAL
端子形式
BALL
端子节距
0.75 mm
端子位置
BOTTOM
处于峰值回流温度下的最长时间
NOT SPECIFIED
宽度
7 mm
Base Number Matches
1
文档预览
November 2001
Advance Information
Š
AS6YB51216
1.65V to 2.2V 512K × 16 Intelliwatt™ Super Low-Power CMOS SRAM
Features
AS6YB51216
Intelliwatt™ active power circuitry
Industrial temperature range (-40
o
- +85
o
C)
Organization:
524,288 words x 16 bits
1.65V to 2.2V power supply range
Fast access time of 70 ns
Low power consumption: ACTIVE
- 33 mW max at 2.2 V and 70 ns
• Low power consumption: STANDBY
- 33
µ
W max at 2.2V
• 1.0V data retention
• Equal access and cycle times
• Easy memory expansion with CS1, CS2, OE inputs
• Smallest footprint package
- 48-ball FBGA; 7.0 x 9.0 mm
• ESD protection
2000 volts
• Latch-up current
200 mA
Logic block diagram
Row Decoder
V
DD
512K × 16
Array
(8,388,608)
V
SS
BBBBBBBBPin
arrangement (top view)
48-CSP Ball-Grid-Array Package
I/O1–I/O8
I/O9–I/O16
WE
I/O
buffer
Control circuit
Column decoder
A
B
C
D
E
F
G
H
1
LB
I/O9
I/O10
V
SS
V
CC
I/O15
I/O16
A18
2
3
OE
A0
UB
A3
I/O11 A5
I/O12 A17
I/O13 V
SS
I/O14 A14
DNU A12
A8
A9
4
A1
A4
A6
A7
A16
A15
A13
A10
5
A2
CS1
I/O2
I/O4
I/O5
I/O6
WE
A11
6
CS2
I/O1
I/O3
V
CC
V
SS
I/O7
I/O8
DNU
A0~A8
A9~A18
UB
OE
LB
CS1
CS2
Note: DNU = Do Not Use
Selection guide
V
CC
Range
Product
AS6YB51216
Min
(V)
1.65
Typ
(V)
1.8
Max
(V)
2.2
Speed
(ns)
70/85
Power Dissipation
Operating (I
CC1
)
Max (mA)
2
Standby (I
SB1
)
Max (
µ
A)
15
11/1/01; V.0.9.8
Alliance Semiconductor
P. 1 of 11
Copyright © Alliance Semiconductor. All rights reserved.
AS6YB51216
Š
Functional description
The AS6YB51216 is a low-power CMOS 8,388,608-bit Static Random Access Memory (SRAM) device organized as 524,288
words x 16 bits. It is designed for memory applications where slow data access, low power, and simple interfacing are desired.
Equal address access and cycle times (t
AA
, t
RC
, t
WC
) of 70/85 ns are ideal for low-power applications. Active high and low chip
enables (CS1 and CS2) permit easy memory expansion with multiple-bank memory systems.
When CS1 is high or CS2 is low, or UB and LB are high, the device enters standby mode. The AS6YB51216 is guaranteed not to
exceed 33
µ
W at 2.2V. The device also retains data when V
CC
is reduced to 1.0V for even lower power consumption.
The device can also be put into standby mode when deselected (CS1 is high or CS2 is low). The input/output pins (I/O0
through I/O15) are placed in a high-impedance state when deselected ( CS1 is high or CS2 is low), outputs are disabled (OE
High), UB and LB are disabled (UB, LB High), or during a write operation ( CS1 is low or CS2 is high and WE Low).
Writing to the device is accomplished by taking Chip Enables CS1 Low, CS2 High and Write Enable (WE) input Low. If Byte Low
Enable (LB) is Low, then data from I/O pins (I/O0 through I/O7), is written into the location specified on the address pins (A0
through A18). If Byte High Enable (UB) is Low, then data from I/O pins (I/O8 through I/O15) is written into the location
specified on the address pins (A0 through A18). To avoid bus contention, external devices should drive I/O pins only after out-
puts have been disabled with output enable (OE) or write enable (WE).
Reading from the device is accomplished by taking Chip Enable CS1 Low, CS2 High and Output Enable (OE) Low while forcing
the Write Enable (WE) High. If Byte Low Enable (LB) is Low, then data from the memory location specified by the address pins
will appear on I/O0 to I/O7. If Byte High Enable (UB) is Low, then data from memory will appear on I/O8 to I/O15.
These devices provide multiple center power and ground pins, and separate byte enable controls, allowing individual bytes to be
written and read. LB controls the lower bits, I/O1–I/O8, and UB controls the higher bits, I/O9–I/O16.
All chip inputs and outputs are CMOS-compatible, and operation is from a single 1.65V to 2.2V supply. Device is available in the
JEDEC 48-ball FBGA packages.
Absolute maximum ratings
Parameter
Voltage on V
CC
relative to V
SS
Voltage on any I/O pin relative to GND
Power dissipation
Storage temperature (plastic)
Temperature with V
CC
applied
DC output current (low)
Symbol
V
tIN
V
tI/O
P
D
T
stg
T
bias
I
OUT
Min
–0.5
–0.5
–65
–55
1.0
+150
+125
20
Max
V
CC
+ 0.5
Unit
V
V
W
°
C
°
C
mA
Note: Stresses greater than those listed under
Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress rating only and functional opera-
tion of the device at these or any other conditions outside those indicated in the operational sections of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect reliability.
11/1/01; V.0.9.8
Alliance Semiconductor
P. 2 of 11
AS6YB51216
Š
Truth table
CS1
H
X
X
L
L
L
CS2
X
L
X
H
H
H
WE
X
X
X
H
H
H
OE
X
X
X
H
H
L
LB
X
X
H
L
X
L
H
L
L
L
H
L
X
H
L
UB
X
X
H
X
L
H
L
L
H
L
L
I
CC
I
CC
I
CC
High Z
D
OUT
High Z
D
OUT
D
IN
High Z
D
IN
High Z
High Z
D
OUT
D
OUT
High Z
D
IN
D
IN
Write (I
CC
)
Read (I
CC
)
Output disable (I
CC
)
I
SB
High Z
High Z
Standby (I
SB
)
Supply
Current
I/O1–I/O8 I/O9–I/O16
Mode
Key: X = Don’t care, L = Low, H = High.Recommended operating condition (over the operating range)
DC Recommended operating condition (over the operating range)
Parameter
Vcc
V
OH
V
OL
V
IH
V
IL
I
IX
I
OZ
I
CC
I
CC1
@
1 MHz
I
CC2
Description
Supply voltage
Output HIGH Voltage
Output LOW Voltage
Input HIGH Voltage
Input LOW Voltage
Input Load Current
Output Load Current
V
CC
Operating Supply
Current
Average V
CC
Operating
Supply Current at 1 MHz
Average V
CC
Operating
Supply Current
-
I
OH
= –0.1mA
I
OL
= 0.1mA
Test Conditions
-
V
CC
= 1.65V
V
CC
= 1.65V
V
CC
= 2.2V
V
CC
= 1.65V
GND < V
IN
< V
CC
GND < V
O
< V
CC;
Outputs High Z
I
OUT
= 0mA,
f=0
I
OUT
= 0mA,
f =1MHz
I
OUT
= 0mA, f = f
Max
V
CC
= 2.2V
1.4
–0.2
–1
–1
Min
1.65
1.4
0.2
V
CC
+ 0.2
0.4
+1
+1
1
2
15 mA at 70ns
10 mA at 85ns
100
Max
2.2
Unit
V
V
V
V
V
µ
A
µ
A
mA
mA
mA
V
CC
= 2.2V
V
CC
= 2.2V
I
SB
CS1 > V
CC
– 0.2V or
CS Power Down Current; CS2< 0.2V or UB = LB
TTL Inputs
> V
IH
, other inputs =
V
IL
or V
IH
, f = 0
CS1 > V
CC
– 0.2V or
CS2< 0.2V
CS Power Down Current;
UB = LB > V
CC
– 0.2V
CMOS Inputs
other inputs = 0V –
V
CC
, f = f
Max
V
CC
= 2.2V
µ
A
I
SB1
V
CC
= 2.2V
15
µ
A
11/1/01; V.0.9.8
Alliance Semiconductor
P. 3 of 11
AS6YB51216
Š
Capacitance
(f = 1 MHz, T
a
= Room temperature, V
CC
= NOMINAL)

Parameter
Input capacitance
I/O capacitance
Symbol
C
IN
C
I/O
Signals
A, CS1, CS2, WE, OE, LB, UB
I/O
Test conditions
V
IN
= 0V
V
IN
= V
OUT
= 0V
Max
5
7
Unit
pF
pF
Read cycle (over the operating range)

–70/85
Parameter
Read cycle time
Address access time
Chip select to output access time
Output enable (OE) access time
Output hold from address change
Chip select
W
o low Z output
Chip disable to high Z output
OE low to low Z output
UB/LB access time
UB/LB low to low Z
UB/LB high to high Z
OE high to output in high Z
Power up time
Power down time
Symbol
t
RC
t
AA
t
ACS
t
OE
t
OH
t
CLZ
t
CHZ
t
OLZ
t
BA
t
BLZ
t
BHZ
t
OHZ
t
PU
t
PD
Min
70/85
10
10
5
10
0
Max
70/85
70/85
35/40
20
70/85
20
20
55
Unit
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
Notes
3
3
5
4, 5
4, 5
4, 5
4, 5
4, 5
4, 5
4, 5
4, 5
Key to switching waveforms
Rising input
Falling input
t
RC
Address
t
OH
D
OUT
Previous data valid
t
AA
Data valid
t
OH
Undefined/don’t care
Read waveform 1 (address controlled)

11/1/01; V.0.9.8
Alliance Semiconductor
P. 4 of 11
AS6YB51216
Š
Read waveform 2 (CS1, CS2, OE, UB, LB controlled)

t
RC
Address
t
AA
OE
t
OLZ
CS1
t
LZ
CS2
t
ACS
t
OHZ
t
HZ
t
OE
t
OH
LB, UB
t
BLZ
D
OUT
t
BA
Data valid
t
BHZ
Write cycle (over the operating range)

–70/85
Parameter
Write cycle time
Chip enable to write end
Address setup to write end
Address setup time
Write pulse width
Write recovery time
Address hold from end of write
Data valid to write end
Data hold time
Write enable to output in high Z
Output active from write end
UB/LB low to end of write
Symbol
t
WC
t
CW
t
AW
t
AS
t
WP
t
WR
t
AH
t
DW
t
DH
t
WZ
t
OW
t
BW
Min
70/85
60/70
60/70
0
50/60
0
0
30/35
0
5
60/70
Max
20
Unit
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
Notes
12
12
4, 5
4, 5
4, 5
11/1/01; V.0.9.8
Alliance Semiconductor
P. 5 of 11
查看更多>
参数对比
与AS6YB51216-70BI相近的元器件有:AS6YB51216-85BI、AS6YB51216-85BC、AS6YB51216-70BC。描述及对比如下:
型号 AS6YB51216-70BI AS6YB51216-85BI AS6YB51216-85BC AS6YB51216-70BC
描述 Standard SRAM, 512KX16, 70ns, CMOS, PBGA48, 7 X 9 MM, CSP, FBGA-48 Standard SRAM, 512KX16, 85ns, CMOS, PBGA48, 7 X 9 MM, CSP, FBGA-48 Standard SRAM, 512KX16, 85ns, CMOS, PBGA48, 7 X 9 MM, CSP, FBGA-48 Standard SRAM, 512KX16, 70ns, CMOS, PBGA48, 7 X 9 MM, CSP, FBGA-48
是否Rohs认证 不符合 不符合 不符合 不符合
零件包装代码 BGA BGA BGA BGA
包装说明 TFBGA, TFBGA, TFBGA, TFBGA,
针数 48 48 48 48
Reach Compliance Code unknown unknown unknown unknown
ECCN代码 3A991.B.2.A 3A991.B.2.A 3A991.B.2.A 3A991.B.2.A
最长访问时间 70 ns 85 ns 85 ns 70 ns
JESD-30 代码 R-PBGA-B48 R-PBGA-B48 R-PBGA-B48 R-PBGA-B48
长度 9 mm 9 mm 9 mm 9 mm
内存密度 8388608 bit 8388608 bit 8388608 bit 8388608 bit
内存集成电路类型 STANDARD SRAM STANDARD SRAM STANDARD SRAM STANDARD SRAM
内存宽度 16 16 16 16
湿度敏感等级 1 1 1 1
功能数量 1 1 1 1
端子数量 48 48 48 48
字数 524288 words 524288 words 524288 words 524288 words
字数代码 512000 512000 512000 512000
工作模式 ASYNCHRONOUS ASYNCHRONOUS ASYNCHRONOUS ASYNCHRONOUS
最高工作温度 85 °C 85 °C 70 °C 70 °C
组织 512KX16 512KX16 512KX16 512KX16
封装主体材料 PLASTIC/EPOXY PLASTIC/EPOXY PLASTIC/EPOXY PLASTIC/EPOXY
封装代码 TFBGA TFBGA TFBGA TFBGA
封装形状 RECTANGULAR RECTANGULAR RECTANGULAR RECTANGULAR
封装形式 GRID ARRAY, THIN PROFILE, FINE PITCH GRID ARRAY, THIN PROFILE, FINE PITCH GRID ARRAY, THIN PROFILE, FINE PITCH GRID ARRAY, THIN PROFILE, FINE PITCH
并行/串行 PARALLEL PARALLEL PARALLEL PARALLEL
峰值回流温度(摄氏度) 225 225 225 225
认证状态 Not Qualified Not Qualified Not Qualified Not Qualified
座面最大高度 1.2 mm 1.2 mm 1.2 mm 1.2 mm
最大供电电压 (Vsup) 2.2 V 2.2 V 2.2 V 2.2 V
最小供电电压 (Vsup) 1.65 V 1.65 V 1.65 V 1.65 V
标称供电电压 (Vsup) 1.8 V 1.8 V 1.8 V 1.8 V
表面贴装 YES YES YES YES
技术 CMOS CMOS CMOS CMOS
温度等级 INDUSTRIAL INDUSTRIAL COMMERCIAL COMMERCIAL
端子形式 BALL BALL BALL BALL
端子节距 0.75 mm 0.75 mm 0.75 mm 0.75 mm
端子位置 BOTTOM BOTTOM BOTTOM BOTTOM
处于峰值回流温度下的最长时间 NOT SPECIFIED NOT SPECIFIED NOT SPECIFIED NOT SPECIFIED
宽度 7 mm 7 mm 7 mm 7 mm
厂商名称 ALSC [Alliance Semiconductor Corporation] ALSC [Alliance Semiconductor Corporation] - ALSC [Alliance Semiconductor Corporation]
Base Number Matches 1 1 1 -
热门器件
热门资源推荐
器件捷径:
00 01 02 03 04 05 06 07 08 09 0A 0C 0F 0J 0L 0M 0R 0S 0T 0Z 10 11 12 13 14 15 16 17 18 19 1A 1B 1C 1D 1E 1F 1H 1K 1M 1N 1P 1S 1T 1V 1X 1Z 20 21 22 23 24 25 26 27 28 29 2A 2B 2C 2D 2E 2F 2G 2K 2M 2N 2P 2Q 2R 2S 2T 2W 2Z 30 31 32 33 34 35 36 37 38 39 3A 3B 3C 3D 3E 3F 3G 3H 3J 3K 3L 3M 3N 3P 3R 3S 3T 3V 40 41 42 43 44 45 46 47 48 49 4A 4B 4C 4D 4M 4N 4P 4S 4T 50 51 52 53 54 55 56 57 58 59 5A 5B 5C 5E 5G 5H 5K 5M 5N 5P 5S 5T 5V 60 61 62 63 64 65 66 67 68 69 6A 6C 6E 6F 6M 6N 6P 6R 6S 6T 70 71 72 73 74 75 76 77 78 79 7A 7B 7C 7M 7N 7P 7Q 7V 7W 7X 80 81 82 83 84 85 86 87 88 89 8A 8D 8E 8L 8N 8P 8S 8T 8W 8Y 8Z 90 91 92 93 94 95 96 97 98 99 9A 9B 9C 9D 9F 9G 9H 9L 9S 9T 9W
需要登录后才可以下载。
登录取消