TABLE 1. DC ELECTRICAL PERFORMANCE CHARACTERISTICS
GROUP A
SUBGROUPS
1
2
VDD = 18V, VIN = VDD or GND
Input Leakage Current
IIL
VC = VDD or GND
3
1
2
3
Input Leakage Current
IIH
VC = VDD or GND
1
2
3
Input/Output Leakage
Current (Switch OFF)
IOZL
VC = 0V, VIS = 18V,
VOS = 0V, VIS = 0V,
VOS = 18V
VDD = 20
1
2
VDD = 18V
IOZH
VDD = 20
3
1
2
VDD = 18V
On Resistance
RON5
RON10
RON15
On Resistance
RON5
VC = VDD, RL = 10kW VDD = 5V
returned to VDD -
VDD = 10V
VSS/2
VDD = 15V
VIS = VSS to VDD
VDD = 5V
3
1
1
1
1, 2
LIMITS
TEMPERATURE
+25
o
C
+125
o
C
-55
o
C
+25
o
C
+125
o
C
-55
o
C
+25
o
C
+125
o
C
-55
o
C
+25
o
C
+125
o
C
-55
o
C
+25
o
C
+125
o
C
-55
o
C
+25
o
C
+25
o
C
+25
o
C
+125
o
C
-55
o
C
On Resistance
RON10
VDD = 10V
1, 2
+125
o
C
-55
o
C
On Resistance
RON15
VDD = 15V
1, 2
+125
o
C
-55
o
C
Functional
(Note 3)
F
VDD = 2.8V, VIN = VDD or GND
VDD = 20V, VIN = VDD or GND
VDD = 18V, VIN = VDD or GND
VDD = 3V, VIN = VDD or GND
Switch Threshold
RL = 100k to VDD
N Threshold Voltage
P Threshold Voltage
SWTHRH5 VDD = 5V, VC = 1.5V, VIS = GND
SWTHRH15 VDD = 15V, VC = 2V, VIS = GND
VNTH
VPTH
VDD = 10V, ISS = -10µA
VSS = 0V, IDD = 10µA
7
7
8A
8B
1, 2, 3
1, 2, 3
1
1
+25
o
C
+25
o
C
+125
o
C
-55
o
C
+25
o
C, +125
o
C, -55
o
C
+25
o
C, +125
o
C, -55
o
C
+25
o
C
+25
o
C
4.1
14.1
-2.8
0.7
-
-
-0.7
2.8
V
V
V
V
MIN
-
-
-
-100
-1000
-100
-
-
-
-100
-1000
-100
-
-
-
1050
400
240
-
-
-
-
-
-
MAX
0.5
50
0.5
-
-
-
100
1000
100
-
-
-
100
1000
100
-
-
-
1300
800
550
310
320
220
UNITS
µA
µA
µA
nA
nA
nA
nA
nA
nA
nA
nA
nA
nA
nA
nA
Ω
Ω
Ω
Ω
Ω
Ω
Ω
Ω
Ω
V
PARAMETER
Supply Current
SYMBOL
IDD
CONDITIONS
(NOTE 1)
VDD = 20V, VIN = VDD or GND
VOH > VOL <
VDD/2 VDD/2
7-967
Specifications CD4066BMS
TABLE 1. DC ELECTRICAL PERFORMANCE CHARACTERISTICS
GROUP A
SUBGROUPS
1, 2, 3
1, 2, 3
LIMITS
TEMPERATURE
+25
o
C, +125
o
C, -55
o
C
+25
o
C, +125
o
C, -55
o
C
MIN
-
-
MAX
1
2
UNITS
V
V
PARAMETER
Control Input Low
Voltage (Note 2)
|IIS| < 10µa, VIS = VSS,
VOS = VDD and
VIS = VDD, VOS = VSS
Control Input High
Voltage
(Note 2, Figure 2)
VIS = VSS and VIS =
VDD
SYMBOL
VILC5
VILC15
CONDITIONS
(NOTE 1)
VDD = 5V
VDD = 15V
VIHC
VDD = 5V, |IIS| = .51mA, 4.6V <
VOS < 0.4V
VDD = 5V, |IIS| = .36mA, 4.6V <
VOS < 0.4V
VDD = 5V, |IIS| = .64mA, 4.6V <
VOS < 0.4V
1
2
3
1
2
3
+25
o
C
+125
o
C
-55
o
C
+25
o
C
+125
o
C
-55
o
C
3.5
3.5
3.5
11
11
11
-
-
-
-
-
-
V
V
V
V
V
V
VIHC
VDD = 15V, |IIS| = 3.4mA, 13.5V <
VOS <1.5V
VDD = 15V, |IIS| = 2.4mA, 13.5V <
VOS < 1.5V
VDD = 15V, |IIS| = 4.2mA, 13.5V <
VOS <1.5V
NOTES: 1. All voltages referenced to device GND, 100% testing being
implemented.
2. Go/No Go test with limits applied to inputs.
3. VDD = 2.8V/3.0V, RL = 100K to VDD
VDD = 20V/18V, RL = 10K to VDD
TABLE 2. AC ELECTRICAL PERFORMANCE CHARACTERISTICS
GROUP A
SUBGROUPS TEMPERATURE
9
10, 11
9
10, 11
+25
o
C
+125
o
C, -55
o
C
+25
o
C
+125
o
C, -55
o
C
LIMITS
MIN
-
-
-
-
MAX
40
54
70
95
UNITS
ns
ns
ns
ns
PARAMETER
Propagation Delay
Signal Input to Signal
Output
Propagation Delay
Turn-On, Turn-Off
NOTES:
SYMBOL
TPLH
TPHL
CONDITIONS
VC = VDD = 5V, VSS = GND
(Notes 2, 3)
TPHZ/ZH VIS = VDD = 5V (Notes 1, 2)
TPLZ/ZL
1. CL = 50pF, RL = 1K, Input TR, TF < 20ns.
2. -55
o
C and +125
o
C limits guaranteed, 100% testing being implemented.
3. CL = 50pF, RL = 200K, Input TR, TF < 20ns.
TABLE 3. ELECTRICAL PERFORMANCE CHARACTERISTICS
LIMITS
PARAMETER
Supply Current
SYMBOL
IDD
CONDITIONS
VDD = 5V, VIN = VDD or GND
NOTES
1, 2
TEMPERATURE
-55
o
C, +25
o
C
+125
o
C
VDD = 10V, VIN = VDD or GND
1, 2
-55
o
C, +25
o
C
+125
o
C
VDD = 15V, VIN = VDD or GND
1, 2
-55
o
C, +25
o
C
+125
o
C
Control Input Low
Voltage
|IIS| < 10µa, VIS = VSS,
VOS = VDD and
VIS = VDD, VOS = VSS
VILC10
VDD = 10V
1, 2
+25
o
C, +125
o
C,
-55
o
C
MIN
-
-
-
-
-
-
-
MAX
0.25
7.5
0.5
15
0.5
30
2
UNITS
µA
µA
µA
µA
µA
µA
V
7-968
Specifications CD4066BMS
TABLE 3. ELECTRICAL PERFORMANCE CHARACTERISTICS
(Continued)
LIMITS
PARAMETER
Control Input High
Voltage (See Figure 2)
Propagation Delay
Signal Input to
Signal Output
Propagation Delay
Turn-On, Turn-Off
Input Capacitance
NOTES:
1. All voltages referenced to device GND.
2. The parameters listed on Table 3 are controlled via design or process and are not directly tested. These parameters are characterized
on initial design release and upon design changes which would affect these characteristics.
3. CL = 50pF, RL = 200K, Input TR, TF < 20ns.
TABLE 4. POST IRRADIATION ELECTRICAL PERFORMANCE CHARACTERISTICS
LIMITS
PARAMETER
Supply Current
N Threshold Voltage
N Threshold Voltage
Delta
P Threshold Voltage
P Threshold Voltage
Delta
Functional
SYMBOL
IDD
VNTH
∆VTN
VTP
∆VTP
F
CONDITIONS
VDD = 20V, VIN = VDD or GND
VDD = 10V, ISS = -10µA
VDD = 10V, ISS = -10µA
VSS = 0V, IDD = 10µA
VSS = 0V, IDD = 10µA
VDD = 18V, VIN = VDD or GND
VDD = 3V, VIN = VDD or GND
Propagation Delay Time
TPHL
TPLH
VDD = 5V
1, 2, 3, 4
+25
o
C
NOTES
1, 4
1, 4
1, 4
1, 4
1, 4
1
TEMPERATURE
+25
o
C
+25
o
C
+25
o
C
+25
o
C
+25
o
C
+25
o
C
MIN
-
-2.8
-
0.2
-
VOH >
VDD/2
-
MAX
25
-0.2
±1
2.8
±1
VOL <
VDD/2
1.35 x
+25
o
C
Limit
UNITS
µA
V
V
V
V
V
SYMBOL
VIHC10
TPLH
TPHL
CONDITIONS
VDD = 10V, VIS = VDD or GND
VDD = 10V
VDD = 15V
NOTES
2
1, 2, 3
1, 2, 3
1, 2, 3
1, 2, 3
1, 2
TEMPERATURE
+25
o
C, +125
o
C,
-55
o
C
+25
o
C
+25
o
C
+25
o
C
+25
o
C
+25
o
C
MIN
7
-
-
-
-
-
MAX
-
20
15
40
30
7.5
UNITS
V
ns
ns
ns
ns
pF
TPHZ/ZH VDD = 10V
TPLZ/ZL
VDD = 15V
CIN
Any Input
ns
NOTES: 1. All voltages referenced to device GND.
2. CL = 50pF, RL = 200K, Input TR, TF < 20ns.
3. See Table 2 for +25
o
C limit.
4. Read and Record
TABLE 5. BURN-IN AND LIFE TEST DELTA PARAMETERS +25
O
C
PARAMETER
Supply Current - SSI
ON Resistance
SYMBOL
IDD
RONDEL10
±0.1µA
±
20% x Pre-Test Reading
DELTA LIMIT
TABLE 6. APPLICABLE SUBGROUPS
CONFORMANCE GROUP
Initial Test (Pre Burn-In)
Interim Test 1 (Post Burn-In)
Interim Test 2 (Post Burn-In)
PDA (Note 1)
Interim Test 3 (Post Burn-In)
PDA (Note 1)
MIL-STD-883
METHOD
100% 5004
100% 5004
100% 5004
100% 5004
100% 5004
100% 5004
GROUP A SUBGROUPS
1, 7, 9
1, 7, 9
1, 7, 9
1, 7, 9, Deltas
1, 7, 9
1, 7, 9, Deltas
IDD, IOL5, IOH5A, RONDEL10
READ AND RECORD
IDD, IOL5, IOH5A, RONDEL10
IDD, IOL5, IOH5A, RONDEL10
IDD, IOL5, IOH5A, RONDEL10
7-969
Specifications CD4066BMS
TABLE 6. APPLICABLE SUBGROUPS
(Continued)
CONFORMANCE GROUP
Final Test
Group A
Group B
Subgroup B-5
Subgroup B-6
Group D
MIL-STD-883
METHOD
100% 5004
Sample 5005
Sample 5005
Sample 5005
Sample 5005
GROUP A SUBGROUPS
2, 3, 8A, 8B, 10, 11
1, 2, 3, 7, 8A, 8B, 9, 10, 11
1, 2, 3, 7, 8A, 8B, 9, 10, 11, Deltas
1, 7, 9
1, 2, 3, 8A, 8B, 9
Subgroups 1, 2 3
Subgroups 1, 2, 3, 9, 10, 11
READ AND RECORD
NOTE: 1. 5% Parameteric, 3% Functional; Cumulative for Static 1 and 2.
TABLE 7. TOTAL DOSE IRRADIATION
MIL-STD-883
METHOD
5005
TEST
PRE-IRRAD
1, 7, 9
POST-IRRAD
Table 4
READ AND RECORD
PRE-IRRAD
1, 9
POST-IRRAD
Table 4
CONFORMANCE GROUPS
Group E Subgroup 2
TABLE 8. BURN-IN AND IRRADIATION TEST CONNECTIONS
OSCILLATOR
FUNCTION
Static Burn-In 1 (Note 1)
Static Burn-In 2 (Note 1)
Dynamic Burn-In (Note 1)
Irradiation (Note 2)
NOTE:
1. Each pin except VDD and GND will have a series resistor of 10K
±
5%, VDD = 18V
±
0.5V
2. Each pin except VDD and GND will have a series resistor of 47K
±
5%; Group E, Subgroup 2, sample size is 4 dice/wafer, 0 failures, VDD
= 10V
±
0.5V
OPEN
2, 3, 9, 10
2, 3, 9, 10
-
2, 3, 9, 10
GROUND
1, 4-8, 11-13
7
7
7
VDD
14
1, 4-6, 8, 11-14
14
1, 4-6, 8, 11-14
2, 3, 9, 10
5, 6, 12, 13
1, 4, 8, 11
9V
±
-0.5V
50kHz
25kHz
Functional Diagram
TRUTH TABLE EACH SWITCH
IN/OUT
SIG A
OUT/IN
2
1
SW
A
13
CONTROL A
14
VDD
INPUT
VC
1
1
VIS
0
1
0
1
OUTPUT
VOS
0
1
Open
Open
OUT/IN
SIG B
IN/OUT
3
SW
D
12
CONTROL D
0
0
4
SW
B
11
IN/OUT
SIG D
CONTROL B
5
10
OUT/IN
Positive Logic: Switch ON VC = “1”
Switch OFF VC = “0”
CONTROL C
6
SW
C
9
OUT/IN
SIG C
VSS
7
8
IN/OUT
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ISO9000
quality systems certification.
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