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FQI19N20CTU

MOSFET N-CH 200V 19A I2PAK

器件类别:半导体    分立半导体   

厂商名称:ON Semiconductor(安森美)

厂商官网:http://www.onsemi.cn

器件标准:

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器件参数
参数名称
属性值
FET 类型
N 沟道
技术
MOSFET(金属氧化物)
漏源电压(Vdss)
200V
电流 - 连续漏极(Id)(25°C 时)
19A(Tc)
驱动电压(最大 Rds On,最小 Rds On)
10V
不同 Id,Vgs 时的 Rds On(最大值)
170 毫欧 @ 9.5A,10V
不同 Id 时的 Vgs(th)(最大值)
4V @ 250µA
不同 Vgs 时的栅极电荷 (Qg)(最大值)
53nC @ 10V
Vgs(最大值)
±30V
不同 Vds 时的输入电容(Ciss)(最大值)
1080pF @ 25V
功率耗散(最大值)
3.13W(Ta),139W(Tc)
工作温度
-55°C ~ 150°C(TJ)
安装类型
通孔
供应商器件封装
I2PAK(TO-262)
封装/外壳
TO-262-3,长引线,I²Pak,TO-262AA
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www.onsemi.com
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device numbers. The most current and up-to-date ordering information can be found at
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Please
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Fairchild_questions@onsemi.com.
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FQB19N20C — N-Channel QFET
®
MOSFET
November
2013
FQB19N20C
N-Channel
QFET
®
MOSFET
200
V,
19
A,
170
Description
This N-Channel enhancement mode power MOSFET is
produced using Fairchild Semiconductor’s proprietary
planar stripe and DMOS technology. This advanced
MOSFET technology has been especially tailored to
reduce on-state resistance, and to provide superior
switching performance and high avalanche energy
strength. These devices are suitable for switched mode
power supplies, active power factor correction (PFC),
and electronic lamp ballasts.
Features
19.0
A,
200
V, R
DS(on)
=
170
mΩ (Max.) @ V
GS
= 10 V,
I
D
=
9.5
A
• Low Gate Charge (Typ.
40.5
nC)
• Low C
rss
(Typ.
85
pF)
• 100% Avalanche Tested
• RoHS
Compliant
D
D
G
G
S
D
2
-PAK
S
Absolute Maximum Ratings
Symbol
V
DSS
I
D
I
DM
V
GSS
E
AS
I
AR
E
AR
dv/dt
P
D
Drain-Source Voltage
Drain Current
T
C
= 25°C unless otherwise noted.
Parameter
- Continuous (T
C
= 25°C)
- Continuous (T
C
= 100°C)
Drain Current
Gate-Source voltage
Single Pulsed Avalanche Energy
Avalanche Current
Repetitive Avalanche Energy
Peak Diode Recovery dv/dt
Power Dissipation
Power Dissipation
(T
A
= 25°C)*
(T
C
= 25°C)
- Derate above 25°C
(Note 2)
(Note 1)
(Note 1)
(Note 3)
FQB19N20CTM
200
19.0
12.1
(Note 1)
Unit
V
A
A
A
V
mJ
A
mJ
V/ns
W
W
W/°C
°C
°C
- Pulsed
76.0
±
30
433
19.0
13.9
5.5
3.13
139
1.11
-55 to +150
300
T
J,
T
STG
T
L
Operating and Storage Temperature Range
Maximum Lead Temperature for Soldering Purpose,
1/8” from Case for 5 Seconds
Thermal Characteristics
Symbol
R
JC
R
JA
Parameter
Thermal Resistance, Junction to Case, Max.
Thermal Resistance, Junction to Ambient (Minimum
Pad
of 2-oz
Copper),
Max.
Thermal Resistance, Junction to Ambient (*1 in
2
Pad
of 2-oz
Copper),
Max.
1
FQB19N20CTM
0.9
62.5
40
Unit
o
C/W
©2004 Fairchild Semiconductor Corporation
FQB19N20C
Rev. C1
www.fairchildsemi.com
FQB19N20C — N-Channel QFET
®
MOSFET
Package Marking and Ordering Information
Device Marking
FQB19N20C
Device
FQB19N20CTM
Package
D
2
-PAK
Reel Size
330 mm
Tape Width
24 mm
Quantity
800
units
Electrical Characteristics
Symbol
Off Characteristics
BV
DSS
∆BV
DSS
/
∆T
J
I
DSS
I
GSSF
I
GSSR
V
GS(th)
R
DS(on)
g
FS
C
iss
C
oss
C
rss
t
d(on)
t
r
t
d(off)
t
f
Q
g
Q
gs
Q
gd
I
S
I
SM
V
SD
t
rr
Q
rr
Notes:
T
C
= 25°C unless otherwise noted.
Parameter
Drain-Source Breakdown Voltage
Breakdown Voltage Temperature
Coefficient
Zero Gate Voltage Drain Current
Gate-Body Leakage Current, Forward
Gate-Body Leakage Current, Reverse
Gate Threshold Voltage
Static Drain-Source
On-Resistance
Forward Transconductance
Input Capacitance
Output Capacitance
Reverse Transfer Capacitance
Turn-On Delay Time
Turn-On Rise Time
Turn-Off Delay Time
Turn-Off Fall Time
Total Gate Charge
Gate-Source Charge
Gate-Drain Charge
Conditions
V
GS
= 0 V, I
D
= 250
µA
I
D
= 250
µA,
Referenced to 25°C
V
DS
=
200
V, V
GS
= 0 V
V
DS
=
160
V, T
C
= 125°C
V
GS
= 30 V, V
DS
= 0 V
V
GS
= -30 V, V
DS
= 0 V
V
DS
= V
GS
, I
D
= 250
µA
V
GS
= 10 V, I
D
=
9.5
A
V
DS
= 40 V, I
D
=
9.5
A
V
DS
= 25 V, V
GS
= 0 V,
f = 1.0 MHz
Min
200
--
--
--
--
--
2.0
--
--
--
--
--
Typ
--
0.24
--
--
--
--
--
0.14
10.8
830
195
85
10
150
135
115
40.5
6.0
22.5
--
--
--
208
1.63
Max
--
--
10
100
100
-100
4.0
0.17
--
1080
255
110
40
310
280
240
53
--
--
19.0
76.0
1.5
--
--
Unit
V
V/
ο
C
µA
µA
nA
nA
V
S
pF
pF
pF
ns
ns
ns
ns
nC
nC
nC
A
A
V
ns
µC
On Characteristics
Dynamic Characteristics
Switching Characteristics
V
DD
=
100
V, I
D
=
19.0
A
R
G
= 25
(Note 4)
--
--
--
--
--
--
(Note 4)
V
DS
=
160
V, I
D
=
19.0
A
V
GS
= 10 V
--
--
--
--
--
--
Drain-Source Diode Characteristics and Maximum Ratings
Maximum Continuous Drain-Source Diode Forward Current
Maximum Pulsed Drain-Source Diode Forward Current
Drain-Source Diode Forward Voltage
Reverse Recovery Time
Reverse Recovery Charge
V
GS
= 0 V, I
S
=
19.0
A
V
GS
= 0 V, I
S
=
19.0
A
dI
F
/dt =100 A/µs
1. Repetitive
rating: pulse-width
limited by maximum junction temperature.
2. L =
1.8
mH, I
AS
=
19.0
A, V
DD
= 50 V, R
G
= 25
Ω,
starting
T
J
= 25°C.
3. I
SD
19.0
A, di/dt
300
A/µs, V
DD
BV
DSS,
starting
T
J
= 25°C.
4.
Essentially
independent
of
operating temperature.
©2004 Fairchild Semiconductor Corporation
FQB19N20C
Rev. C1
2
www.fairchildsemi.com
FQB19N20C — N-Channel QFET
®
MOSFET
Typical Characteristics
Top :
I
D
, Drain Current [A]
I
D
, Drain Current [A]
10
1
V
GS
15.0 V
10.0 V
8.0 V
7.0 V
6.5 V
6.0 V
5.5 V
5.0 V
Bottom : 4.5 V
10
1
150 C
o
25 C
10
0
o
-55 C
o
10
0
Notes :
1. 250µ s Pulse Test
2. T
C
= 25
-1
10
10
0
10
1
10
-1
Notes :
1. V
DS
= 40V
2. 250µ s Pulse Test
2
4
6
8
10
V
DS
, Drain-Source Voltage [V]
V
GS
, Gate-Source Voltage [V]
Figure 1. On-Region Characteristics
Figure 2. Transfer Characteristics
0.8
R
DS(ON)
[Ω ],
Drain-Source On-Resistance
0.6
I
DR
, Reverse Drain Current [A]
10
1
0.4
V
GS
= 10V
10
0
150
0.2
V
GS
= 20V
Note : T
J
= 25
25
Notes :
1. V
GS
= 0V
2. 250µ s Pulse Test
0.0
0
10
20
30
40
50
60
10
-1
0.0
0.4
0.8
1.2
1.6
2.0
2.4
I
D
, Drain Current [A]
V
SD
, Source-Drain voltage [V]
Figure 3. On-Resistance Variation vs
Drain Current and Gate Voltage
Figure 4. Body Diode Forward Voltage
Variation with Source Current
and Temperature
3000
2500
C
iss
= C
gs
+ C
gd
(C
ds
= shorted)
C
oss
= C
ds
+ C
gd
C
rss
= C
gd
12
V
GS
, Gate-Source Voltage [V]
10
V
DS
= 40V
V
DS
= 100V
V
DS
= 160V
Capacitance [pF]
2000
8
C
iss
1500
C
oss
C
rss
Notes :
1. V
GS
= 0 V
2. f = 1 MHz
0
1
6
1000
4
500
2
Note : I
D
= 19.0A
0
-1
10
10
10
0
0
10
20
30
40
50
V
DS
, Drain-Source Voltage [V]
Q
G
, Total Gate Charge [nC]
Figure 5. Capacitance Characteristics
Figure 6. Gate Charge Characteristics
©2004 Fairchild Semiconductor Corporation
FQB19N20C
Rev. C1
3
www.fairchildsemi.com
FQB19N20C — N-Channel QFET
®
MOSFET
Typical Characteristics
(Continued)
1.2
3.0
BV
DSS
, (Normalized)
Drain-Source Breakdown Voltage
1.1
R
DS(ON)
, (Normalized)
Drain-Source On-Resistance
2.5
2.0
1.0
1.5
1.0
Notes :
1. V
GS
= 10 V
2. I
D
= 9.5 A
0.9
Notes :
1. V
GS
= 0 V
2. I
D
= 250 µA
0.5
0.8
-100
-50
0
50
100
o
150
200
0.0
-100
-50
0
50
100
o
150
200
T
J
, Junction Temperature [ C]
T
J
, Junction Temperature [ C]
Figure 7. Breakdown Voltage Variation
vs Temperature
Figure 8. On-Resistance Variation
vs Temperature
Operation in This Area
is Limited by R
DS(on)
20
10
2
I
D
, Drain Current [A]
100
µ
s
1 ms
10
1
15
10 ms
DC
I
D
, Drain Current [A]
10
10
0
Notes :
1. T
C
= 25 C
2. T
J
= 150 C
3. Single Pulse
o
o
5
10
-1
10
0
10
1
10
2
0
25
50
75
100
125
150
V
DS
, Drain-Source Voltage [V]
T
C
, Case Temperature [
]
Figure 9. Maximum Safe Operating Area
Figure 10. Maximum Drain Current
vs Case Temperature
Z
θJC
(t), Thermal Response [
o
C/W]
10
0
D = 0 .5
0 .2
10
-1
0 .1
0 .0 5
0 .0 2
0 .0 1
N o te s :
1 . Z
θ
J C
( t) = 0 . 9 0
/W M a x .
2 . D u t y F a c to r , D = t
1
/t
2
3 . T
J M
- T
C
= P
D M
* Z
θ
J C
( t)
P
DM
s in g le p u ls e
t
1
10
-2
t
2
10
-5
10
-4
10
-3
10
-2
10
-1
10
0
10
1
t
1
, S q u a r e W a v e P u ls e D u r a t io n [ s e c ]
Figure 11. Transient Thermal Response Curve
©2004 Fairchild Semiconductor Corporation
FQB19N20C
Rev. C1
4
www.fairchildsemi.com
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参数对比
与FQI19N20CTU相近的元器件有:FQB19N20CTM。描述及对比如下:
型号 FQI19N20CTU FQB19N20CTM
描述 MOSFET N-CH 200V 19A I2PAK MOSFET N-CH 200V 19A D2PAK
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