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IS41LV16257B-60TL

Fast Page DRAM, 256KX16, 60ns, CMOS, PDSO40, 0.400 INCH, LEAD FREE, PLASTIC, TSOP2-40

器件类别:存储    存储   

厂商名称:Integrated Silicon Solution ( ISSI )

器件标准:

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器件参数
参数名称
属性值
是否Rohs认证
符合
厂商名称
Integrated Silicon Solution ( ISSI )
零件包装代码
TSOP2
包装说明
TSOP2, TSOP40/44,.46,32
针数
40
Reach Compliance Code
compliant
ECCN代码
EAR99
访问模式
FAST PAGE
最长访问时间
60 ns
其他特性
RAS ONLY/CAS BEFORE RAS/HIDDEN REFRESH
I/O 类型
COMMON
JESD-30 代码
R-PDSO-G40
JESD-609代码
e3
长度
18.41 mm
内存密度
4194304 bit
内存集成电路类型
FAST PAGE DRAM
内存宽度
16
湿度敏感等级
3
功能数量
1
端口数量
1
端子数量
40
字数
262144 words
字数代码
256000
工作模式
ASYNCHRONOUS
最高工作温度
70 °C
最低工作温度
组织
256KX16
输出特性
3-STATE
封装主体材料
PLASTIC/EPOXY
封装代码
TSOP2
封装等效代码
TSOP40/44,.46,32
封装形状
RECTANGULAR
封装形式
SMALL OUTLINE, THIN PROFILE
峰值回流温度(摄氏度)
260
电源
3.3 V
认证状态
Not Qualified
刷新周期
512
座面最大高度
1.2 mm
自我刷新
NO
最大待机电流
0.001 A
最大压摆率
0.17 mA
最大供电电压 (Vsup)
3.6 V
最小供电电压 (Vsup)
3 V
标称供电电压 (Vsup)
3.3 V
表面贴装
YES
技术
CMOS
温度等级
COMMERCIAL
端子面层
Matte Tin (Sn) - annealed
端子形式
GULL WING
端子节距
0.8 mm
端子位置
DUAL
处于峰值回流温度下的最长时间
40
宽度
10.16 mm
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IS41LV16257B
256K x 16 (4-MBIT) DYNAMIC RAM
WITH FAST PAGE MODE
DESCRIPTION
The
ISSI
IS41LV16257B is 262,144 x 16-bit high-
performance CMOS Dynamic Random Access
Memories. Fast Page Mode allows 512 random
accesses within a single row with access cycle time as
short as 12 ns per 16-bit word. The Byte Write control,
of upper and lower byte, makes these devices ideal for
use in 16- and 32-bit wide data bus systems.
These features make the IS41LV16257B ideally suited
for high band-width graphics, digital signal processing,
high-performance computing systems, and peripheral
applications.
The IS41LV16257B is packaged in a 40-pin, 400-mil
SOJ and TSOP (Type II).
JUNE 2007
FEATURES
Fast access and cycle time
TTL compatible inputs and outputs
Refresh Interval: 512 cycles/8 ms
Refresh Mode:
RAS-Only, CAS-before-RAS
(CBR), and Hidden
JEDEC standard pinout
Single power supply: 3.3V ± 10%
Byte Write and Byte Read operation via
two
CAS
Lead-free available
KEY TIMING PARAMETERS
Parameter
Max.
RAS
Access Time (t
RAC
)
Max.
CAS
Access Time (t
CAC
)
Max. Column Address Access Time (t
AA
)
Min. Fast Page Mode Cycle Time (t
PC
)
Min. Read/Write Cycle Time (t
RC
)
-35
35
11
18
14
60
-60
60
15
30
25
110
Unit
ns
ns
ns
ns
ns
Copyright © 2005 Integrated Silicon Solution, Inc. All rights reserved. ISSI reserves the right to make changes to this specification and its products at any time
without notice. ISSI assumes no liability arising out of the application or use of any information, products or services described herein. Customers are advised to
obtain the latest version of this device specification before relying on any published information and before placing orders for products.
Integrated Silicon Solution, Inc.
Rev. C
06/18/07
1
IS41LV16257B
FUNCTIONAL BLOCK DIAGRAM
OE
WE
LCAS
UCAS
CAS
CLOCK
GENERATOR
WE
CONTROL
LOGICS
OE
CONTROL
LOGIC
OE
CAS
WE
RAS
RAS
CLOCK
GENERATOR
DATA I/O BUS
REFRESH
COUNTER
DATA I/O BUFFERS
ROW DECODER
RAS
COLUMN DECODERS
SENSE AMPLIFIERS
I/O0-I/O15
MEMORY ARRAY
262,144 x 16
ADDRESS
BUFFERS
A0-A8
PIN CONFIGURATIONS
40-Pin TSOP (Type II)
VDD
I/O0
I/O1
I/O2
I/O3
VDD
I/O4
I/O5
I/O6
I/O7
1
2
3
4
5
6
7
8
9
10
40
39
38
37
36
35
34
33
32
31
GND
I/O15
I/O14
I/O13
I/O12
GND
I/O11
I/O10
I/O9
I/O8
PIN DESCRIPTIONS
40-Pin SOJ
VDD
I/O0
I/O1
I/O2
I/O3
VDD
I/O4
I/O5
I/O6
I/O7
NC
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
40
39
38
37
36
35
34
33
32
31
30
29
28
27
26
25
24
23
22
21
GND
I/O15
I/O14
I/O13
I/O12
GND
I/O11
I/O10
I/O9
I/O8
NC
LCAS
UCAS
OE
A8
A7
A6
A5
A4
GND
A0-A8
I/O0-I/O15
WE
OE
RAS
UCAS
LCAS
V
DD
GND
NC
Address Inputs
Data Inputs/Outputs
Write Enable
Output Enable
Row Address Strobe
Upper Column Address
Strobe
Lower Column Address
Strobe
Power
Ground
No Connection
NC
NC
WE
RAS
NC
A0
A1
A2
A3
VDD
11
12
13
14
15
16
17
18
19
20
30
29
28
27
26
25
24
23
22
21
NC
LCAS
UCAS
OE
A8
A7
A6
A5
A4
GND
NC
WE
RAS
NC
A0
A1
A2
A3
VDD
2
Integrated Silicon Solution, Inc.
Rev. C
06/18/07
IS41LV16257B
TRUTH TABLE
Function
Standby
Read: Word
Read: Lower Byte
Read: Upper Byte
Write: Word (Early Write)
Write: Lower Byte (Early Write)
Write: Upper Byte (Early Write)
Read-Write
(1,2)
Hidden Refresh
2)
RAS-Only
Refresh
CBR Refresh
(3)
RAS
H
L
L
L
L
L
L
L
Read L∅H∅L
Write L∅H∅L
L
H∅L
LCAS
H
L
L
H
L
L
H
L
L
L
H
L
UCAS
H
L
H
L
L
H
L
L
L
L
H
L
WE
X
H
H
H
L
L
L
H∅L
H
L
X
X
OE
X
L
L
L
X
X
X
L∅H
L
X
X
X
Address t
R
/t
C
X
ROW/COL
ROW/COL
ROW/COL
ROW/COL
ROW/COL
ROW/COL
ROW/COL
ROW/COL
ROW/COL
ROW/NA
X
I/O
High-Z
D
OUT
Lower Byte, D
OUT
Upper Byte, High-Z
Lower Byte, High-Z
Upper Byte, D
OUT
D
IN
Lower Byte, D
IN
Upper Byte, High-Z
Lower Byte, High-Z
Upper Byte, D
IN
D
OUT
, D
IN
D
OUT
D
OUT
High-Z
High-Z
Notes:
1. These WRITE cycles may also be BYTE WRITE cycles (either
LCAS
or
UCAS
active).
2. These READ cycles may also be BYTE READ cycles (either
LCAS
or
UCAS
active).
3. At least one of the two CAS signals must be active (LCAS or
UCAS).
Integrated Silicon Solution, Inc.
Rev. C
06/18/07
3
IS41LV16257B
FUNCTIONAL DESCRIPTION
The IS41LV16257B is a CMOS DRAM optimized for high-
speed bandwidth, low-power applications. During READ or
WRITE cycles, each bit is uniquely addressed through the
18 address bits. These are entered nine bits (A0-A8) at a
time. The row address is latched by the Row Address Strobe
(RAS). The column address is latched by the Column
Address Strobe (CAS).
RAS
is used to latch the first nine bits
and
CAS
is used to latch the latter nine bits.
The IS41LV16257B has two
CAS
controls,
LCAS
and
UCAS.
The
LCAS
and
UCAS
inputs internally generate a
CAS
signal functioning in an identical manner to the single
CAS
input on the other 256K x 16 DRAMs. The key difference
is that each
CAS
controls its corresponding I/O tristate logic
(in conjunction with
OE
and
WE
and
RAS). LCAS
controls
I/O0 - I/O7 and
UCAS
controls I/O8 - I/O15.
The IS41LV16257B
CAS
function is determined by the first
CAS
(LCAS or
UCAS)
transitioning LOW and the last
transitioning back HIGH. The two
CAS
controls give the
IS41LV16257B both BYTE READ and BYTE WRITE cycle
capabilities.
Write Cycle
A write cycle is initiated by the falling edge of
CAS
and
WE,
whichever occurs last. The input data must be valid at or
before the falling edge of
CAS
or
WE,
whichever occurs last.
Refresh Cycle
To retain data, 512 refresh cycles are required in each
8 ms period. There are two ways to refresh the memory:
1. By clocking each of the 512 row addresses (A0 through
A8) with
RAS
at least once every 8 ms. Any read, write,
read-modify-write or
RAS-only
cycle refreshes the ad-
dressed row.
2. Using a
CAS-before-RAS
refresh cycle.
CAS-before-
RAS
refresh is activated by the falling edge of
RAS,
while
holding
CAS
LOW. In
CAS-before-RAS
refresh cycle, an
internal 9-bit counter provides the row addresses and the
external address inputs are ignored.
CAS-before-RAS
is a refresh-only mode and no data access
or device selection is allowed. Thus, the output remains in
the High-Z state during the cycle.
Memory Cycle
A memory cycle is initiated by bringing
RAS
LOW and it is
terminated by returning both
RAS
and
CAS
HIGH. To
ensure proper device operation and data integrity any
memory cycle, once initiated, must not be ended or aborted
before the minimum t
RAS
time has expired. A new cycle
must not be initiated until the minimum precharge time t
RP
,
t
CP
has elapsed.
Power-On
After application of the V
DD
supply, an initial pause of
200 µs is required followed by a minimum of eight initialization
cycles (any combination of cycles containing a
RAS
signal).
During power-on, it is recommended that
RAS
track with V
DD
or be held at a valid V
IH
to avoid current surges.
Read Cycle
A read cycle is initiated by the falling edge of
CAS
or
OE,
whichever occurs last, while holding
WE
HIGH. The column
address must be held for a minimum time specified by t
AR
.
Data Out becomes valid only when t
RAC
, t
AA
, t
CAC
and t
OEA
are all satisfied. As a result, the access time is dependent
on the timing relationships between these parameters.
4
Integrated Silicon Solution, Inc.
Rev. C
06/18/07
IS41LV16257B
ABSOLUTE MAXIMUM RATINGS
(1)
Symbol
V
T
V
DD
I
OUT
P
D
T
A
T
STG
Parameters
Voltage on Any Pin Relative to GND
Supply Voltage
Output Current
Power Dissipation
Operation Temperature
Storage Temperature
3.3V
3.3V
Rating
–0.5 t0 +4.6
–0.5 t0 +4.6
50
1
0 to +70
-40 to +85
–55 to +125
Unit
V
V
mA
W
°C
°C
Com.
Ind.
Note:
1. Stress greater than those listed under ABSOLUTE MAXIMUM RATINGS may cause perma-
nent damage to the device. This is a stress rating only and functional operation of the device
at these or any other conditions above those indicated in the operational sections of this
specification is not implied. Exposure to absolute maximum rating conditions for extended
periods may affect reliability.
RECOMMENDED OPERATING CONDITIONS
(Voltages are referenced to GND)
Symbol
V
DD
V
IH
V
IL
T
A
Parameter
Supply Voltage
Input High Voltage
Input Low Voltage
Ambient Temperature
Voltage
3.3V
3.3V
3.3
Com.
Ind.
Min.
3.0
2.0
–0.3
0
-40
Typ.
3.3
Max.
3.6
V
DD
+ 0.3
0.8
70
85
Unit
V
V
V
°C
CAPACITANCE
(1,2)
Symbol
C
IN
1
C
IN
2
C
IO
Parameter
Input Capacitance: A0-A8
Input Capacitance:
RAS, UCAS, LCAS, WE, OE
Data Input/Output Capacitance: I/O0-I/O15
Max.
5
7
7
Unit
pF
pF
pF
Notes:
1. Tested initially and after any design or process changes that may affect these parameters.
2. Test conditions: T
A
= 25°C, f = 1 MHz, V
DD
=3.3V ± 10%.
Integrated Silicon Solution, Inc.
Rev. C
06/18/07
5
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参数对比
与IS41LV16257B-60TL相近的元器件有:IS41LV16257B-35TL、IS41LV16257B-35KLI、IS41LV16257B-35TL-TR、IS41LV16257B-60KL、IS41LV16257B-60K、IS41LV16257B-60T。描述及对比如下:
型号 IS41LV16257B-60TL IS41LV16257B-35TL IS41LV16257B-35KLI IS41LV16257B-35TL-TR IS41LV16257B-60KL IS41LV16257B-60K IS41LV16257B-60T
描述 Fast Page DRAM, 256KX16, 60ns, CMOS, PDSO40, 0.400 INCH, LEAD FREE, PLASTIC, TSOP2-40 Fast Page DRAM, 256KX16, 35ns, CMOS, PDSO40, 0.400 INCH, LEAD FREE, PLASTIC, TSOP2-40 Fast Page DRAM, 256KX16, 35ns, CMOS, PDSO40, 0.400 INCH, LEAD FREE, PLASTIC, SOJ-40 Fast Page DRAM, 256KX16, 35ns, CMOS, PDSO40, 0.400 INCH, LEAD FREE, PLASTIC, TSOP2-40 Fast Page DRAM, 256KX16, 60ns, CMOS, PDSO40, 0.400 INCH, LEAD FREE, PLASTIC, SOJ-40 Fast Page DRAM, 256KX16, 60ns, CMOS, PDSO40, 0.400 INCH, PLASTIC, SOJ-40 Fast Page DRAM, 256KX16, 60ns, CMOS, PDSO40, 0.400 INCH, PLASTIC, TSOP2-40
是否Rohs认证 符合 符合 符合 符合 符合 不符合 不符合
厂商名称 Integrated Silicon Solution ( ISSI ) Integrated Silicon Solution ( ISSI ) Integrated Silicon Solution ( ISSI ) Integrated Silicon Solution ( ISSI ) Integrated Silicon Solution ( ISSI ) Integrated Silicon Solution ( ISSI ) Integrated Silicon Solution ( ISSI )
零件包装代码 TSOP2 TSOP2 SOJ TSOP2 SOJ SOJ TSOP2
包装说明 TSOP2, TSOP40/44,.46,32 TSOP2, TSOP40/44,.46,32 SOJ, TSOP2, SOJ, SOJ40,.44 0.400 INCH, PLASTIC, SOJ-40 0.400 INCH, PLASTIC, TSOP2-40
针数 40 40 40 40 40 40 40
Reach Compliance Code compliant compliant compliant compliant compliant unknown unknown
ECCN代码 EAR99 EAR99 EAR99 EAR99 EAR99 EAR99 EAR99
访问模式 FAST PAGE FAST PAGE FAST PAGE FAST PAGE FAST PAGE FAST PAGE FAST PAGE
最长访问时间 60 ns 35 ns 35 ns 35 ns 60 ns 60 ns 60 ns
其他特性 RAS ONLY/CAS BEFORE RAS/HIDDEN REFRESH RAS ONLY/CAS BEFORE RAS/HIDDEN REFRESH RAS ONLY/CAS BEFORE RAS/HIDDEN REFRESH RAS ONLY/CAS BEFORE RAS/HIDDEN REFRESH RAS ONLY/CAS BEFORE RAS/HIDDEN REFRESH RAS ONLY/CAS BEFORE RAS/HIDDEN REFRESH RAS ONLY/CAS BEFORE RAS/HIDDEN REFRESH
JESD-30 代码 R-PDSO-G40 R-PDSO-G40 R-PDSO-J40 R-PDSO-G40 R-PDSO-J40 R-PDSO-J40 R-PDSO-G40
JESD-609代码 e3 e3 e3 e3 e3 e0 e0
长度 18.41 mm 18.41 mm 26.035 mm 18.41 mm 26.035 mm 26.035 mm 18.41 mm
内存密度 4194304 bit 4194304 bit 4194304 bit 4194304 bit 4194304 bit 4194304 bit 4194304 bit
内存集成电路类型 FAST PAGE DRAM FAST PAGE DRAM FAST PAGE DRAM FAST PAGE DRAM FAST PAGE DRAM FAST PAGE DRAM FAST PAGE DRAM
内存宽度 16 16 16 16 16 16 16
湿度敏感等级 3 3 3 3 3 3 3
功能数量 1 1 1 1 1 1 1
端口数量 1 1 1 1 1 1 1
端子数量 40 40 40 40 40 40 40
字数 262144 words 262144 words 262144 words 262144 words 262144 words 262144 words 262144 words
字数代码 256000 256000 256000 256000 256000 256000 256000
工作模式 ASYNCHRONOUS ASYNCHRONOUS ASYNCHRONOUS ASYNCHRONOUS ASYNCHRONOUS ASYNCHRONOUS ASYNCHRONOUS
最高工作温度 70 °C 70 °C 85 °C 70 °C 70 °C 70 °C 70 °C
组织 256KX16 256KX16 256KX16 256KX16 256KX16 256KX16 256KX16
封装主体材料 PLASTIC/EPOXY PLASTIC/EPOXY PLASTIC/EPOXY PLASTIC/EPOXY PLASTIC/EPOXY PLASTIC/EPOXY PLASTIC/EPOXY
封装代码 TSOP2 TSOP2 SOJ TSOP2 SOJ SOJ TSOP2
封装形状 RECTANGULAR RECTANGULAR RECTANGULAR RECTANGULAR RECTANGULAR RECTANGULAR RECTANGULAR
封装形式 SMALL OUTLINE, THIN PROFILE SMALL OUTLINE, THIN PROFILE SMALL OUTLINE SMALL OUTLINE, THIN PROFILE SMALL OUTLINE SMALL OUTLINE SMALL OUTLINE, THIN PROFILE
峰值回流温度(摄氏度) 260 260 260 260 260 NOT SPECIFIED NOT SPECIFIED
认证状态 Not Qualified Not Qualified Not Qualified Not Qualified Not Qualified Not Qualified Not Qualified
座面最大高度 1.2 mm 1.2 mm 3.75 mm 1.2 mm 3.75 mm 3.75 mm 1.2 mm
最大供电电压 (Vsup) 3.6 V 3.6 V 3.6 V 3.6 V 3.6 V 3.6 V 3.6 V
最小供电电压 (Vsup) 3 V 3 V 3 V 3 V 3 V 3 V 3 V
标称供电电压 (Vsup) 3.3 V 3.3 V 3.3 V 3.3 V 3.3 V 3.3 V 3.3 V
表面贴装 YES YES YES YES YES YES YES
技术 CMOS CMOS CMOS CMOS CMOS CMOS CMOS
温度等级 COMMERCIAL COMMERCIAL INDUSTRIAL COMMERCIAL COMMERCIAL COMMERCIAL COMMERCIAL
端子面层 Matte Tin (Sn) - annealed Matte Tin (Sn) - annealed Matte Tin (Sn) - annealed MATTE TIN Matte Tin (Sn) - annealed Tin/Lead (Sn/Pb) Tin/Lead (Sn/Pb)
端子形式 GULL WING GULL WING J BEND GULL WING J BEND J BEND GULL WING
端子节距 0.8 mm 0.8 mm 1.27 mm 0.8 mm 1.27 mm 1.27 mm 0.8 mm
端子位置 DUAL DUAL DUAL DUAL DUAL DUAL DUAL
处于峰值回流温度下的最长时间 40 40 40 40 40 NOT SPECIFIED NOT SPECIFIED
宽度 10.16 mm 10.16 mm 10.16 mm 10.16 mm 10.16 mm 10.16 mm 10.16 mm
I/O 类型 COMMON COMMON - - COMMON COMMON COMMON
输出特性 3-STATE 3-STATE - - 3-STATE 3-STATE 3-STATE
封装等效代码 TSOP40/44,.46,32 TSOP40/44,.46,32 - - SOJ40,.44 SOJ40,.44 TSOP40/44,.46,32
电源 3.3 V 3.3 V - - 3.3 V 3.3 V 3.3 V
刷新周期 512 512 - - 512 512 512
自我刷新 NO NO - - NO NO NO
最大待机电流 0.001 A 0.001 A - - 0.001 A 0.001 A 0.001 A
最大压摆率 0.17 mA 0.23 mA - - 0.17 mA 0.17 mA 0.17 mA
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