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IS61DDB42M18C-250M3

DDR SRAM, 2MX18, 0.45ns, CMOS, PBGA165, 15 X 17 MM, 1.40 MM HEIGHT, LFBGA-165

器件类别:存储    存储   

厂商名称:Integrated Silicon Solution ( ISSI )

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器件参数
参数名称
属性值
厂商名称
Integrated Silicon Solution ( ISSI )
包装说明
LBGA,
Reach Compliance Code
unknow
ECCN代码
3A991.B.2.A
最长访问时间
0.45 ns
JESD-30 代码
R-PBGA-B165
长度
17 mm
内存密度
37748736 bi
内存集成电路类型
DDR SRAM
内存宽度
18
功能数量
1
端子数量
165
字数
2097152 words
字数代码
2000000
工作模式
SYNCHRONOUS
最高工作温度
70 °C
最低工作温度
组织
2MX18
封装主体材料
PLASTIC/EPOXY
封装代码
LBGA
封装形状
RECTANGULAR
封装形式
GRID ARRAY, LOW PROFILE
并行/串行
PARALLEL
座面最大高度
1.4 mm
最大供电电压 (Vsup)
1.89 V
最小供电电压 (Vsup)
1.71 V
标称供电电压 (Vsup)
1.8 V
表面贴装
YES
技术
CMOS
温度等级
COMMERCIAL
端子形式
BALL
端子节距
1 mm
端子位置
BOTTOM
宽度
15 mm
文档预览
IS61DDB42M18C
IS61DDB41M36C
2Mx18, 1Mx36
36Mb DDR-II (Burst 4) CIO SYNCHRONOUS SRAM
FEATURES
1Mx36 and 2Mx18 configuration available.
On-chip delay-locked loop (DLL) for wide data valid
window.
Common I/O read and write ports.
Synchronous pipeline read with late write operation.
Double Data Rate (DDR) interface for read and
write input ports.
Fixed 4-bit burst for read and write operations.
Clock stop support.
Two input clocks (K and K#) for address and control
registering at rising edges only.
Two input clocks (C and C#) for data output control.
Two echo clocks (CQ and CQ#) that are delivered
simultaneously with data.
+1.8V core power supply and 1.5V to1.8V VDDQ,
used with 0.75V to 0.9V VREF.
HSTL input and output interface.
Registered addresses, write and read controls, byte
writes, data in, and data outputs.
Full data coherency.
Boundary scan using limited set of JTAG 1149.1
functions.
Byte write capability.
Fine ball grid array (FBGA) package:
13mmx15mm and 15mmx17mm body size
165-ball (11 x 15) array
Programmable impedance output drivers via 5x
user-supplied precision resistor.
MARCH 2016
DESCRIPTION
The 36Mb IS61DDB41M36C and IS61DDB42M18C are
synchronous, high-performance CMOS static random access
memory (SRAM) devices. These SRAMs have a common I/O
bus. The rising edge of K clock initiates the read/write
operation, and all internal operations are self-timed. Refer to
the
Timing Reference Diagram for Truth Table
for a
description of the basic operations of these DDR-II (Burst of
4) CIO SRAMs.
Read and write addresses are registered on alternating rising
edges of the K clock. Reads and writes are performed in
double data rate.
The following are registered internally on the rising edge of
the K clock:
Read/write address
Read enable
Write enable
Byte writes for burst addresses first and third
Data-in for burst addresses first and third
The following are registered on the rising edge of the K#
clock:
Byte writes for burst addresses second and fourth
Data-in for burst addresses second and fourth
Byte writes can change with the corresponding data-in to
enable or disable writes on a per-byte basis. An internal write
buffer enables the data-ins to be registered one cycle after
the write address. The first data-in burst is clocked one cycle
later than the write command signal, and the second burst is
timed to the following rising edge of the K# clock. Two full
clock cycles are required to complete a write operation.
During the burst read operation, the data-outs from the first
and third bursts are updated from output registers of the
second and third rising edges of the C# clock (starting on and
half cycles later after read command). The data-outs from the
second and fourth bursts are updated with the third and
fourth rising edges of the C clock. The K and K# clocks are
used to time the data-outs whenever the C and C# clocks are
tied high. Two full clock cycles are required to complete a
read operation.
The device is operated with a single +1.8V power supply and
is compatible with HSTL I/O interfaces.
Copyright © 2016 Integrated Silicon Solution, Inc. All rights reserved. ISSI reserves the right to make changes to this specification and its products at any time
without notice. ISSI assumes no liability arising out of the application or use of any information, products or services described herein. Customers are advised to
obtain the latest version of this device specification before relying on any published information and before placing orders for products.
Integrated Silicon Solution, Inc. does not recommend the use of any of its products in life support applications where the failure or malfunction of the product can
reasonably be expected to cause failure of the life support system or to significantly affect its safety or effectiveness. Products are not authorized for use in such
applications unless Integrated Silicon Solution, Inc. receives written assurance to its satisfaction, that:
a.) the risk of injury or damage has been minimized;
b.) the user assume all such risks; and
c.) potential liability of Integrated Silicon Solution, Inc is adequately protected under the circumstances
Integrated Silicon Solution, Inc.- www.issi.com
Rev. A
03/23/2016
1
IS61DDB42M18C
IS61DDB41M36C
Package ballout and description
x36 FBGA Ball Configuration (Top View)
A
B
C
D
E
F
G
H
J
K
L
M
N
P
R
1
CQ#
NC
NC
NC
NC
NC
NC
D
off
#
NC
NC
NC
NC
NC
NC
TDO
2
1
NC/SA
DQ27
NC
DQ29
NC
DQ30
DQ31
V
REF
NC
NC
DQ33
NC
DQ35
NC
TCK
3
SA
DQ18
DQ28
DQ19
DQ20
DQ21
DQ22
V
DDQ
DQ32
DQ23
DQ24
DQ34
DQ25
DQ26
SA
4
R/W#
SA
V
SS
V
SS
V
DDQ
V
DDQ
V
DDQ
V
DDQ
V
DDQ
V
DDQ
V
DDQ
V
SS
V
SS
SA
SA
5
BW
2
#
BW
3
#
SA
V
SS
V
SS
V
DD
V
DD
V
DD
V
DD
V
DD
V
SS
V
SS
SA
SA
SA
6
K#
K
SA
0
V
SS
V
SS
V
SS
V
SS
V
SS
V
SS
V
SS
V
SS
V
SS
SA
C
C#
7
BW
1
#
BW
0
#
SA
1
VSS
VSS
V
DD
V
DD
V
DD
V
DD
V
DD
V
SS
V
SS
SA
SA
SA
8
LD#
SA
V
SS
V
SS
V
DDQ
V
DDQ
V
DDQ
V
DDQ
V
DDQ
V
DDQ
V
DDQ
V
SS
V
SS
SA
SA
9
SA
NC
NC
NC
NC
NC
NC
V
DDQ
NC
NC
NC
NC
NC
NC
SA
10
1
NC/SA
NC
DQ17
NC
DQ15
NC
NC
V
REF
DQ13
DQ12
NC
DQ11
NC
DQ9
TMS
11
CQ
DQ8
DQ7
DQ16
DQ6
DQ5
DQ14
ZQ
DQ4
DQ3
DQ2
DQ1
DQ10
DQ0
TDI
Notes:
1. The following balls are reserved for higher densities: 10A for 72Mb and 2A for 144Mb.
x18 FBGA Ball Configuration (Top View)
A
B
C
D
E
F
G
H
J
K
L
M
N
P
R
1
CQ#
NC
NC
NC
NC
NC
NC
D
off
#
NC
NC
NC
NC
NC
NC
TDO
2
1
NC/SA
DQ9
NC
NC
NC
DQ12
NC
V
REF
NC
NC
DQ15
NC
NC
NC
TCK
3
SA
NC
NC
DQ10
DQ11
NC
DQ13
V
DDQ
NC
DQ14
NC
NC
DQ16
DQ17
SA
4
R/W#
SA
V
SS
V
SS
V
DDQ
V
DDQ
V
DDQ
V
DDQ
V
DDQ
V
DDQ
V
DDQ
V
SS
V
SS
SA
SA
5
BW
1
#
NC/SA
SA
V
SS
V
SS
V
DD
V
DD
V
DD
V
DD
V
DD
V
SS
V
SS
SA
SA
SA
1
6
K#
K
SA
0
V
SS
V
SS
V
SS
V
SS
V
SS
V
SS
V
SS
V
SS
V
SS
SA
C
C#
7
1
NC/SA
BW
0
#
SA
1
VSS
VSS
V
DD
V
DD
V
DD
V
DD
V
DD
V
SS
V
SS
SA
SA
SA
8
LD#
SA
V
SS
V
SS
V
DDQ
V
DDQ
V
DDQ
V
DDQ
V
DDQ
V
DDQ
V
DDQ
V
SS
V
SS
SA
SA
9
SA
NC
NC
NC
NC
NC
NC
V
DDQ
NC
NC
NC
NC
NC
NC
SA
10
SA
NC
DQ7
NC
NC
NC
NC
V
REF
DQ4
NC
NC
DQ1
NC
NC
TMS
11
CQ
DQ8
NC
NC
DQ6
DQ5
NC
ZQ
NC
DQ3
DQ2
NC
NC
DQ0
TDI
Notes:
1.
The following balls are reserved for higher densities: 2A for 72Mb, 7A for 144Mb and 5B for 288Mb.
Integrated Silicon Solution, Inc.- www.issi.com
Rev. A
03/23/2016
2
IS61DDB42M18C
IS61DDB41M36C
Ball Description
Symbol
K, K#
Type
Input
Description
Input clock: This input clock pair registers address and control inputs on the rising edge of K, and
registers data on the rising edge of K and the rising edge of K#. K# is ideally 180 degrees out of
phase with K. All synchronous inputs must meet setup and hold times around the clock rising edges.
These balls cannot remain VREF level.
Input clock for output data. C and C# are used to clock out the READ data. They can be used
together to deskew the flight times of various devices on the board back to the controller. See
application example for further details.
Synchronous echo clock outputs: The edges of these outputs are tightly matched to the
synchronous data outputs and can be used as a data valid indication. These signals are free running
clocks and do not stop when Q tri-states.
DLL disable and reset input: when low, this input causes the DLL to be bypassed and reset the
previous DLL information. When high, DLL will start operating and lock the frequency after tCK lock
time. The device behaves in one read latency mode when the DLL is turned off. In this mode, the
device can be operated at a frequency of up to 167MHz.
Synchronous address inputs: These inputs are registered and must meet the setup and hold times
around the rising edge of K. These inputs are ignored when device is deselected.
Data input and output signals. Input data must meet setup and hold times around the rising edges of
K and K# during WRITE operations. These pins drive out the requested data when the read
operation is active. Valid output data is synchronized to the respective C and C#, or to the
respective K and K# if C and /C are tied to high. When read access is deselected, DQ0 - DQn are
automatically tri-stated.
See BALL CONFIGURATION figures for ball site location of individual signals.
The x18 device uses DQ0~DQ17. DQ18~DQ35 should be treated as NC pin.
The x36 device uses DQ0~DQ35.
Synchronous Read or Write input. When LD# is low, this input designates the access type (read
when it is High, write when it is Low) for loaded address. R/W# must meet the setup and hold times
around edge of K.
Synchronous load. This input is brought Low when a bus cycle sequence is defined. This definition
includes address and read/write direction.
Synchronous byte writes: When low, these inputs cause their respective byte to be registered and
written during WRITE cycles. These signals are sampled on the same edge as the corresponding
data and must meet setup and hold times around the rising edges of K and #K for each of the two
rising edges comprising the WRITE cycle. See Write Truth Table for signal to data relationship.
HSTL input reference voltage: Nominally VDDQ/2, but may be adjusted to improve system noise
margin. Provides a reference voltage for the HSTL input buffers.
Power supply: 1.8 V nominal. See DC Characteristics and Operating Conditions for range.
Power supply: Isolated output buffer supply. Nominally 1.5 V. See DC Characteristics and Operating
Conditions for range.
Ground of the device
Output impedance matching input: This input is used to tune the device outputs to the system data
bus impedance. DQ and CQ output impedance are set to 0.2xRQ, where RQ is a resistor from this
ball to ground. This ball can be connected directly to VDDQ, which enables the minimum impedance
mode. This ball cannot be connected directly to VSS or left unconnected.
IEEE1149.1 input pins for JTAG.
IEEE1149.1 output pins for JTAG.
No connect: These signals should be left floating or connected to ground to improve package heat
dissipation.
C, C#
Input
CQ, CQ#
Output
Doff#
Input
SA
Input
DQ0 - DQn
Bidir
R/W#
LD#
Input
Input
BW
x
#
Input
Input
reference
Power
Power
Ground
V
REF
V
DD
V
DDQ
V
SS
ZQ
TMS, TDI,
TCK
TDO
NC
Input
Input
Output
N/A
Integrated Silicon Solution, Inc.- www.issi.com
Rev. A
03/23/2016
3
IS61DDB42M18C
IS61DDB41M36C
SRAM Features description
Block Diagram
36(18)
Data
Register-
Burst4
Write
Driver
Addresses :
SA
18 (19)
Output Select
Address Decoder
36x4 (18x4)
36x4 (18x4)
2
SA
0
,SA
1
Sense Amplifiers
Add Reg &
Burst
Control
20 (21)
36x4
(18x4)
Output
Reg
144
(72)
36
(18)
Input/Output Driver
36 (18)
DQ(Data-out
&Data-In)
1M x 36
(2M x 18)
Memory Array
LD#
R/W#
BW
x
#
4 (2)
Control
Logic
CQ, CQ#
(Echo Clocks)
K
K#
C
C#
/D
off
Clock
Generator
Select Output Control
Note: Numerical values in parentheses refer to the x18 device configuration.
Read Operations
The SRAM operates continuously in a burst-of-four mode. Read cycles are started by registering R/W# in active high
state at the rising edge of the K clock. R/W# can be activated every other cycle because two full cycles are required to
complete the burst-of-four read in DDR mode. A second set of clocks, C and C#, are used to control the timing to the
outputs. A set of free-running echo clocks, CQ and CQ#, are produced internally with timings identical to the data-outs.
The echo clocks can be used as data capture clocks by the receiver device.
When the C and C# clocks are connected high, the K and K# clocks assume the function of those clocks. In this case,
the data corresponding to the first address is clocked one and half cycles later by the rising edge of the K# clock. The
data corresponding to the second burst is clocked two cycles later by the following rising edge of the K clock. The third
data-out is clocked by the subsequent rising edge of the K# clock, and the fourth data-out is clocked by the
subsequent rising edge of the K clock.
Whenever LD# is low, a new address is registered at the rising edge of the K clock. A NOP operation (LD# is high)
does not terminate the previous read. The output drivers disable automatically to a high state.
Write Operations
Write operations can also be initiated at every other rising edge of the K clock whenever R/W# is low. The write
address is also registered at that time. When the address needs to change, LD# needs to be low simultaneously to be
registered by the rising edge of K. Again, the write always occurs in bursts of four.
Integrated Silicon Solution, Inc.- www.issi.com
Rev. A
03/23/2016
4
IS61DDB42M18C
IS61DDB41M36C
The write data is provided in a ‘late write’ mode; that is, the data-in corresponding to the first address of the burst, is
presented one cycle later or at the rising edge of the following K clock. The data-in corresponding to the second write
burst address follows next, registered by the rising edge of K#. The third data-out is clocked by the subsequent rising
edge of the K clock, and the fourth data-out is clocked by the subsequent rising edge of the K# clock.
The data-in provided for writing is initially kept in write buffers. The information on these buffers is written into the array
on the third write cycle. A read cycle to the last two write address produces data from the write buffers. The SRAM
maintains data coherency.
During a write, the byte writes independently control which byte of any of the four burst addresses is written (see
X18/X36 Write Truth Tables
and
Timing Reference Diagram for Truth Table).
Whenever a write is disabled (R/W# is high at the rising edge of K), data is not written into the memory.
RQ Programmable Impedance
An external resistor, RQ, must be connected between the ZQ pin on the SRAM and V
SS
to enable the SRAM to adjust
its output driver impedance. The value of RQ must be 5x the value of the intended line impedance driven by the
SRAM. For example, an RQ of 250Ω results in a driver impedance of 50Ω. The allowable range of RQ to guarantee
impedance matching is between 175Ω and 350Ω at V
DDQ
=1.5V. The RQ resistor should be placed less than two inches
away from the ZQ ball on the SRAM module. The capacitance of the loaded ZQ trace must be less than 7.5pF.
The ZQ pin can also be directly connected to V
DDQ
to obtain a minimum impedance setting. ZQ should not be
connected to V
SS
.
Programmable Impedance and Power-Up Requirements
Periodic readjustment of the output driver impedance is necessary as the impedance is greatly affected by drifts in
supply voltage and temperature. During power-up, the driver impedance is in the middle of allowable impedances
values. The final impedance value is achieved within 1024clock cycles.
Clock Consideration
This device uses an internal DLL for maximum output data valid window. It can be placed in a stopped-clock mode to
minimize power and requires only 1024 cycles to restart. No clocks can be issued until V
DD
reaches its allowable
operating range.
Single Clock Mode
This device can be also operated in single-clock mode. In this case, C and C# are both connected high at power-up
and must never change. Under this condition, K and K# control the output timings. Either clock pair must have both
polarities switching and must never connect to V
REF
, as they are not differential clocks.
Delay Locked Loop (DLL)
Delay Lock Loop (DLL) is a new system to align the output data coincident with clock rising or falling edge to enhance
the output valid timing characteristics. It is locked to the clock frequency and is constantly adjusted to match the clock
frequency. Therefore device can have stable output over the temperature and voltage variation.
DLL has a limitation of locking range and jitter adjustment which are specified as tKHKH and tKCvar respectively in the
AC timing characteristics. In order to turn this feature off, applying logic low to the Doff# pin will bypass this. In the DLL
off mode, the device behaves with one cycle latency and a longer access time which is known in DDR-I or legacy
QUAD mode.
The DLL can also be reset without power down by toggling Doff# pin low to high or stopping the input clocks K and K#
for a minimum of 30ns.(K and K# must be stayed either at higher than VIH or lower than VIL level. Remaining Vref is
not permitted.) DLL reset must be issued when power up or when clock frequency changes abruptly. After DLL being
reset, it gets locked after 2048 cycles of stable clock.
Integrated Silicon Solution, Inc.- www.issi.com
Rev. A
03/23/2016
5
查看更多>
参数对比
与IS61DDB42M18C-250M3相近的元器件有:IS61DDB42M18C-250M3L、IS61DDB41M36C-250M3、IS61DDB41M36C-300M3LI。描述及对比如下:
型号 IS61DDB42M18C-250M3 IS61DDB42M18C-250M3L IS61DDB41M36C-250M3 IS61DDB41M36C-300M3LI
描述 DDR SRAM, 2MX18, 0.45ns, CMOS, PBGA165, 15 X 17 MM, 1.40 MM HEIGHT, LFBGA-165 DDR SRAM, 2MX18, 0.45ns, CMOS, PBGA165, 15 X 17 MM, 1.40 MM HEIGHT, LEAD FREE, LFBGA-165 DDR SRAM, 1MX36, 0.45ns, CMOS, PBGA165, 15 X 17 MM, 1.40 MM HEIGHT, LFBGA-165 DDR SRAM, 1MX36, 0.45ns, CMOS, PBGA165, 15 X 17 MM, 1.40 MM HEIGHT, LEAD FREE, LFBGA-165
厂商名称 Integrated Silicon Solution ( ISSI ) Integrated Silicon Solution ( ISSI ) Integrated Silicon Solution ( ISSI ) Integrated Silicon Solution ( ISSI )
包装说明 LBGA, LBGA, LBGA, LBGA,
Reach Compliance Code unknow unknow unknow unknow
ECCN代码 3A991.B.2.A 3A991.B.2.A 3A991.B.2.A 3A991.B.2.A
最长访问时间 0.45 ns 0.45 ns 0.45 ns 0.45 ns
JESD-30 代码 R-PBGA-B165 R-PBGA-B165 R-PBGA-B165 R-PBGA-B165
长度 17 mm 17 mm 17 mm 17 mm
内存密度 37748736 bi 37748736 bi 37748736 bi 37748736 bi
内存集成电路类型 DDR SRAM DDR SRAM DDR SRAM DDR SRAM
内存宽度 18 18 36 36
功能数量 1 1 1 1
端子数量 165 165 165 165
字数 2097152 words 2097152 words 1048576 words 1048576 words
字数代码 2000000 2000000 1000000 1000000
工作模式 SYNCHRONOUS SYNCHRONOUS SYNCHRONOUS SYNCHRONOUS
最高工作温度 70 °C 70 °C 70 °C 85 °C
组织 2MX18 2MX18 1MX36 1MX36
封装主体材料 PLASTIC/EPOXY PLASTIC/EPOXY PLASTIC/EPOXY PLASTIC/EPOXY
封装代码 LBGA LBGA LBGA LBGA
封装形状 RECTANGULAR RECTANGULAR RECTANGULAR RECTANGULAR
封装形式 GRID ARRAY, LOW PROFILE GRID ARRAY, LOW PROFILE GRID ARRAY, LOW PROFILE GRID ARRAY, LOW PROFILE
并行/串行 PARALLEL PARALLEL PARALLEL PARALLEL
座面最大高度 1.4 mm 1.4 mm 1.4 mm 1.4 mm
最大供电电压 (Vsup) 1.89 V 1.89 V 1.89 V 1.89 V
最小供电电压 (Vsup) 1.71 V 1.71 V 1.71 V 1.71 V
标称供电电压 (Vsup) 1.8 V 1.8 V 1.8 V 1.8 V
表面贴装 YES YES YES YES
技术 CMOS CMOS CMOS CMOS
温度等级 COMMERCIAL COMMERCIAL COMMERCIAL INDUSTRIAL
端子形式 BALL BALL BALL BALL
端子节距 1 mm 1 mm 1 mm 1 mm
端子位置 BOTTOM BOTTOM BOTTOM BOTTOM
宽度 15 mm 15 mm 15 mm 15 mm
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器件捷径:
L0 L1 L2 L3 L4 L5 L6 L7 L8 L9 LA LB LC LD LE LF LG LH LI LJ LK LL LM LN LO LP LQ LR LS LT LU LV LW LX LY LZ M0 M1 M2 M3 M4 M5 M6 M7 M8 M9 MA MB MC MD ME MF MG MH MI MJ MK ML MM MN MO MP MQ MR MS MT MU MV MW MX MY MZ N0 N1 N2 N3 N4 N5 N6 N7 N8 NA NB NC ND NE NF NG NH NI NJ NK NL NM NN NO NP NQ NR NS NT NU NV NX NZ O0 O1 O2 O3 OA OB OC OD OE OF OG OH OI OJ OK OL OM ON OP OQ OR OS OT OV OX OY OZ P0 P1 P2 P3 P4 P5 P6 P7 P8 P9 PA PB PC PD PE PF PG PH PI PJ PK PL PM PN PO PP PQ PR PS PT PU PV PW PX PY PZ Q1 Q2 Q3 Q4 Q5 Q6 Q8 Q9 QA QB QC QE QF QG QH QK QL QM QP QR QS QT QV QW QX QY R0 R1 R2 R3 R4 R5 R6 R7 R8 R9 RA RB RC RD RE RF RG RH RI RJ RK RL RM RN RO RP RQ RR RS RT RU RV RW RX RY RZ
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