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K4B4G0846B-MCH90

DDR DRAM, 512MX8, 0.255ns, CMOS, PBGA78, HALOGEN FREE AND ROHS COMPLIANT, FBGA-78

器件类别:存储    存储   

厂商名称:SAMSUNG(三星)

厂商官网:http://www.samsung.com/Products/Semiconductor/

器件标准:  

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器件参数
参数名称
属性值
是否无铅
不含铅
是否Rohs认证
符合
厂商名称
SAMSUNG(三星)
零件包装代码
BGA
包装说明
LFBGA, BGA78,9X13,32
针数
78
Reach Compliance Code
compliant
ECCN代码
EAR99
访问模式
MULTI BANK PAGE BURST
最长访问时间
0.255 ns
其他特性
AUTO/SELF REFRESH
最大时钟频率 (fCLK)
667 MHz
I/O 类型
COMMON
JESD-30 代码
R-PBGA-B78
长度
11.5 mm
内存密度
4294967296 bit
内存集成电路类型
DDR DRAM
内存宽度
8
功能数量
1
端口数量
1
端子数量
78
字数
536870912 words
字数代码
512000000
工作模式
SYNCHRONOUS
最高工作温度
85 °C
最低工作温度
组织
512MX8
输出特性
3-STATE
封装主体材料
PLASTIC/EPOXY
封装代码
LFBGA
封装等效代码
BGA78,9X13,32
封装形状
RECTANGULAR
封装形式
GRID ARRAY, LOW PROFILE, FINE PITCH
峰值回流温度(摄氏度)
NOT SPECIFIED
电源
1.5 V
认证状态
Not Qualified
刷新周期
8192
座面最大高度
1.5 mm
自我刷新
YES
最大待机电流
0.024 A
最大压摆率
0.32 mA
最大供电电压 (Vsup)
1.575 V
最小供电电压 (Vsup)
1.425 V
标称供电电压 (Vsup)
1.5 V
表面贴装
YES
技术
CMOS
温度等级
OTHER
端子形式
BALL
端子节距
0.8 mm
端子位置
BOTTOM
处于峰值回流温度下的最长时间
NOT SPECIFIED
宽度
10 mm
文档预览
K4B4G0446B
K4B4G0846B
DDP 4Gb DDR3 SDRAM
DDP 4Gb B-die DDR3 SDRAM Specification
78 FBGA with Lead-Free & Halogen-Free
(RoHS Compliant)
INFORMATION IN THIS DOCUMENT IS PROVIDED IN RELATION TO SAMSUNG PRODUCTS,
AND IS SUBJECT TO CHANGE WITHOUT NOTICE. NOTHING IN THIS DOCUMENT SHALL BE
CONSTRUED AS GRANTING ANY LICENSE, EXPRESS OR IMPLIED, BY ESTOPPEL OR OTHER-
WISE, TO ANY INTELLECTUAL PROPERTY RIGHTS IN SAMSUNG PRODUCTS OR TECHNOL-
OGY. ALL INFORMATION IN THIS DOCUMENT IS PROVIDED ON AS "AS IS" BASIS WITHOUT
GUARANTEE OR WARRANTY OF ANY KIND.
1. For updates or additional information about Samsung products, contact your nearest Samsung office.
2. Samsung products are not intended for use in life support, critical care, medical, safety equipment, or similar
applications where Product failure could result in loss of life or personal or physical harm, or any military or
defense application, or any governmental procurement to which special terms or provisions may apply.
* Samsung Electronics reserves the right to change products or specification without notice.
Page 1 of 59
Rev. 1.0 March 2009
K4B4G0446B
K4B4G0846B
DDP 4Gb DDR3 SDRAM
Year
2009
- First release
History
Revision History
Revision
1.0
Month
March
Page 2 of 59
Rev. 1.0 March 2009
K4B4G0446B
K4B4G0846B
DDP 4Gb DDR3 SDRAM
Table Contents
1.0 Ordering Information ................................................................................................................... 5
2.0 Key Features ................................................................................................................................ 5
3.0 Package pinout/Mechanical Dimension & Addressing ............................................................ 6
3.1 x4 DDP Package Pinout (Top view) : 78ball FBGA Package
.............................................................. 6
3.2 x8 DDP Package Pinout (Top view) : 78ball FBGA Package
.............................................................. 7
3.3 FBGA Package Dimension (x4)
..................................................................................................... 8
3.4 FBGA Package Dimension (x8)
..................................................................................................... 9
4.0 Input/Output Functional Description ....................................................................................... 10
5.0 DDR3 SDRAM Addressing ........................................................................................................ 11
6.0 Absolute Maximum Ratings ...................................................................................................... 12
6.1 Absolute Maximum DC Ratings
................................................................................................... 12
6.2 DRAM Component Operating Temperature Range
......................................................................... 12
7.0 AC & DC Operation Conditions ................................................................................................ 12
7.1 Recommended DC operating Conditions (SSTL_1.5)
..................................................................... 12
8.0 AC & DC Input Measurement Levels ........................................................................................ 13
8.1 AC and DC Logic input levels for single-ended singnals
................................................................ 13
8.2 VREF Tolerances
....................................................................................................................... 14
8.3 AC and DC Logic Input Levels for Ditterential Signals
................................................................... 15
8.3.1 Differential signal definition
................................................................................................ 15
8.3.2 Differential swing requirement for clock (CK - CK) and strobe (DQS - DQS)
.............................. 15
8.3.3 Single-ended requirements for differential signals
................................................................. 16
8.4 Differential Input Cross Point Voltage
.......................................................................................... 17
8.5 Slew Rate Definition for Single Ended Input Signals
...................................................................... 17
8.6 Slew rate definition for Differential Input Signals
........................................................................... 17
9.0 AC and DC Output Measurement Levels ................................................................................. 18
9.1 Single Ended AC and DC Output Levels
....................................................................................... 18
9.2 Differential AC and DC Output Levels
.......................................................................................... 18
9.3 Single Ended Output Slew Rate
................................................................................................... 18
9.4 Differential Output Slew Rate
...................................................................................................... 19
9.5 Reference Load for AC Timing and Output Slew Rate
.................................................................... 19
9.6 Overshoot/Undershoot Specification
........................................................................................... 20
9.6.1 Address and Control Overshoot and Undershoot specifications
............................................. 20
9.6.2 Clock, Data, Strobe and Mask Overshoot and Undershoot specifications
................................. 20
9.7 34 ohm Output Driver DC Electrical Characteristics
....................................................................... 21
................................................................. 22
9.8 On-Die Termination (ODT) Levels and I-V Characteristics
............................................................... 22
9.8.1 ODT DC electrical characteristics
........................................................................................ 23
9.8.2 ODT Temperature and Voltage sensitivity
............................................................................. 24
9.7.1 Output Drive Temperature and Voltage sensitivity
Page 3 of 59
Rev. 1.0 March 2009
K4B4G0446B
K4B4G0846B
9.9 ODT Timing Definitions
DDP 4Gb DDR3 SDRAM
.............................................................................................................. 25
................................................................................................. 25
9.9.2 ODT Timing Definition
........................................................................................................ 25
9.9.1 Test Load for ODT Timings
10.0 IDD Specification Parameters and Test Conditions ............................................................. 28
10.1 IDD Measurement Conditions
.................................................................................................... 28
10.2 IDD Specifications definition
..................................................................................................... 30
11.0 DDP 4Gb DDR3 SDRAM B-die IDD Spec Table ..................................................................... 37
12.0 Input/Output Capacitance ....................................................................................................... 38
13.0 Electrical Characteristics and AC timing for DDR3-800 to DDR3-1600 .............................. 39
13.1 Clock specification
............................................................................................................. 39
13.1.1 Definition for tCK (avg)
..................................................................................................... 39
13.1.2 Definition for tCK (abs)
..................................................................................................... 39
13.1.3 Definition for tCH(avg) and tCL(avg)
................................................................................... 39
13.1.4 Definition for note for tJIT(per), tJIT(per,Ick)
........................................................................ 39
...................................................................................... 39
13.1.6 Definition for tERR(nper)
................................................................................................... 39
13.2 Refresh Parameters by Device Density
....................................................................................... 40
13.3 Speed Bins and CL, tRCD, tRP, tRC and tRAS for corresponding Bin
............................................. 40
13.3.1 Speed Bin Table Notes...........................................................................................................................
43
13.1.5 Definition for tJIT(cc), tJIT(cc,Ick)
14.0 Timing Parameters by Speed Grade ...................................................................................... 44
14.1 Jitter Notes
............................................................................................................................. 47
14.2 Timing Parameter Notes
........................................................................................................... 48
14.3 Address / Command Setup, Hold and Derating:
........................................................................... 49
14.4 Data Setup, Hold and Slew Rate Derating:
.................................................................................. 55
Page 4 of 59
Rev. 1.0 March 2009
K4B4G0446B
K4B4G0846B
1.0 Ordering Information
[ Table 1 ] Samsung DDP 4Gb DDR3 B-die ordering information table
Organization
1Gx4
512Mx8
DDR3-800 (6-6-6)
K4B4G0446B-MCF7
K4B4G0846B-MCF7
DDR3-1066 (7-7-7)
K4B4G0446B-MCF8
K4B4G0846B-MCF8
DDP 4Gb DDR3 SDRAM
DDR3-1333 (9-9-9)
K4B4G0446B-MCH9
K4B4G0846B-MCH9
Package
78 FBGA
78 FBGA
Note :
1. Speed bin is in order of CL-tRCD-tRP.
2.0 Key Features
[ Table 2 ] DDP 4Gb DDR3 B-die Speed bins
Speed
tCK(min)
CAS Latency
tRCD(min)
tRP(min)
tRAS(min)
tRC(min)
DDR3-800
6-6-6
2.5
6
15
15
37.5
52.5
DDR3-1066
7-7-7
1.875
7
13.125
13.125
37.5
50.625
DDR3-1333
9-9-9
1.5
9
13.5
13.5
36
49.5
Unit
ns
nCK
ns
ns
ns
ns
• JEDEC standard 1.5V ± 0.075V Power Supply
• V
DDQ
= 1.5V ± 0.075V
• 400 MHz f
CK
for 800Mb/sec/pin, 533MHz f
CK
for 1066Mb/sec/pin,
667MHz f
CK
for 1333Mb/sec/pin
• 8 Banks
• Posted CAS
• Programmable CAS Latency(posted CAS): 6, 7, 8, 9, 10
• Programmable Additive Latency: 0, CL-2 or CL-1 clock
• Programmable CAS Write Latency (CWL) = 5 (DDR3-800), 6
(DDR3-1066) and 7 (DDR3-1333)
• 8-bit pre-fetch
• Burst Length: 8 (Interleave without any limit, sequential with starting
address “000” only), 4 with tCCD = 4 which does not allow seamless
read or write [either On the fly using A12 or MRS]
• Bi-directional Differential Data-Strobe
• Internal(self) calibration : Internal self calibration through ZQ pin
(RZQ : 240 ohm ± 1%)
• On Die Termination using ODT pin
• Average Refresh Period 7.8us at lower than T
CASE
85°C, 3.9us at
85°C < T
CASE
< 95
°C
• Asynchronous Reset
• Package : 78 balls FBGA - x4/x8
• All of Lead-Free products are compliant for RoHS
• All of products are Halogen-free
The DDP 4Gb DDR3 SDRAM B-die is organized as a 128Mbit x 4 I/Os x
8banks, 64Mbit x 8 I/Os x 8banks. This synchronous device achieves high
speed double-data-rate transfer rates of up to 1333Mb/sec/pin (DDR3-
1333) for general applications.
The chip is designed to comply with the following key DDR3 SDRAM fea-
tures such as posted CAS, Programmable CWL, Internal (Self) Calibra-
tion, On Die Termination using ODT pin and Asynchronous Reset .
All of the control and address inputs are synchronized with a pair of exter-
nally supplied differential clocks. Inputs are latched at the crosspoint of dif-
ferential clocks (CK rising and CK falling). All I/Os are synchronized with a
pair of bidirectional strobes (DQS and DQS) in a source synchronous fash-
ion. The address bus is used to convey row, column, and bank address
information in a RAS/CAS multiplexing style. The DDR3 device operates
with a single 1.5V ± 0.075V power supply and 1.5V ± 0.075V V
DDQ
.
The 4Gb DDR3 B-die device is available in 78ball FBGAs(x4/x8).
Note : 1. The functionality described and the timing specifications included
in this data sheet are for the DLL Enabled mode of operation.
Note : This data sheet is an abstract of full DDR3 specification and does not cover the common features which are described in “DDR3 SDRAM Device
Operation & Timing Diagram”.
Page 5 of 59
Rev. 1.0 March 2009
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参数对比
与K4B4G0846B-MCH90相近的元器件有:K4B4G0446B-MCF70、K4B4G0846B-MCF70、K4B4G0446B-MCF80、K4B4G0446B-MCH90、K4B4G0846B-MCF80。描述及对比如下:
型号 K4B4G0846B-MCH90 K4B4G0446B-MCF70 K4B4G0846B-MCF70 K4B4G0446B-MCF80 K4B4G0446B-MCH90 K4B4G0846B-MCF80
描述 DDR DRAM, 512MX8, 0.255ns, CMOS, PBGA78, HALOGEN FREE AND ROHS COMPLIANT, FBGA-78 DDR DRAM, 1GX4, 0.4ns, CMOS, PBGA78, HALOGEN FREE AND ROHS COMPLIANT, FBGA-78 DDR DRAM, 512MX8, 0.4ns, CMOS, PBGA78, HALOGEN FREE AND ROHS COMPLIANT, FBGA-78 DDR DRAM, 1GX4, 0.3ns, CMOS, PBGA78, HALOGEN FREE AND ROHS COMPLIANT, FBGA-78 DDR DRAM, 1GX4, 0.255ns, CMOS, PBGA78, HALOGEN FREE AND ROHS COMPLIANT, FBGA-78 DDR DRAM, 512MX8, 0.3ns, CMOS, PBGA78, HALOGEN FREE AND ROHS COMPLIANT, FBGA-78
是否无铅 不含铅 不含铅 不含铅 不含铅 不含铅 不含铅
是否Rohs认证 符合 符合 符合 符合 符合 符合
零件包装代码 BGA BGA BGA BGA BGA BGA
包装说明 LFBGA, BGA78,9X13,32 LFBGA, BGA78,9X13,32 LFBGA, BGA78,9X13,32 LFBGA, BGA78,9X13,32 LFBGA, BGA78,9X13,32 LFBGA, BGA78,9X13,32
针数 78 78 78 78 78 78
Reach Compliance Code compliant compliant compliant compliant compliant compliant
ECCN代码 EAR99 EAR99 EAR99 EAR99 EAR99 EAR99
访问模式 MULTI BANK PAGE BURST MULTI BANK PAGE BURST MULTI BANK PAGE BURST MULTI BANK PAGE BURST MULTI BANK PAGE BURST MULTI BANK PAGE BURST
最长访问时间 0.255 ns 0.4 ns 0.4 ns 0.3 ns 0.255 ns 0.3 ns
其他特性 AUTO/SELF REFRESH AUTO/SELF REFRESH AUTO/SELF REFRESH AUTO/SELF REFRESH AUTO/SELF REFRESH AUTO/SELF REFRESH
最大时钟频率 (fCLK) 667 MHz 400 MHz 400 MHz 533 MHz 667 MHz 533 MHz
I/O 类型 COMMON COMMON COMMON COMMON COMMON COMMON
JESD-30 代码 R-PBGA-B78 R-PBGA-B78 R-PBGA-B78 R-PBGA-B78 R-PBGA-B78 R-PBGA-B78
长度 11.5 mm 11.5 mm 11.5 mm 11.5 mm 11.5 mm 11.5 mm
内存密度 4294967296 bit 4294967296 bit 4294967296 bit 4294967296 bit 4294967296 bit 4294967296 bit
内存集成电路类型 DDR DRAM DDR DRAM DDR DRAM DDR DRAM DDR DRAM DDR DRAM
内存宽度 8 4 8 4 4 8
功能数量 1 1 1 1 1 1
端口数量 1 1 1 1 1 1
端子数量 78 78 78 78 78 78
字数 536870912 words 1073741824 words 536870912 words 1073741824 words 1073741824 words 536870912 words
字数代码 512000000 1000000000 512000000 1000000000 1000000000 512000000
工作模式 SYNCHRONOUS SYNCHRONOUS SYNCHRONOUS SYNCHRONOUS SYNCHRONOUS SYNCHRONOUS
最高工作温度 85 °C 85 °C 85 °C 85 °C 85 °C 85 °C
组织 512MX8 1GX4 512MX8 1GX4 1GX4 512MX8
输出特性 3-STATE 3-STATE 3-STATE 3-STATE 3-STATE 3-STATE
封装主体材料 PLASTIC/EPOXY PLASTIC/EPOXY PLASTIC/EPOXY PLASTIC/EPOXY PLASTIC/EPOXY PLASTIC/EPOXY
封装代码 LFBGA LFBGA LFBGA LFBGA LFBGA LFBGA
封装等效代码 BGA78,9X13,32 BGA78,9X13,32 BGA78,9X13,32 BGA78,9X13,32 BGA78,9X13,32 BGA78,9X13,32
封装形状 RECTANGULAR RECTANGULAR RECTANGULAR RECTANGULAR RECTANGULAR RECTANGULAR
封装形式 GRID ARRAY, LOW PROFILE, FINE PITCH GRID ARRAY, LOW PROFILE, FINE PITCH GRID ARRAY, LOW PROFILE, FINE PITCH GRID ARRAY, LOW PROFILE, FINE PITCH GRID ARRAY, LOW PROFILE, FINE PITCH GRID ARRAY, LOW PROFILE, FINE PITCH
峰值回流温度(摄氏度) NOT SPECIFIED NOT SPECIFIED NOT SPECIFIED NOT SPECIFIED NOT SPECIFIED NOT SPECIFIED
电源 1.5 V 1.5 V 1.5 V 1.5 V 1.5 V 1.5 V
认证状态 Not Qualified Not Qualified Not Qualified Not Qualified Not Qualified Not Qualified
刷新周期 8192 8192 8192 8192 8192 8192
座面最大高度 1.5 mm 1.5 mm 1.5 mm 1.5 mm 1.5 mm 1.5 mm
自我刷新 YES YES YES YES YES YES
最大待机电流 0.024 A 0.024 A 0.024 A 0.024 A 0.024 A 0.024 A
最大压摆率 0.32 mA 0.235 mA 0.245 mA 0.25 mA 0.3 mA 0.27 mA
最大供电电压 (Vsup) 1.575 V 1.575 V 1.575 V 1.575 V 1.575 V 1.575 V
最小供电电压 (Vsup) 1.425 V 1.425 V 1.425 V 1.425 V 1.425 V 1.425 V
标称供电电压 (Vsup) 1.5 V 1.5 V 1.5 V 1.5 V 1.5 V 1.5 V
表面贴装 YES YES YES YES YES YES
技术 CMOS CMOS CMOS CMOS CMOS CMOS
温度等级 OTHER OTHER OTHER OTHER OTHER OTHER
端子形式 BALL BALL BALL BALL BALL BALL
端子节距 0.8 mm 0.8 mm 0.8 mm 0.8 mm 0.8 mm 0.8 mm
端子位置 BOTTOM BOTTOM BOTTOM BOTTOM BOTTOM BOTTOM
处于峰值回流温度下的最长时间 NOT SPECIFIED NOT SPECIFIED NOT SPECIFIED NOT SPECIFIED NOT SPECIFIED NOT SPECIFIED
宽度 10 mm 10 mm 10 mm 10 mm 10 mm 10 mm
厂商名称 SAMSUNG(三星) - SAMSUNG(三星) SAMSUNG(三星) SAMSUNG(三星) SAMSUNG(三星)
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