NM25C041 4K-Bit Serial Interface CMOS EEPROM (Serial Peripheral Interface
(SPI) Synchronous Bus)
Connection Diagram
Dual-In-Line Package (N)
and SO Package (M8)
CS
SO
WP
V
SS
1
2
3
4
Top View
8
7
6
5
V
CC
HOLD
SCK
SI
DS800002-2
Pin Names
CS
SO
WP
V
SS
SI
SCK
HOLD
V
CC
Chip Select Input
Serial Data Output
Write Protect
Ground
Serial Data Input
Serial Clock Input
Suspends Serial Data
Power Supply
Ordering Information
NM
25
C
XX
LZ E
XX
Package
Temp. Range
Letter
N
M8
None
V
E
Blank
L
LZ
041
C
Interface
25
NM
Description
8-pin DIP
8-pin SO
0 to 70°C
-40 to +125°C
-40 to +85°C
4.5V to 5.5V
2.7V to 4.5V
2.7V to 4.5V and
<1µA Standby Current
4K, mode 1
CMOS
SPI
Fairchild Non-Volatile
Memory
Voltage Operating Range
Density/Mode
2
NM25C041 Rev. D.1
www.fairchildsemi.com
NM25C041 4K-Bit Serial Interface CMOS EEPROM (Serial Peripheral Interface
(SPI) Synchronous Bus)
Absolute Maximum Ratings
(Note 1)
Ambient Storage Temperature
All Input or Output Voltages
with Respect to Ground
Lead Temperature (Soldering, 10 sec.)
ESD Rating
-65°C to +150°C
+6.5V to -0.3V
+300°C
2000V
Operating Conditions
Ambient Operating Temperature
NM25C041
NM25C041E
NM25C041V
Power Supply (V
CC
)
NM25C041
0°C to +70°C
-40°C to +85°C
-40°C to +125°C
4.5V to 5.5V
DC and AC Electrical Characteristics
4.5V
≤
V
CC
≤
5.5V
Symbol
I
CC
I
CCSB
I
IL
I
OL
V
IL
V
IH
V
OL
V
OH
f
OP
t
RI
t
FI
t
CLH
t
CLL
t
CSH
t
CSS
t
DIS
t
HDS
t
CSN
t
DIN
t
HDN
t
PD
t
DH
t
LZ
t
DF
t
HZ
t
WP
Parameter
Operating Current
Standby Current
Input Leakage
Output Leakage
Input Low Voltage
Input High Voltage
Output Low Voltage
Output High Voltage
SCK Frequency
Input Rise Time
Input Fall Time
Clock High Time
Clock Low Time
Min CS High Time
CS Setup Time
Data Setup Time
HOLD Setup Time
CS Hold Time
Data Hold Time
HOLD Hold Time
Output Delay
Output Hold Time
HOLD to Output Low Z
Output Disable Time
HOLD to Output High Z
Write Cycle Time
Conditions
CS = V
IL
CS = V
CC
V
IN
= 0 to V
CC
V
OUT
= GND to V
CC
Min
Max
3
50
Units
mA
µA
µA
µA
V
V
V
V
-1
-1
-0.3
0.7 * V
CC
1
1
V
CC
* 0.3
V
CC
+ 0.3
0.4
I
OL
= 1.6 mA
I
OH
= -0.8 mA
V
CC
- 0.8
2.1
2.0
2.0
(Note 2)
(Note 2)
(Note 3)
190
190
240
240
100
90
240
100
90
C
L
= 200 pF
0
100
C
L
= 200 pF
240
100
1–4 Bytes
10
240
MHz
µs
µs
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ms
Capacitance (Note 4)
T
A
= 25°C, f = 2.1/1 MHz
Symbol
C
OUT
C
IN
AC Test Conditions
Output Load
Input Pulse Levels
Timing Measurement Reference Level
C
L
= 200 pF
0.1 * V
CC
- 0.9 * V
CC
0.3 * V
CC
- 0.7 * V
CC
Test
Output Capacitance
Input Capacitance
Typ
3
2
Max
8
6
Units
pF
pF
Note 1:
Stress above those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress rating only and functional operation of the
device at these or any other conditions above those indicated in the operational sections of the specification is not implied. Exposure to absolute maximum rating conditions for
extended periods may affect device reliability.
Note 2:
The f
OP
frequency specification specifies a minimum clock period of 1/f
OP
. Therefore, for every f
OP
clock cycle, t
CLH
+ t
CLL
must be equal to or greater than 1/f
OP
. For
example, if the 2.1MHz period = 476ns and t
CLH
= 190ns, t
CLL
must be 286ns.
Note 3:
CS must be brought high for a minimum of t
CSH
between consecutive instruction cycles.
Note 4:
This parameter is periodically sampled and not 100% tested.
3
NM25C041 Rev. D.1
www.fairchildsemi.com
NM25C041 4K-Bit Serial Interface CMOS EEPROM (Serial Peripheral Interface
(SPI) Synchronous Bus)
Low Voltage 2.7V
≤
V
CC
≤
4.5V Specifications
Operating Conditions
Absolute Maximum Ratings
(Note 5)
Ambient Storage Temperature
All Input or Output Voltage with
Respect to Ground
Lead Temp. (Soldering, 10 sec.)
ESD Rating
-65°C to +150°C
+6.5V to -0.3V
+300°C
2000V
Ambient Operating Temperature
NM25C041L/LZ
NM25C041LE/LZE
NM25C041LV
Power Supply (V
CC
)
0°C to +70°C
-40°C to +85°C
-40°C to +125°C
2.7V - 4.5V
DC and AC Electrical Characteristics
2.7V
≤
V
CC
≤
4.5V
25C041L/LE
25C041LZ/LZE
Min.
Max.
3
µA
10
1
V
IN
= 0 to V
CC
V
OUT
= GND to V
CC
-1
-1
-0.3
0.7 * V
CC
I
OL
= 0.8 mA
I
OH
= –0.8 mA
V
CC
- 0.8
1.0
2.0
2.0
(Note 6)
(Note 6)
(Note 7)
410
410
500
500
100
240
500
100
240
500
0
240
500
240
1-4 Bytes
15
0
240
500
240
15
410
410
500
500
100
240
500
100
240
500
1
1
V
CC
* 0.3
V
CC
+ 0.3
0.4
V
CC
- 0.8
1.0
2.0
2.0
-1
-1
-0.3
0.7 * V
CC
10
N/A
1
1
V
CC
* 0.3
V
CC
+ 0.3
0.4
µA
µA
V
V
V
V
MHz
µs
µs
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ms
25C041LV
Min
Max
3
Symbol
I
CC
I
CCSB
Parameter
Operating Current
Standby Current
L
LZ
Input Leakage
Output Leakage
Input Low Voltage
Input High Voltage
Output Low Voltage
Output High Voltage
SCK Frequency
Input Rise Time
Input Fall Time
Clock High Time
Clock Low Time
Min. CS High Time
CS Setup Time
Data Setup Time
HOLD Setup Time
CS Hold Time
Data Hold Time
HOLD Hold Time
Output Delay
Output Hold Time
HOLD Output Low Z
Output Disable Time
HOLD to Output Hi Z
Write Cycle Time
Conditions
CS = V
IL
CS = V
CC
Units
mA
I
IL
I
OL
V
IL
V
IH
V
OL
V
OH
f
OP
t
RI
t
FI
t
CLH
t
CLL
t
CSH
t
CSS
t
DIS
t
HDS
t
CSN
t
DIN
t
HDN
t
PD
t
DH
t
LZ
t
DF
t
HZ
t
WP
Capacitance
T
A
= 25°C, f = 2.1/1 MHz (Note 8)
Symbol
C
OUT
C
IN
AC Test Conditions
Output Load
Input Pulse Levels
Timing Measurement Reference Level
C
L
= 200 pF
0.1 * V
CC
- 0.9 * V
CC
0.3 * V
CC
- 0.7 * V
CC
Test
Output Capacitance
Input Capacitance
Typ Max Units
3
2
8
6
pF
pF
Note 5:
Stress above those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress rating only, and functional operation of the
device at these or any other conditions above those indicated in the operational sections of the specification is not implied. Exposure to absolute maximum rating conditions for
extended periods may affect device reliability.
Note 6 :
The f
OP
frequency specification specifies a minimum clock period of 1/f
OP
. Therefore, for every f
OP
clock cycle, t
CLH
+ t
CLL
must be equal to or greater than 1/f
OP
. For
example, if the 2.1MHz period = 476ns and t
CLH
= 190ns, t
CLL
must be 286ns.
Note 7:
CS must be brought high for a minimum of t
CSH
between consecutive instruction cycles.
Note 8:
This parameter is periodically sampled and not 100% tested.
4
NM25C041 Rev. D.1
www.fairchildsemi.com
NM25C041 4K-Bit Serial Interface CMOS EEPROM (Serial Peripheral Interface
