TC74LCX00F/FN/FT/FK
TOSHIBA CMOS Digital Integrated Circuit
Silicon Monolithic
TC74LCX00F,TC74LCX00FN,TC74LCX00FT,TC74LCX00FK
Low-Voltage Quad 2-Input NAND Gate with 5-V Tolerant Inputs and Outputs
The TC74LCX00 is a high-performance CMOS 2-input NAND
gate. Designed for use in 3.3-V systems, it achieves high-speed
operation while maintaining the CMOS low power dissipation.
The device is designed for low-voltage (3.3 V) V
CC
applications,
but it could be used to interface to 5 V supply environment for
inputs.
All inputs are equipped with protection circuits against static
discharge.
Note: xxxFN (JEDEC SOP) is not available in
Japan.
TC74LCX00F
Features
•
•
•
•
•
•
•
Low-voltage operation: V
CC
= 2.0 to 3.6 V
High-speed operation: t
pd
= 5.2 ns (max) (V
CC
= 3.0 to 3.6 V)
Output current: |I
OH
|/I
OL
= 24 mA (min) (V
CC
= 3.0 V)
Latch-up performance:
−500
mA
Available in JEDEC SOP, JEITA SOP, TSSOP and
VSSOP (US)
Power-down protection provided on all inputs and outputs
Pin and function compatible with the 74 series
(74AC/VHC/HC/F/ALS/LS etc.) 00 type
TC74LCX00FT
TC74LCX00FN
TC74LCX00FK
Weight
SOP14-P-300-1.27A
SOL14-P-150-1.27
TSSOP14-P-0044-0.65A
VSSOP14-P-0030-0.50
: 0.18 g (typ.)
: 0.12 g (typ.)
: 0.06 g (typ.)
: 0.02 g (typ.)
1
2007-10-19
TC74LCX00F/FN/FT/FK
Pin Assignment
(top view)
IEC Logic Symbol
1A
1B
2A
2B
3A
3B
4A
4B
1
2
4
5
9
10
12
13
&
1A
1B
1Y
2A
2B
2Y
GND
1
2
3
4
5
6
7
14
13
12
11
10
9
8
V
CC
4B
4A
4Y
3B
3A
3Y
3
6
8
11
1Y
2Y
3Y
4Y
Truth Table
Inputs
A
L
L
H
H
B
L
H
L
H
Outputs
Y
H
H
H
L
Absolute Maximum Ratings (Note 1)
Characteristics
Power supply voltage
DC input voltage
DC output voltage
Input diode current
Output diode current
DC output current
Power dissipation
DC V
CC
/ground current
Storage temperature
Symbol
V
CC
V
IN
V
OUT
I
IK
I
OK
I
OUT
P
D
I
CC
/I
GND
T
stg
Rating
−0.5
to 7.0
−0.5
to 7.0
−0.5
to 7.0
(Note
2)
−0.5
to V
CC
+
0.5
(Note 3)
−50
±50
±50
180
±100
−65
to 150
(Note 4)
V
mA
mA
mA
mW
mA
°C
Unit
V
V
Note 1: Exceeding any of the absolute maximum ratings, even briefly, lead to deterioration in IC performance or
even destruction.
Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly
even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute
maximum ratings and the operating ranges.
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook
(“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test
report and estimated failure rate, etc).
Note 2: V
CC
=
0 V
Note 3: High or low state. I
OUT
absolute maximum rating must be observed.
Note 4: V
OUT
<
GND, V
OUT
>
V
CC
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2007-10-19
TC74LCX00F/FN/FT/FK
Operating Ranges (Note 1)
Characteristics
Power supply voltage
Input voltage
Output voltage
Symbol
V
CC
V
IN
V
OUT
Rating
2.0 to 3.6
1.5 to 3.6 (Note 2)
0 to 5.5
0 to 5.5 (Note 3)
0 to V
CC
(Note 4)
±24
±12
−40
to 85
0 to 10
(Note 7)
(Note 5)
(Note 6)
Unit
V
V
V
Output current
Operating temperature
Input rise and fall time
I
OH
/I
OL
T
opr
dt/dv
mA
°C
ns/V
Note 1: The operating ranges must be maintained to ensure the normal operation of the device.
Unused inputs must be tied to either VCC or GND.
Note 2: Data retention only
Note 3: V
CC
=
0 V
Note 4: High or low state
Note 5: V
CC
=
3.0 to 3.6 V
Note 6: V
CC
=
2.7 to 3.0 V
Note 7: V
IN
=
0.8 to 2.0 V, V
CC
=
3.0 V
Electrical Characteristics
DC Characteristics
(Ta
= −40
to 85°C)
Characteristics
H-level
L-level
Symbol
V
IH
V
IL
Test Condition
⎯
⎯
I
OH
= −100 μA
H-level
V
OH
VIN
=
VIH or VIL
I
OH
= −12
mA
I
OH
= −18
mA
Output voltage
I
OH
= −24
mA
I
OL
=
100
μA
L-level
V
OL
VIN
=
VIH
I
OL
=
12 mA
I
OL
=
16 mA
I
OL
=
24 mA
Input leakage current
Power off leakage current
Quiescent supply current
Increase in Icc per input
I
IN
I
OFF
I
CC
ΔI
CC
V
IN
=
0 to 5.5 V
V
IN
/V
OUT
=
5.5 V
V
IN
=
V
CC
or GND
V
IN
=
3.6 to 5.5 V
V
IH
=
V
CC
−
0.6 V
V
CC
(V)
2.7 to 3.6
2.7 to 3.6
2.7 to 3.6
2.7
3.0
3.0
2.7 to 3.6
2.7
3.0
3.0
2.7 to 3.6
0
2.7 to 3.6
2.7 to 3.6
2.7 to 3.6
Min
2.0
⎯
V
CC
−
0.2
2.2
2.4
2.2
⎯
⎯
⎯
⎯
⎯
⎯
⎯
⎯
⎯
Max
⎯
0.8
⎯
⎯
⎯
⎯
0.2
0.4
0.4
0.55
±5.0
10.0
10.0
±10.0
500
μA
μA
μA
V
Unit
Input voltage
V
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2007-10-19
TC74LCX00F/FN/FT/FK
AC Characteristics
(Ta
= −40
to 85°C)
Characteristics
Symbol
t
pLH
t
pHL
t
osLH
t
osHL
Test Condition
V
CC
(V)
2.7
3.3
±
0.3
(Note)
2.7
3.3
±
0.3
Min
⎯
1.5
⎯
⎯
Max
6.0
5.2
⎯
1.0
Unit
Propagation delay time
Figure 1, Figure 2
ns
Output to output skew
ns
Note:
Parameter guaranteed by design.
(t
osLH
=
|t
pLHm
−
t
pLHn
|, t
osHL
=
|t
pHLm
−
t
pHLn
|)
Dynamic Switching Characteristics
(Ta
=
25°C, input: t
r
=
t
f
=
2.5 ns, C
L
=
50 pF, R
L
=
500
Ω)
Characteristics
Quiet output maximum dynamic V
OL
Quiet output minimum dynamic V
OL
Symbol
V
OLP
|V
OLV
|
Test Condition
V
IH
=
3.3 V, V
IL
=
0 V
V
IH
=
3.3 V, V
IL
=
0 V
V
CC
(V)
3.3
3.3
Typ.
0.8
0.8
Unit
V
V
Capacitive Characteristics
(Ta
=
25°C)
Characteristics
Input capacitance
Output capacitance
Power dissipation capacitance
Symbol
C
IN
C
OUT
C
PD
f
IN
=
10 MHz
Test Condition
⎯
⎯
(Note)
V
CC
(V)
3.3
0
3.3
Typ.
7
8
25
Unit
pF
pF
pF
Note:
C
PD
is defined as the value of the internal equivalent capacitance which is calculated from the operating
current consumption without load.
Average operating current can be obtained by the equation:
I
CC (opr)
=
C
PD
½V
CC
½f
IN
+
I
CC
/4 (per gate)
4
2007-10-19
TC74LCX00F/FN/FT/FK
AC Test Circuit
Output
C
L
R
L
Measure
C
L
=
50 pF
R
L
=
500
Ω
Figure 1
AC Waveform
t
f
2.5 ns
Input
t
r
2.5 ns
90%
1.5 V
10%
2.7 V
GND
V
OH
Output
t
pLH
1.5 V
t
pHL
V
OL
Figure 2 t
pLH
, t
pHL
5
2007-10-19
