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2N2857C1B-JQRS.CVB

Small Signal Bipolar Transistor, 0.04A I(C), 15V V(BR)CEO, 1-Element, NPN, Silicon, HERMETIC SEALED, CERAMIC PACKAGE-3

器件类别:分立半导体    晶体管   

厂商名称:TT Electronics plc

厂商官网:http://www.ttelectronics.com/

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器件参数
参数名称
属性值
包装说明
SMALL OUTLINE, R-CDSO-N3
Reach Compliance Code
unknown
ECCN代码
EAR99
其他特性
LOW NOISE
最大集电极电流 (IC)
0.04 A
集电极-发射极最大电压
15 V
配置
SINGLE
最小直流电流增益 (hFE)
30
JESD-30 代码
R-CDSO-N3
元件数量
1
端子数量
3
最高工作温度
200 °C
封装主体材料
CERAMIC, METAL-SEALED COFIRED
封装形状
RECTANGULAR
封装形式
SMALL OUTLINE
极性/信道类型
NPN
认证状态
Not Qualified
参考标准
MIL-19500
表面贴装
YES
端子形式
NO LEAD
端子位置
DUAL
晶体管应用
AMPLIFIER
晶体管元件材料
SILICON
Base Number Matches
1
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SILICON RF SMALL SIGNAL
NPN TRANSISTOR
2N2857C1
High Current Gain-Bandwidth Product (fT)
Hermetic Ceramic Surface Mount Package
Designed For High Gain, Low Noise Amplifier,
Oscillator and Mixer Applications
Screening Options Available
ABSOLUTE MAXIMUM RATINGS
(TA = 25°C unless otherwise stated)
VCBO
VCEO
VEBO
IC
PD
PD
TJ
Tstg
Collector – Base Voltage
Collector – Emitter Voltage
Emitter – Base Voltage
Continuous Collector Current
TA = 25°C
Total Power Dissipation at
Derate Above 25°C
TC = 25°C
Total Power Dissipation at
Derate Above 25°C
Junction Temperature Range
Storage Temperature Range
30V
15V
3V
40mA
200mW
1.14mW/°C
300mW
1.72mW/°C
-65 to +200°C
-65 to +200°C
THERMAL PROPERTIES
Symbols
R
θJA
R
θJC
Parameters
Thermal Resistance, Junction To Ambient
Thermal Resistance, Junction To Case
Max.
875
583.3
Units
°C/W
°C/W
Semelab Limited reserves the right to change test conditions, parameter limits and package dimensions without notice.
Information furnished by Semelab is believed to be both accurate and reliable at the time of going to press. However
Semelab assumes no responsibility for any errors or omissions discovered in its use. Semelab encourages customers to
verify that datasheets are current before placing orders.
Semelab Limited
Coventry Road, Lutterworth, Leicestershire, LE17 4JB
Telephone +44 (0) 1455 556565
Fax +44 (0) 1455 552612
Email:
sales@semelab-tt.com
Document Number 7726
Issue 2
Page 1 of 4
Website:
http://www.semelab-tt.com
SILICON RF SMALL SIGNAL
NPN TRANSISTOR
2N2857C1
ELECTRICAL CHARACTERISTICS
(TA = 25°C unless otherwise stated)
Symbols
V(BR)CEO
(1)
Parameters
Collector-Emitter
Breakdown Voltage
Collector-Cut-Off Current
Test Conditions
IC = 3mA
VCB = 15V
IB = 0
IE = 0
TA = 150°C
VCB = 30V
IE = 0
IB = 0
IC = 0
VCE = 1.0V
TA = -55°C
IC = 10mA
IC = 10mA
IB = 1.0mA
IB = 1.0mA
Min
15
Typ
Max
Units
V
10
1.0
1.0
100
10
30
10
0.4
150
nA
µA
nA
µA
ICBO
ICES
IEBO
hFE
(1)
Collector-Cut-Off Current
Emitter-Cut-Off Current
Forward-current transfer
ratio
(1)
VCE = 16V
VEB = 3V
IC = 3mA
VCE(sat)
VBE(sat)
(1)
Collector-Emitter Saturation
Voltage
Base-Emitter Saturation
Voltage
V
1.0
DYNAMIC CHARACTERISTICS
| hfe |
Small signal forward-current
transfer ratio
Small Signal Current Gain
Collector – Base Feedback
Capacitance
(2)
IC = 5mA
f = 100MHz
IC = 2mA
f = 1.0KHz
VCB = 10V
f = 1.0MHz
IE = 2mA
f = 31.9MHz
VCE = 6V
f = 450MHz
VCE = 6V
f = 450MHz
VCE = 6V
VCE = 6V
IE = 0
VCB = 6V
IC = 1.5mA
IC = 1.5mA
RG = 50
10
21
hfe
Ccb
rb’CC
Gpe
(2)
50
220
1.0
pF
Collector Base Time
Constant
Small Signal Power Gain
4
15
ps
12.5
dB
4.5
NF
(2)
Noise Figure
Notes
(1) Pulse Width
300us,
δ ≤
2%
(2) By design only, not a production test.
Semelab Limited
Coventry Road, Lutterworth, Leicestershire, LE17 4JB
Telephone +44 (0) 1455 556565
Fax +44 (0) 1455 552612
Email:
sales@semelab-tt.com
Website:
http://www.semelab-tt.com
Document Number 7726
Issue 2
Page 2 of 4
SILICON RF SMALL SIGNAL
NPN TRANSISTOR
2N2857C1
MECHANICAL DATA
Dimensions in mm (inches)
0.51 ± 0.10
(0.02 ± 0.004)
4
R0.31
(0.012)
See
Package
Variant
Table
0.76 ± 0.15
(0.03 ± 0.006)
1.02 ± 0.10
(0.04 ± 0.004)
2.54 ± 0.13
(0.10 ± 0.005)
2
1.91 ± 0.10
(0.075 ± 0.004)
3.05 ± 0.13
(0.12 ± 0.005)
C1
R
(0 0.
.0 56
22
)
1
3
0.31
(0.012) rad.
1.40
(0.055)
max.
Underside View
PACKAGE VARIANT TABLE
Variant
C1A
C1B
Pad 1
Base
Base
Pad 2
Emitter
Emitter
Pad 3
Collector
Collector
Pad 4
No Pad (3-Pins Only)
Lid Contact *
* The additional contact provides a connection to the lid in the application. Connecting the metal lid to a known electrical potential stops deep
dielectric discharge in space applications; see the Space Weather link
www.semelab.co.uk/mil/lcc1_4
on the Semelab web site. Package variant to
be specified at order.
Semelab Limited
Coventry Road, Lutterworth, Leicestershire, LE17 4JB
Telephone +44 (0) 1455 556565
Fax +44 (0) 1455 552612
Email:
sales@semelab-tt.com
Website:
http://www.semelab-tt.com
Document Number 7726
Issue 2
Page 3 of 4
SILICON RF SMALL SIGNAL
NPN TRANSISTOR
2N2857C1
SCREENING OPTIONS
Space Level (JQRS/ESA) and High Reliability options are
available in accordance with the
High Reliability and
Screening Options Handbook
available for download from
the from the TT electronics Semelab web site.
ESA Quality Level Products are based on the testing
procedures specified in the generic ESCC 5000 and in the
corresponding part detail specifications.
Semelabs QR216 and QR217 processing specifications
(JQRS), in conjunction with the companies ISO 9001:2000
approval present a viable alternative to the American MIL-
PRF-19500 space level processing.
QR217 (Space Level Quality Conformance) is based on the
quality conformance inspection requirements of MIL-PRF-
19500 groups A (table V), B (table VIa), C (table VII) and
also ESA / ESCC 5000 (chart F4) lot validation tests.
QR216 (Space Level Screening) is based on the screening
requirements of MIL-PRF-19500 (table IV) and also ESA
/ESCC 5000 (chart F3).
JQRS parts are processed to the device data sheet and
screened to QR216 with conformance testing to Q217
groups A and B in accordance with MIL-STD-750 methods
and procedures.
Additional conformance options are available, for example
Pre-Cap Visual Inspection, Buy-Off Visit or Data Packs.
These are chargeable and must be specified at the order
stage (See Ordering Information). Minimum order
quantities may apply.
Alternative or additional customer specific conformance or
screening requirements would be considered. Contact
Semelab sales with enquires.
ORDERING INFORMATION
Part number is built from part and screening level. The part
number can be extended to include the additional options
as shown below.
Type – See Main Part Number
Package Variant – See Mechanical Data
Screening Level – See Screening Options (ESA / JQRS)
Additional Options:
Customer Pre-Cap Visual Inspection
Customer Buy-Off visit
Data Pack
Solderability Samples
Scanning Electron Microscopy
Radiography (X-ray)
Total Dose Radiation Test
MIL-PRF-19500 (QR217)
Group B charge
Group B destructive mechanical samples
Group C charge
Group C destructive electrical samples
Group C destructive mechanical samples
ESA/ESCC
Lot Validation Testing (subgroup 1) charge
LVT1 destructive samples (environmental)
LVT1 destructive samples (mechanical)
Lot Validation Testing (subgroup 2) charge
LVT2 endurance samples (electrical)
Lot Validation Testing (subgroup 3) charge
LVT3 destructive samples (mechanical)
.CVP
.CVB
.DA
.SS
.SEM
.XRAY
.RAD
.GRPB
.GBDM (12 pieces)
.GRPC
.GCDE (12 pieces)
.GCDM (6 pieces)
.LVT1
.L1DE (15 pieces)
.L1DM (15 pieces)
.LVT2
.L2D (15 pieces)
.LVT3
.L3D (5 pieces)
Additional Option Notes:
1) All ‘Additional Options’ are chargeable and must be specified at order stage.
2) When Group B,C or LVT is required, additional electrical and mechanical destructive
samples must be ordered
3) All destructive samples are marked the same as other production parts unless
otherwise requested.
MARKING DETAILS
Parts are typically marked with specification number, serial
number (or week of seal) as shown in the example below.
Customer specific marking requirements can be arranged at
time of order but is approximately limited to two lines of
7 Characters. This is to ensure text remains readable..
Example Marking:
Example ordering information:
The following example is for the variant B package with,
JQRS screening, additional Group C conformance testing
and a Data pack.
Part Numbers:
2N2857C1B-JQRS
(Include quantity for flight parts)
2N2857C1B-JQRS.GRPC
(chargeable conformance option)
2N2857C1B-JQRS.GCDE
(charge for destructive parts)
2N2857C1B-JQRS.GCDM
(charge for destructive parts)
2N2857C1B-JQRS.DA
(charge for Data pack)
Customers with any specific requirements (e.g. marking,
package or screening) may be supplied with a similar
alternative part number (there is maximum 20 character
limit to part numbers). Requirements for deep dielectric
discharge variant (C1B) must be specified at time of order.
Contact Semelab sales with all enquiries
High Reliability and Screening Options Handbook link: http://www.semelab.co.uk/pdf/misc/documents/hirel_and_screening_options.pdf
Semelab Limited
Coventry Road, Lutterworth, Leicestershire, LE17 4JB
Telephone +44 (0) 1455 556565
Fax +44 (0) 1455 552612
Email:
sales@semelab-tt.com
Document Number 7726
Issue 2
Page 4 of 4
Website:
http://www.semelab-tt.com
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