This product complies with the RoHS Directive (EU 2002/95/EC).
Transistors
2SD1823
Silicon NPN epitaxial planar type
For low-frequency amplification
(0.425)
0.3
+0.1
–0.0
3
Unit: mm
0.15
+0.10
–0.05
■
Absolute Maximum Ratings
T
a
=
25°C
Parameter
Symbol
V
CBO
V
CEO
I
C
V
EBO
I
CP
P
C
T
j
Collector-base voltage (Emitter open)
Collector-emitter voltage (Base open)
Emitter-base voltage (Collector open)
Collector current
Peak collector current
Collector power dissipation
Junction temperature
Storage temperature
T
stg
■
Electrical Characteristics
T
a
=
25°C
±
3°C
ue
Parameter
Symbol
V
CBO
V
CEO
V
EBO
I
CBO
I
CEO
h
FE
f
T
nt
in
Collector-base voltage (Emitter open)
co
Collector-emitter voltage (Base open)
is
Emitter-base voltage (Collector open)
/D
Collector-base cutoff current (Emitter open)
ce
Collector-emitter cutoff current (Base open)
an
Forward current transfer ratio
*
en
Collector-emitter saturation voltage
V
CE(sat)
Rank
h
FE
R
400 to 800
Pl
e
Note) 1. Measuring methods are based on JAPANESE INDUSTRIAL STANDARD JIS C 7030 measuring methods for transistors.
2. *: Rank classification
M
ai
nt
Transition frequency
Publication date: April 2003
pl d in
as
an c
e
ed lud
pl
vi
an m m es
si
tf
ed ain ai fo
ol
lo dis dis ten nte llow
ht w c
tp in o co an nan in
:// g nt n ce c g
pa U in tin t e fo
na RL ue ue ype typ ur
so a d t d
e Pr
od
ni bo yp typ
c. u e e
uc
ne t l
d
tl
at
ife
t/s e
cy
c/ st
en in
cl
e
fo
st
rm
ag
at
e.
io
n.
1.25
±0.10
2.1
±0.1
1
2
M
Di ain
sc te
on na
tin nc
ue e/
d
■
Features
•
High forward current transfer ratio h
FE
•
Low collector-emitter saturation voltage V
CE(sat)
•
High emitter-base voltage (Collector open) V
EBO
•
Low noise voltage NV
•
S-Mini type package, allowing downsizing of the equipment
and automatic insertion through the tape packing and the maga-
zine packing.
(0.65) (0.65)
1.3
±0.1
2.0
±0.2
10°
5°
Rating
50
40
15
50
Unit
V
V
V
0.9
±0.1
0.9
+0.2
–0.1
1: Base
2: Emitter
3: Collector
EIAJ: SC-70
SMini3-G1 Package
mA
Marking symbol: 1Z
100
150
150
mA
°C
mW
°C
−55
to
+150
Conditions
Min
50
Typ
0 to 0.1
Max
Unit
V
I
C
=
10
µA,
I
E
=
0
I
C
=
1 mA, I
B
=
0
I
E
=
10
µA,
I
C
=
0
40
V
15
V
V
CB
=
20 V, I
E
=
0
V
CE
=
20 V, I
B
=
0
0.1
1
µA
µA
V
V
CE
= 10 V, I
C
= 2 mA
I
C
=
10 mA, I
B
=
1 mA
400
2 000
0.20
0.05
120
V
CB
=
10 V, I
E
= −2
mA, f
=
200 MHz
MHz
S
T
1 000 to 2 000
600 to 1 200
0.2
±0.1
SJC00229BED
1
This product complies with the RoHS Directive (EU 2002/95/EC).
2SD1823
P
C
T
a
200
160
T
a
=
25°C
I
C
V
CE
120
I
C
V
BE
V
CE
=
10 V
25°C
T
a
=
75°C
−25°C
Collector power dissipation P
C
(mW)
160
100
Collector current I
C
(mA)
120
I
B
=
100
µA
90
µA
80
µA
70
µA
60
µA
50
µA
40
µA
30
µA
20
µA
10
µA
Collector current I
C
(mA)
80
120
80
60
80
40
40
40
20
0
0
40
80
120
160
0
0
0
2
4
6
8
10
12
0
0.4
0.8
1.2
1.6
2.0
Ambient temperature T
a
(
°C
)
Collector-emitter voltage V
CE
(V)
Base-emitter voltage V
BE
(V)
V
CE(sat)
I
C
Collector-emitter saturation voltage V
CE(sat)
(V)
100
I
C
/ I
B
=
10
1 800
h
FE
I
C
V
CE
=
10 V
250
f
T
I
E
V
CB
=
10 V
T
a
=
25°C
Forward current transfer ratio h
FE
Transition frequency f
T
(MHz)
1 500
200
10
1 200
T
a
=
75°C
900
25°C
−25°C
600
150
1
100
0.1
25°C
T
a
=
75°C
−25°C
300
50
0.01
0.1
1
10
100
0
0.1
1
10
100
0
−
0.1
−1
−10
−100
Collector current I
C
(mA)
Collector current I
C
(mA)
Emitter current I
E
(mA)
C
ob
V
CB
Collector output capacitance
C (pF)
(Common base, input open circuited)
ob
8
I
E
=
0
f
=
1 MHz
T
a
=
25°C
6
4
2
0
1
10
100
Collector-base voltage V
CB
(V)
2
SJC00229BED
Request for your special attention and precautions in using the technical information and
semiconductors described in this book
(1)
If any of the products or technical information described in this book is to be exported or provided to non-residents, the laws and
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Consult our sales staff in advance for information on the following applications:
–
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–
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(4) The products and product specifications described in this book are subject to change without notice for modification and/or im-
provement. At the final stage of your design, purchasing, or use of the products, therefore, ask for the most up-to-date Product
Standards in advance to make sure that the latest specifications satisfy your requirements.
(5) When designing your equipment, comply with the range of absolute maximum rating and the guaranteed operating conditions
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defect which may arise later in your equipment.
Even when the products are used within the guaranteed values, take into the consideration of incidence of break down and failure
mode, possible to occur to semiconductor products. Measures on the systems such as redundant design, arresting the spread of fire
or preventing glitch are recommended in order to prevent physical injury, fire, social damages, for example, by using the products.
(6) Comply with the instructions for use in order to prevent breakdown and characteristics change due to external factors (ESD, EOS,
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