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ACT-E128K32N-140F2M

ACT-E128K32 High Speed 4 Megabit EEPROM Multichip Module

厂商名称:Aeroflex

厂商官网:http://www.aeroflex.com/

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ACT–E128K32 High Speed
4 Megabit EEPROM Multichip Module
Features
Package
Organized as 128K x 32
User
CIRCUIT TECHNOLOGY
www.aeroflex.com
4 Low Power 128K x 8 EEPROM Die in One MCM
Packaging – Hermetic Ceramic
Configurable to 256K x 16 or 512K x 8
CMOS and TTL Compatible Inputs and Outputs
Access Times of 120,140,150, 200, 250& 300ns
+5V ±10% Supply
Automatic Page Write Operation
Page Write Cycle Time: 10ms Max
Data Retention Ten Years Minimum
Low Power CMOS
Data Polling for End of Write Detection
Industry Standard Pinouts
66 Pin, 1.08" x 1.08" x .160" PGA Type, No Shoulder,
Aeroflex code# "P3"
66 Pin, 1.08" x 1.08" x .185" PGA Type, With
Shoulder, Aeroflex code# "P7"
68 Lead, .88" x .88" x .200" Dual-Cavity Small
Outline Gull Wing, Aeroflex code# "F2"
(Drops into
the 68 Lead JEDEC .99"SQ CQFJ footprint)
MIL-PRF-38534 Compliant MCMs Available
Hardware and Software Data Protection
Internal Decoupling Capacitors for Low Noise
Operation
Commercial, Industrial and Military Temperature
Ranges
SMD# 5962–94585 Released (P7 & F2)
General Description
Block Diagram – PGA Type Package (P3,P7) & CQFP (F2)
The ACT–E128K32 is a high
speed, 4 megabit, CMOS
EEPROM multichip module
(MCM) designed for full
temperature range military,
space, or high reliability
applications. The MCM can be
organized as a 256K x 16 bits
or 512K x 8 bits device and is
input and output CMOS and
TTL compatible. Writing is
executed when the write enable
(WE) and chip enable (CE)
inputs are low and output
enable (OE) is high. Reading is
accomplished when WE is high
and CE and OE are both low.
Access
times
grades
of
120, 140, 150, 200, 250 & 300ns
are standard.
The
ACT–E128K32
is
packaged in a choice of
hermetically sealed co-fired
ceramic packages, a 66 pin,
1.08" sq PGA or a 68 lead, .88"
sq gullwing CQFP. The device
operates over the temperature
range of -55°C to +125°C and
military environment.
WE
1
CE
1
WE
2
CE
2
WE
3
CE
3
WE
4
CE
4
A
0
– A
16
OE
128Kx8
128Kx8
128Kx8
128Kx8
8
8
8
8
I/O
0-7
I/O
8-15
I/O
16
-
23
I/O
24-31
Pin Description
I/O
0-31
Data I/O
A
0–16
Address Inputs
WE
1-4
Write Enables
OE
CE
1-4
V
CC
GND
Output Enable
Chip Enables
Power Supply
Ground
eroflex Circuit Technology - Advanced Multichip Modules © SCD1662 REV B 9/5/01
Absolute Maximum Ratings
Parameter
Operating Temperature
Storage Temperature Range
All Input Voltages with respect to Ground
All Output Voltages with respect to Ground
Voltage on OE and A9 with respect to Ground
Symbol
T
C
T
STG
V
G
-
-
Range
-55 to +125
-65 to +150
-0.6 to +6.25
-0.6 to V
CC
+0.6
-0.6 to +13.5
Units
°C
°C
V
V
V
NOTICE: Stresses above those listed under "Absolute Maximums Rating" may cause permanent damage to the device. This is a stress rating only and functional
operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect device reliability.
Recommended Operating Conditions
Symbol
V
CC
V
IH
V
IL
T
C
Parameter
Power Supply Voltage
Input High Voltage
Input Low Voltage
Case Operating Temperature (Military)
Minimum
+4.5
+2.0
-0.5
-55
Maximum
+5.5
V
CC
+ 0.3
+0.8
+125
Units
V
V
V
°C
A
Capacitance
(V
IN
= 0V, f = 1MHz, T
C
= 25°C)
Symbol
C
AD
C
OE
C
WE
(1-4)
C
CE
(1-4)
C
I
/
O
Parameter
A
0
– A
16
Capacitance
Output Enable Capacitance
Write Enable Capacitance
Chip Enable Capacitance
I/O0 – I/O31 Capacitance
Maximum
50
50
20
20
20
Units
pF
pF
pF
pF
pF
DC Characteristics
(Vcc = 5.0V, Vss = 0V, T
C
= -55°C to +125°C, unless otherwise specified)
Parameter
Input Leakage Current
Output Leakage Current
Operating Supply Current x 32 Mode
Operating Supply Current
Output Low Voltage
Output High Voltage
Sym
I
LI
Conditions
V
CC
= 5.5V, V
IN
= GND to V
CC
Minimum
Maximum
10
10
250
5
0.45
Units
µA
µA
mA
mA
V
V
I
LO
X
32
CE = OE = V
IH
,
V
OUT
= GND to V
CC
I
CC
X
32
CE = V
IL
,
OE = V
IH
, f = 5Mhz
I
SB
V
OL
V
OH
CE = V
IH
, OE = V
IH
,
f = 5Mhz
I
OL
= +2.1mA, V
CC
= 4.5V
I
OH
= –400µA, V
CC
= 4.5V
2.4
Truth Table
CE
H
L
L
X
X
X
OE
X
L
H
H
X
L
WE
X
H
L
X
H
X
Mode
Standby
Read
Write
Out Disable
Write
Inhibit
Data I/O
High Z
Data Out
Data In
High Z
-
-
Aeroflex Circuit Technology
2
SCD1662 REV B 9/5/01 Plainview NY (516) 694-6700
AC Write Characteristics
(V
CC
= 5V, V
SS
= 0V, T
C
= -55°C to +125°C)
Parameter
Write Cycle Time
Address Set-up Time
Write Pulse Width (WE or CE)
Chip Enable Set-up Time
Address Hold Time
Data Hold Time
Chip Enable Hold Time
Data Set-up Time
Output Enable Set-up Time
Output Enable Hold Time
Symbol
t
WC
t
AS
t
WP
t
CE
t
AH
t
DH
t
CEH
t
DS
t
OES
t
OEH
Min
10
150
0
100
10
0
100
10
10
Max
10
Units
ms
ns
ns
ns
ns
ns
ns
ns
ns
ns
A
AC Read Characteristics
(V
CC
= 5V, V
SS
= 0V, T
C
= -55°C to +125°C)
Read Cycle Parameter
Read Cycle Time
Address Access Time
Chip Enable Access Time
Output Hold From Address Change,
OE or CE
Output Enable to Output Valid
Chip Enable or OE to High Z Output
Symbol
t
RC
t
ACC
t
ACE
t
OH
t
OE
t
DF
–120
Min
120
120
120
0
0
55
70
0
0
–140
140
140
140
0
55
70
0
–150
150
150
150
0
55
70
0
–200
200
200
200
0
55
70
0
–250
250
250
250
0
85
70
0
–300
Max
300
300
300
Max Min
Max Min
Max Min
Max Min
Max Min
Units
ns
ns
ns
ns
85
70
ns
ns
Page Write Characteristics
(V
CC
= 5V, V
SS
= 0V, T
C
= -55°C to +125°C)
Parameter
Write Cycle Time
Address Set-up Time
Address Hold Time , See Note 1
Data Set-up Time
Data Hold Time
Write Pulse Width
Byte Load Cycle Time
Write Pulse Width High
Note 1 – Page Address must remain valid for duration of write cycle.
Symbol
t
WC
t
AS
t
AH
t
DS
t
DH
t
WP
t
BLC
t
WPH
Minimum
10
100
100
10
150
Maximum
10
Units
ms
ns
ns
ns
ns
ns
150
50
µs
ns
Aeroflex Circuit Technology
3
SCD1662 REV B 9/5/01 Plainview NY (516) 694-6700
Device Operation
The ACT-E128K32 is a high-performance
Electrically Erasable and Programmable
Read Only Memory. It is composed of four 1
megabit memory chips and is organized as
131,072 by 32 bits. The device offers access
times of 120 to 300ns with power dissipation
of 1.375W. When the device is deselected,
the CMOS standby current is less than 5 mA.
The ACT-E128K32 is accessed like a Static
RAM for the read or write cycle without the
need for external components. The device
contains a 128-byte page register to allow
writing of up to 128 bytes simultaneously.
During a write cycle, the address and 1 to
128 bytes of data are internally latched,
freeing the address and data bus for other
operations. Following the initiation of a write
cycle, the device will automatically write the
latched data using an internal control timer.
The end of a write cycle can be detected by
DATA polling of I/O7. Once the end of a write
cycle has been detected a new access for a
read or write can begin.
Aeroflex’s ACT-E128K32 has additional
features to ensure high quality and
manufacturability. The device utilizes internal
error correction for extended endurance and
improved data retention characteristics. An
optional software data protection mechanism
is available to guard against inadvertent
writes.
consists of setting the WE line low. The write
cycle begins when the last of either CE or
WE goes low.
The WE line transition from high to low also
initiates an internal delay timer to permit
page mode operation. Each subsequent WE
transition from high to low that occurs before
the completion of the
t
BLC
time out will restart
the timer from zero. The operation of the
timer is the same as a retriggable one-shot.
READ
The ACT-E128K32 stores data at the
memory location determined by the address
pins. When CE and OE are low and WE is
high, this data is present on the outputs.
When CE and OE are high, the outputs are in
a high impedance state. This two line control
prevents bus contention.
A
DATA POLLING
The ACT-E128K32 offers a data polling
feature which allows a faster method of
writing to the device. Figure 5 shows the
timing diagram for this function. During a
byte or page write cycle, an attempted read
of the last byte written will result in the
complement of the written data on I/O7 (For
each Chip). Once the write cycle has been
completed, true data is valid on all outputs
and the next cycle may begin. Data polling
may begin at any time during the write cycle.
WRITE
A write cycle is initiated when OE is high and
a low pulse is on WE or CE with CE or WE
low. The address is latched on the falling
edge of CE or WE whichever occurs last.
The data is latched by the rising edge of CE
or WE, whichever occurs first. A byte write
operation will automatically continue to
completion.
PAGE WRITE OPERATION
The ACT-E128K32 has a page write
operation that allows one to 128 bytes of data
to be written into the device and
consecutively loads during the internal
programming period. Successive bytes may
be loaded in the same manner after the first
data byte has been loaded. An internal timer
begins a time out operation at each write
cycle. If another write cycle is completed
within
t
BLC
or less, a new time out period
begins. Each write cycle restarts the delay
period. The write cycles can be continued as
long as the interval is less than the time out
period.
WRITE CYCLE TIMING
Figures 2 and 3 show the write cycle timing
relationships. A write cycle begins with
address application, write enable and chip
enable. Chip enable is accomplished by
placing the CE line low.
Write enable
Aeroflex Circuit Technology
4
SCD1662 REV B 9/5/01 Plainview NY (516) 694-6700
The usual procedure is to increment the least
significant address lines from A0 through A6
at each write cycle. In this manner a page of
up to 128 bytes can be loaded in to the
EEPROM in a burst mode before beginning
the relatively long interval programming
cycle.
After the
t
BLC
time out is completed, the
EEPROM begins an internal write cycle.
During this cycle the entire page will be
written at the same time. The internal
programming cycle is the same regardless of
the number of bytes accessed.
byte write sequence of specific data to
specific locations. Power transitions will not
reset the software write protection.
Each 128K byte block of the EEPROM has
independent write protection. One or more
blocks may be enabled and the rest disabled
in any combination. The software write
protection guards against inadvertent writes
during power transitions, or unauthorized
modification using a PROM programmer.
HARDWARE DATA PROTECTION
These features protect against inadvertent
writes to the ACT-E128K32. These are
included to improve reliability during normal
operation:
A) Vcc Sense
While below 3.8V typical write cycles
are inhibited.
B) Write inhibiting
Holding OE low and either CE or WE
high inhibits write cycles.
C) Noise filter
Pulses of <10ns (TYP) on WE or CE
will not initiate a write cycle.
SOFTWARE DATA PROTECTION
A software write protection feature may be
enabled or disabled by the user. When
shipped by Aeroflex Microelectronics, the
ACT-E128K32 has the feature disabled.
Write access to the device is unrestricted.
To enable software write protection, the user
writes three access code bytes to three
special internal locations.
Once write
protection has been enabled, each write to
the EEPROM must use the same three byte
write sequence to permit writing. The write
protection feature can be disabled by a six
A
Aeroflex Circuit Technology
5
SCD1662 REV B 9/5/01 Plainview NY (516) 694-6700
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