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BUZ347

SIPMOS Power Transistor (N channel Enhancement mode Avalanche-rated)

器件类别:分立半导体    晶体管   

厂商名称:SIEMENS

厂商官网:http://www.infineon.com/

下载文档
器件参数
参数名称
属性值
是否Rohs认证
不符合
包装说明
FLANGE MOUNT, R-PSFM-T3
Reach Compliance Code
unknow
ECCN代码
EAR99
雪崩能效等级(Eas)
41 mJ
配置
SINGLE
最小漏源击穿电压
50 V
最大漏极电流 (Abs) (ID)
40 A
最大漏极电流 (ID)
45 A
最大漏源导通电阻
0.03 Ω
FET 技术
METAL-OXIDE SEMICONDUCTOR
最大反馈电容 (Crss)
450 pF
JEDEC-95代码
TO-218AA
JESD-30 代码
R-PSFM-T3
JESD-609代码
e0
元件数量
1
端子数量
3
工作模式
ENHANCEMENT MODE
最高工作温度
150 °C
封装主体材料
PLASTIC/EPOXY
封装形状
RECTANGULAR
封装形式
FLANGE MOUNT
极性/信道类型
N-CHANNEL
功耗环境最大值
125 W
最大功率耗散 (Abs)
125 W
最大脉冲漏极电流 (IDM)
180 A
认证状态
Not Qualified
表面贴装
NO
端子面层
Tin/Lead (Sn/Pb)
端子形式
THROUGH-HOLE
端子位置
SINGLE
晶体管应用
SWITCHING
晶体管元件材料
SILICON
最大关闭时间(toff)
460 ns
最大开启时间(吨)
180 ns
Base Number Matches
1
文档预览
BUZ 347
Not for new design
SIPMOS
®
Power Transistor
• N channel
• Enhancement mode
• Avalanche-rated
Pin 1
G
Pin 2
D
Pin 3
S
Type
BUZ 347
V
DS
50 V
I
D
45 A
R
DS(on)
0.03
Package
TO-218 AA
Ordering Code
C67078-S3115-A2
Maximum Ratings
Parameter
Continuous drain current
Symbol
Values
45
Unit
A
I
D
I
Dpuls
180
T
C
= 28 °C
Pulsed drain current
T
C
= 25 °C
Avalanche current,limited by
T
jmax
Avalanche energy,periodic limited by
T
jmax
Avalanche energy, single pulse
I
AR
E
AR
E
AS
45
2.5
mJ
I
D
= 45 A,
V
DD
= 25 V,
R
GS
= 25
L, T
j
= 25 °C
Gate source voltage
Power dissipation
41
V
GS
P
tot
±
20
125
V
W
T
C
= 25 °C
Operating temperature
Storage temperature
Thermal resistance, chip case
Thermal resistance, chip to ambient
DIN humidity category, DIN 40 040
IEC climatic category, DIN IEC 68-1
Semiconductor Group
T
j
T
stg
R
thJC
R
thJA
-55 ... + 150
-55 ... + 150
1
75
E
55 / 150 / 56
°C
K/W
1
07/96
BUZ 347
Not for new design
Electrical Characteristics,
at
T
j
= 25°C, unless otherwise specified
Parameter
Symbol
min.
Static Characteristics
Drain- source breakdown voltage
Values
typ.
max.
Unit
V
(BR)DSS
50
-
3
0.1
10
10
0.025
-
4
V
V
GS
= 0 V,
I
D
= 0.25 mA,
T
j
= 25 °C
Gate threshold voltage
V
GS(th)
2.1
V
GS=
V
DS,
I
D
= 1 mA
Zero gate voltage drain current
I
DSS
-
-
1
100
µA
V
DS
= 50 V,
V
GS
= 0 V,
T
j
= 25 °C
V
DS
= 50 V,
V
GS
= 0 V,
T
j
= 125 °C
Gate-source leakage current
I
GSS
-
100
nA
-
0.03
V
GS
= 20 V,
V
DS
= 0 V
Drain-Source on-resistance
R
DS(on)
V
GS
= 10 V,
I
D
= 29 A
Semiconductor Group
2
07/96
BUZ 347
Not for new design
Electrical Characteristics,
at
T
j
= 25°C, unless otherwise specified
Parameter
Symbol
min.
Dynamic Characteristics
Transconductance
Values
typ.
max.
Unit
g
fs
7
22
1700
800
280
-
S
pF
-
2300
1200
420
ns
-
35
50
V
DS
2
*
I
D *
R
DS(on)max,
I
D
= 29 A
Input capacitance
C
iss
C
oss
-
V
GS
= 0 V,
V
DS
= 25 V,
f
= 1 MHz
Output capacitance
V
GS
= 0 V,
V
DS
= 25 V,
f
= 1 MHz
Reverse transfer capacitance
C
rss
-
V
GS
= 0 V,
V
DS
= 25 V,
f
= 1 MHz
Turn-on delay time
t
d(on)
V
DD
= 30 V,
V
GS
= 10 V,
I
D
= 3 A
R
GS
= 50
Rise time
t
r
-
85
130
V
DD
= 30 V,
V
GS
= 10 V,
I
D
= 3 A
R
GS
= 50
Turn-off delay time
t
d(off)
-
220
280
V
DD
= 30 V,
V
GS
= 10 V,
I
D
= 3 A
R
GS
= 50
Fall time
t
f
-
140
180
V
DD
= 30 V,
V
GS
= 10 V,
I
D
= 3 A
R
GS
= 50
Semiconductor Group
3
07/96
BUZ 347
Not for new design
Electrical Characteristics,
at
T
j
= 25°C, unless otherwise specified
Parameter
Symbol
min.
Reverse Diode
Inverse diode continuous forward current
I
S
T
C
= 25 °C
Inverse diode direct current,pulsed
A
-
-
-
-
1.8
80
0.14
45
180
V
-
2.2
ns
-
-
µC
-
-
Values
typ.
max.
Unit
I
SM
V
SD
t
rr
Q
rr
T
C
= 25 °C
Inverse diode forward voltage
V
GS
= 0 V,
I
F
= 90 A
Reverse recovery time
V
R
= 30 V,
I
F=
l
S,
di
F
/dt = 100 A/µs
Reverse recovery charge
V
R
= 30 V,
I
F=
l
S,
di
F
/dt = 100 A/µs
Semiconductor Group
4
07/96
BUZ 347
Not for new design
Power dissipation
P
tot
=
ƒ
(T
C
)
Drain current
I
D
=
ƒ
(T
C
)
parameter:
V
GS
10 V
50
A
130
W
110
P
tot
100
90
80
70
60
50
40
30
20
I
D
40
35
30
25
20
15
10
5
10
0
0
0
20
40
60
80
100
120
°C
160
0
20
40
60
80
100
120
°C
160
T
C
T
C
Safe operating area
I
D
=
ƒ
(V
DS
)
parameter:
D
= 0.01,
T
C
= 25°C
10
3
Transient thermal impedance
Z
th JC
=
ƒ
(t
p
)
parameter:
D = t
p
/
T
10
1
K/W
A
10
0
t
= 42.0µs
p
I
D
10
2
)
on
S(
R
D
/I
D
=
Z
thJC
10
-1
V
D
S
100 µs
1 ms
10
-2
D = 0.50
0.20
10
1
10 ms
10
-3
0.10
0.05
10
-4
DC
10
0
0
10
10
-5
-7
10
single pulse
0.02
0.01
10
1
V 10
2
10
-6
10
-5
10
-4
10
-3
10
-2
10
-1
s 10
0
V
DS
t
p
Semiconductor Group
5
07/96
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