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IDT71V65902S85PF

ZBT SRAM, 512KX18, 8.5ns, CMOS, PQFP100, 14 X 20 MM, 1.40 MM HEIGHT, PLASTIC, TQFP-100

器件类别:存储    存储   

厂商名称:IDT (Integrated Device Technology)

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器件参数
参数名称
属性值
是否Rohs认证
不符合
厂商名称
IDT (Integrated Device Technology)
零件包装代码
QFP
包装说明
14 X 20 MM, 1.40 MM HEIGHT, PLASTIC, TQFP-100
针数
100
Reach Compliance Code
not_compliant
ECCN代码
3A991.B.2.A
最长访问时间
8.5 ns
其他特性
FLOW-THROUGH ARCHITECTURE
最大时钟频率 (fCLK)
90 MHz
I/O 类型
COMMON
JESD-30 代码
R-PQFP-G100
JESD-609代码
e0
长度
20 mm
内存密度
9437184 bit
内存集成电路类型
ZBT SRAM
内存宽度
18
湿度敏感等级
3
功能数量
1
端子数量
100
字数
524288 words
字数代码
512000
工作模式
SYNCHRONOUS
最高工作温度
70 °C
最低工作温度
组织
512KX18
输出特性
3-STATE
封装主体材料
PLASTIC/EPOXY
封装代码
LQFP
封装等效代码
QFP100,.63X.87
封装形状
RECTANGULAR
封装形式
FLATPACK, LOW PROFILE
并行/串行
PARALLEL
峰值回流温度(摄氏度)
240
电源
2.5,3.3 V
认证状态
Not Qualified
座面最大高度
1.6 mm
最大待机电流
0.04 A
最小待机电流
3.14 V
最大压摆率
0.225 mA
最大供电电压 (Vsup)
3.465 V
最小供电电压 (Vsup)
3.135 V
标称供电电压 (Vsup)
3.3 V
表面贴装
YES
技术
CMOS
温度等级
COMMERCIAL
端子面层
Tin/Lead (Sn85Pb15)
端子形式
GULL WING
端子节距
0.65 mm
端子位置
QUAD
处于峰值回流温度下的最长时间
20
宽度
14 mm
文档预览
256K x 36, 512K x 18
3.3V Synchronous ZBT™ SRAMs
2.5V I/O, Burst Counter
Flow-Through Outputs
Features
u
256K x 36, 512K x 18 memory configurations
u
Supports high performance system speed - 100 MHz
u
ZBT
TM
Feature - No dead cycles between write and read
u
Internally synchronized output buffer enable eliminates the
u
u
u
u
u
u
u
u
need to control
OE
Single R/W (READ/WRITE) control pin
4-word burst capability (Interleaved or linear)
Individual byte write (BW
1
-BW
4
) control (May tie active)
Three chip enables for simple depth expansion
3.3V power supply (±5%)
2.5V (±5%) I/O Supply (V
DDQ
)
Power down controlled by ZZ input
Packaged in a JEDEC standard 100-pin plastic thin quad
flatpack (TQFP), 119 ball grid array (BGA) and 165 fine pitch
ball grid array (fBGA).
cycles
(7.5 ns Clock-to-Data Access)
Preliminary
IDT71V65702
IDT71V65902
The IDT71V65702/5902 are 3.3V high-speed 9,437,184-bit
(9 Megabit) synchronous SRAMs organized as 256K x 36 / 512K x
18. They are designed to eliminate dead bus cycles when turning the
bus around between reads and writes, or writes and reads. Thus they
have been given the name ZBT
TM
, or Zero Bus Turnaround.
Address and control signals are applied to the SRAM during one
clock cycle, and on the next clock cycle the associated data cycle
Description
occurs, be it read or write.
The IDT71V65702/5902 contain address, data-in and control signal
registers. The outputs are flow-through (no output data register). Output
enable is the only asynchronous signal and can be used to disable the
outputs at any given time.
A Clock Enable (CEN) pin allows operation of the IDT71V65702/5902
to be suspended as long as necessary. All synchronous inputs are ignored
when
CEN
is high and the internal device registers will hold their previous
values.
There are three chip enable pins (CE
1
, CE
2
,
CE
2
) that allow the
user to deselect the device when desired. If any one of these three is not
asserted when ADV/LD is low, no new memory operation can be initiated.
However, any pending data transfers (reads or writes) will be completed.
The data bus will tri-state one cycle after the chip is deselected or a write
is initiated.
The IDT71V65702/5902 have an on-chip burst counter. In the burst
mode, the IDT71V65702/5902 can provide four cycles of data for a single
address presented to the SRAM. The order of the burst sequence is
defined by the
LBO
input pin. The
LBO
pin selects between linear and
interleaved burst sequence. The ADV/LD signal is used to load a new
external address (ADV/LD = LOW) or increment the internal burst counter
(ADV/LD = HIGH).
The IDT71V65702/5902 SRAMs utilize IDT’s latest high-performance
CMOS process, and are packaged in a JEDEC Standard 14mm x 20mm
100-pin plastic thin quad flatpack (TQFP) as well as a 119 ball grid array
(BGA) and 165 fine pitch ball grid array (fBGA).
Input
Input
Input
Input
Input
Input
Input
Input
Input
Input
Input
Input
Output
Input
I/O
Supply
Supply
Synchronous
Synchronous
Asynchronous
Synchronous
Synchronous
Synchronous
N/A
Synchronous
Static
N/A
N/A
N/A
N/A
Asynchronous
Synchronous
Static
Static
5315 tbl 01
Pin Description Summary
A
0
-A
18
CE
1
, CE
2
,
CE
2
OE
R/W
CEN
BW
1
,
BW
2
,
BW
3
,
BW
4
CLK
ADV/LD
LBO
TMS
TDI
TCK
TDO
ZZ
I/O
0
-I/O
31
, I/O
P1
-I/O
P4
V
DD
, V
DDQ
V
SS
Address Inputs
Chip Enables
Output Enable
Read/Write Signal
Clock Enable
Individual Byte Write Selects
Clock
Advance Burst Address/Load New Address
Linear/Interleaved Burst Order
Test Mode Select
Test Data Input
Test Clock
Test Data Output
Sleep Mode
Data Input/Output
Core Power, I/O Power
Ground
ZBT and Zero Bus Turnaround are trademarks of Integrated Device Technology, Inc. and the architecture is supported by Micron Technology and Motorola, Inc.
NOVEMBER 2000
DSC-5315/04
1
©2000 Integrated Device Technology, Inc.
IDT71V65702, IDT71V65902, 256K x 36, 512K x 18, 3.3V Synchronous ZBT™ SRAMs with
3.3V or 2.5V I/O, Burst Counter, and Flow-Through Outputs
Preliminary
Commercial Temperature Range
Pin Definitions
(1)
Symbol
A
0
-A
18
ADV/LD
Pin Function
Address Inputs
Advance / Load
I/O
I
I
Active
N/A
N/A
Description
Synchro nous Address inputs. The address register is triggered by a co mbination of the rising edge of
CLK, ADV/LD low,
CEN
low, and true chip enables.
ADV/LD is a synchro nous input that is used to load the inte rnal registers with new address and control
when it is sample d low at the rising edge of clock with the chip selected. When ADV/LD is low with
the chip deselected, any burst in progress is terminated. When ADV/LD is sampled high then the
inte rnal burst counter is advanced for any burst that was in progress. The external addresses are
ignored when ADV/LD is sampled high.
R/W signal is a synchronous input that identifies whether the current load cycle initiated is a Read or
Write access to the memory array. The data bus activity for the curre nt cycle takes place one clock
cycle later.
Synchronous Clock Enable Input. When
CEN
is sampled high, all other synchronous inputs, including
clock are ignored and outputs re main unchanged. The effect of
CEN
sampled high on the device
outputs is as if the low to high clock transition did no t occur. For normal operation,
CEN
must be
sampled low at rising edge of clock.
Synchronous byte write enables. Each 9-bit byte has its own active low byte write enable. On load
write cycles (When R/W and ADV/LD are sampled low) the appropriate byte write signal (BW
1
-BW
4
)
must be valid. The byte write signal must also be valid on each cycle of a burst write. Byte Write
signals are ignored when R/W is sampled high. The appropriate byte(s) of data are written into the
device one cycle later.
BW
1
-BW
4
can all be tied low if always doing write to the entire 36-bit word.
Synchronous active low chip enable.
CE
1
and
CE
2
are used with CE
2
to enable the IDT71V65702/5902
(CE
1
or
CE
2
sampled high or CE
2
sampled low) and ADV/LD low at the rising edge of clock, initiates
a deselect cycle. The ZBT
TM
has a one cycle deselect, i.e., the data b us will tri-state one clock cycle
after deselect is initiated.
Synchrono us active high chip enable. CE
2
is used with
CE
1
and
CE
2
to enable the chip. CE
2
has
inverted po larity but otherwise identical to
CE
1
and
CE
2
.
This is the clock input to the IDT71V65702/5902. Except for
OE,
all timing references for the device are
made with respect to the rising edge of CLK.
Data input/output (I/O) pins. The data input path is registered, triggered by the rising edge of CLK. The
data output path is flow-through (no output register).
Burst order selection input. When
LBO
is high the Inte rleaved burst sequence is selected. When
LBO
is low the Linear burst sequence is selected.
LBO
is a static input, and it must not change during
device operation.
Asynchronous output enable.
OE
must be low to read data from the 71V65702/5902. When
OE
is HIGH
the I/O pins are in a high-impedance state.
OE
does not need to be actively controlled for read and
write cycles. In normal operation,
OE
can be tied low.
Gives input command for TAP controller; sampled on rising edge of TCK.
Serial input of registers placed between TDI and TDO. Sampled on rising edge of TCK.
Clock input of TAP controller. Each TAP event is clocked. Test inputs are captured on rising edge of
TCK, while test outputs are d riven from falling edge of TCK.
Serial output of registers placed between TDI and TDO. This output is active depend ing on the state of
the TAP controller.
Asynchro nous sleep mode input. ZZ HIGH will gate the CLK internally and power down the
IDT71V65702/5902 to its lowest power consumption level. Data retention is guaranteed in Sleep Mode.
3.3V core power supply.
2.5V I/O supply.
Ground.
5315 tbl 02
R/W
Read / Write
I
N/A
CEN
Clock Enable
I
LOW
BW
1
-BW
4
Individual Byte
Write Enables
I
LOW
CE
1
,
CE
2
Chip Enables
I
LOW
CE
2
CLK
I/O
0
-I/O
31
I/O
P1
-I/O
P4
LBO
Chip Enable
Clock
Data Input/Output
Linear Burst
Order
Output Enable
I
I
I/O
I
HIGH
N/A
N/A
LOW
OE
I
LOW
TMS
TDI
TCK
TDO
ZZ
V
DD
V
DDQ
V
SS
NOTE:
Test Mode Select
Test Data Input
Test Clock
Test Data Output
Sleep Mode
Power Supply
Power Supply
Ground
I
I
I
O
I
N/A
N/A
N/A
N/A
N/A
N/A
N/A
HIGH
N/A
N/A
N/A
1. All synchronous inputs must meet specified setup and hold times with respect to CLK.
6.42
2
IDT71V65702, IDT71V65902, 256K x 36, 512K x 18, 3.3V Synchronous ZBT™ SRAMs with
3.3V or 2.5V I/O, Burst Counter, and Flow-Through Outputs
Preliminary
Commercial Temperature Range
Functional Block Diagram — 256K x 36
B8E
Address A [0:17]
D
Q
256K x 36 BIT
MEMORY ARRAY
Address
9;
1
, CE
2
9;
2
R/
M
Input Register
9;D
ADV/
B:
8M
x
D
Q
Control
DI
DO
D
Clk
Q
Control Logic
Mux
Clock
Sel
E;
Gate
Data I/O [0:31], I/O P[1:4]
5315 drw 01
,
6.42
3
IDT71V65702, IDT71V65902, 256K x 36, 512K x 18, 3.3V Synchronous ZBT™ SRAMs with
3.3V or 2.5V I/O, Burst Counter, and Flow-Through Outputs
Preliminary
Commercial Temperature Range
Functional Block Diagram — 512K x 18
B8E
Address A [0:18]
D
Q
512K x 18 BIT
MEMORY ARRAY
Address
9;
1
, CE
2
9;
2
R/
M
Input Register
9;D
ADV/
B:
8M
x
D
Q
Control
DI
DO
D
Clk
Q
Control Logic
Mux
Clock
Sel
E;
Gate
Data I/O [0:15], I/O P[1:2]
5315 drw 01a
,
Recommended DC Operating
Conditions
Symbol
V
DD
V
DDQ
V
SS
V
IH
V
IH
V
IL
Parameter
Core Supply Voltage
I/O Supply Voltage
Ground
Input High Voltage - Inputs
Input High Voltage - I/O
Input Low Voltage
Min.
3.135
2.375
0
1.7
1.7
-0.3
(1)
Typ.
3.3
2.5
0
____
____
____
Max.
3.465
2.625
0
V
DD
+ 0.3
V
DDQ
+ 0.3
0.7
Unit
V
V
V
V
V
V
5315 tbl 03
NOTE:
1. V
IL
(min.) = –1.0V for pulse width less than t
CYC
/2, once per cycle.
6.42
4
IDT71V65702, IDT71V65902, 256K x 36, 512K x 18, 3.3V Synchronous ZBT™ SRAMs with
3.3V or 2.5V I/O, Burst Counter, and Flow-Through Outputs
Preliminary
Commercial Temperature Range
Recommended Operating
Temperature and Supply Voltage
Grade
Commercial
Temperature
(1)
0°C to +70°C
V
SS
0V
V
DD
3.3V±5%
V
DDQ
2.5V±5%
5315 tbl 05
NOTES:
1. T
A
is the “instant on” case temperature.
100 99 98 97 96 95 94 93 92 91 90 89 88 87 86 85 84 83 82 81
I/O
P3
I/O
16
I/O
17
V
DDQ
V
SS
I/O
18
I/O
19
I/O
20
I/O
21
V
SS
V
DDQ
I/O
22
I/O
23
V
SS
(1)
V
DD
V
DD
(2)
V
SS
I/O
24
I/O
25
V
DDQ
V
SS
I/O
26
I/O
27
I/O
28
I/O
29
V
SS
V
DDQ
I/O
30
I/O
31
I/O
P4
CE
2
BW
4
BW
3
BW
2
BW
1
CE
2
V
DD
V
SS
CLK
R/W
CEN
OE
ADV/LD
NC
(3)
A
17
A
8
A
9
Pin Configuration — 256K x 36
A
6
A
7
CE
1
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
26
27
28
29
30
31 32 33 34 35 36 37 38 39 40 41 42 43 44 45 46 47 48 49 50
80
79
78
77
76
75
74
73
72
71
70
69
68
67
66
65
64
63
62
61
60
59
58
57
56
55
54
53
52
51
I/O
P2
I/O
15
I/O
14
V
DDQ
V
SS
I/O
13
I/O
12
I/O
11
I/O
10
V
SS
V
DDQ
I/O
9
I/O
8
V
SS
V
SS
(1)
V
DD
ZZ
I/O
7
I/O
6
V
DDQ
V
SS
I/O
5
I/O
4
I/O
3
I/O
2
V
SS
V
DDQ
I/O
1
I/O
0
I/O
P1
5315 drw 02
,
LBO
A
5
A
4
A
3
A
2
A
1
A
0
DNU
(4)
DNU
(4)
V
SS
V
DD
Top View
100 TQFP
NOTES:
1. Pins 14 and 66 do not have to be connected directly to V
SS
as long as the input voltage is
V
IL
.
2. Pin 16 does not have to be connected directly to V
DD
as long as the input voltage is > V
IH
.
3. Pins 84 is reserved for a future 16M.
4. DNU = Do not use. Pins 38, 39, 42 and 43 are reserved for respective JTAG pins: TMS, TDI, TDO and TCK.
the current version these pins can be left unconnected, tied LOW (V
SS
), or tied HIGH (V
DD
).
DNU
(4)
DNU
(4)
A
10
A
11
A
12
A
13
A
14
A
15
A
16
Within
6.42
5
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