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K8S1215ETC-FE1DT

EEPROM Card, 32MX16, 95ns, Parallel, CMOS, PBGA64,

器件类别:存储    存储   

厂商名称:SAMSUNG(三星)

厂商官网:http://www.samsung.com/Products/Semiconductor/

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器件参数
参数名称
属性值
是否无铅
含铅
是否Rohs认证
不符合
Objectid
1124627769
包装说明
FBGA, BGA64,10X14,20
Reach Compliance Code
compliant
ECCN代码
EAR99
最长访问时间
95 ns
启动块
TOP
命令用户界面
YES
通用闪存接口
YES
数据轮询
YES
JESD-30 代码
R-PBGA-B64
内存密度
536870912 bit
内存集成电路类型
EEPROM CARD
内存宽度
16
湿度敏感等级
1
部门数/规模
4,511
端子数量
64
字数
33554432 words
字数代码
32000000
最高工作温度
85 °C
最低工作温度
-25 °C
组织
32MX16
封装主体材料
PLASTIC/EPOXY
封装代码
FBGA
封装等效代码
BGA64,10X14,20
封装形状
RECTANGULAR
封装形式
GRID ARRAY, FINE PITCH
并行/串行
PARALLEL
电源
1.8 V
编程电压
2.7 V
认证状态
Not Qualified
就绪/忙碌
YES
部门规模
16K,64K
最大待机电流
0.00003 A
最大压摆率
0.07 mA
标称供电电压 (Vsup)
1.8 V
表面贴装
YES
技术
CMOS
温度等级
OTHER
端子形式
BALL
端子节距
0.5 mm
端子位置
BOTTOM
切换位
YES
类型
NOR TYPE
文档预览
Rev. 1.1, Sep. 2010
K8S1215ETC
K8S1215EBC
K8S1215EZC
512Mb C-die NOR FLASH
9x11, 64FBGA, 32M x16, Muxed Burst, Multi Bank SLC
1.7V ~ 1.95V
datasheet
SAMSUNG ELECTRONICS RESERVES THE RIGHT TO CHANGE PRODUCTS, INFORMATION AND
SPECIFICATIONS WITHOUT NOTICE.
Products and specifications discussed herein are for reference purposes only. All information discussed
herein is provided on an "AS IS" basis, without warranties of any kind.
This document and all information discussed herein remain the sole and exclusive property of Samsung
Electronics. No license of any patent, copyright, mask work, trademark or any other intellectual property
right is granted by one party to the other party under this document, by implication, estoppel or other-
wise.
Samsung products are not intended for use in life support, critical care, medical, safety equipment, or
similar applications where product failure could result in loss of life or personal or physical harm, or any
military or defense application, or any governmental procurement to which special terms or provisions
may apply.
For updates or additional information about Samsung products, contact your nearest Samsung office.
All brand names, trademarks and registered trademarks belong to their respective owners.
2010 Samsung Electronics Co., Ltd. All rights reserved.
-1-
K8S1215E(T/B/Z)C
datasheet
History
Rev. 1.1
NOR FLASH MEMORY
Revision History
Revision No.
0.0
1.0
1.1
Draft Date
Mar. 31, 2010
May. 03, 2010
Sep. 06, 2010
Remark
Target
Final
Final
Editor
-
-
-
- First version for target specification.
- Specification is finalized.
- Added "CLK "HIGH" should be prohibited in asynchronous read
mode start (From CE LOW)" in Asynchronous read operation.
-2-
K8S1215E(T/B/Z)C
512Mb C-die NOR FLASH 1
datasheet
Rev. 1.1
NOR FLASH MEMORY
1.0 FEATURES................................................................................................................................................................. 5
2.0 GENERAL DESCRIPTION ......................................................................................................................................... 5
3.0 PIN DESCRIPTION .................................................................................................................................................... 5
4.0 64Ball FBGA TOP VIEW (BALL DOWN) .................................................................................................................... 6
5.0 FUNCTIONAL BLOCK DIAGRAM .............................................................................................................................. 7
6.0 ORDERING INFORMATION ...................................................................................................................................... 8
7.0 PRODUCT INTRODUCTION...................................................................................................................................... 11
8.0 COMMAND DEFINITIONS ......................................................................................................................................... 12
9.0 DEVICE OPERATION ................................................................................................................................................ 14
9.1 Read Mode .............................................................................................................................................................. 14
9.1.1 Asynchronous Read Mode................................................................................................................................ 14
9.1.2 Synchronous (Burst) Read Mode...................................................................................................................... 14
9.1.2.1 Continuous Linear Burst Read.................................................................................................................... 14
9.2 Programmable Wait State ....................................................................................................................................... 15
9.3 Handshaking............................................................................................................................................................ 15
9.4 Set Burst Mode Configuration Register ................................................................................................................... 15
9.4.1 Programmable Wait State Configuration........................................................................................................... 15
9.4.2 Burst Read Mode Setting .................................................................................................................................. 15
9.4.3 RDY Configuration ............................................................................................................................................ 16
9.5 Output Driver Setting ............................................................................................................................................... 17
9.6 Autoselect Mode...................................................................................................................................................... 17
9.7 Standby Mode ......................................................................................................................................................... 17
9.8 Automatic Sleep Mode ............................................................................................................................................ 17
9.9 Output Disable Mode ............................................................................................................................................... 17
9.10 Block Protection & Unprotection ............................................................................................................................ 18
9.11 Hardware Reset..................................................................................................................................................... 18
9.12 Software Reset ...................................................................................................................................................... 18
9.13 Program ................................................................................................................................................................. 18
9.14 Accelerated Program ............................................................................................................................................. 18
9.15 Write Buffer Programming ..................................................................................................................................... 19
9.16 Accelerated Write Buffer Programming ................................................................................................................. 19
9.17 Chip Erase ............................................................................................................................................................. 19
9.18 Block Erase ........................................................................................................................................................... 20
9.19 Blank check ........................................................................................................................................................... 20
9.20 Unlock Bypass....................................................................................................................................................... 20
9.21 Erase Suspend / Resume...................................................................................................................................... 20
9.22 Program Suspend / Resume ................................................................................................................................. 21
9.23 Read While Write Operation .................................................................................................................................. 21
9.24 OTP Block Region ................................................................................................................................................. 21
9.25 Low VCC Write Inhibit ........................................................................................................................................... 21
9.26 Write Pulse “Glitch” Protection .............................................................................................................................. 21
9.27 Logical Inhibit......................................................................................................................................................... 21
10.0 FLASH MEMORY STATUS FLAGS ......................................................................................................................... 22
11.0 Deep Power Down .................................................................................................................................................... 24
12.0 Common Flash Memory Interface............................................................................................................................. 25
13.0 ABSOLUTE MAXIMUM RATINGS ........................................................................................................................... 27
14.0 RECOMMENDED OPERATING CONDITIONS ....................................................................................................... 28
15.0 DC CHARACTERISTICS .......................................................................................................................................... 28
16.0 VCC POWER-UP...................................................................................................................................................... 29
17.0 CAPACITANCE(TA = 25 °C, VCC = 1.8V, f = 1.0MHz)............................................................................................ 29
18.0 AC TEST CONDITION.............................................................................................................................................. 30
19.0 AC CHARACTERISTICS .......................................................................................................................................... 30
19.1 Synchronous/Burst Read....................................................................................................................................... 30
19.2 Asynchronous Read .............................................................................................................................................. 34
-3-
K8S1215E(T/B/Z)C
datasheet
Rev. 1.1
NOR FLASH MEMORY
19.3 Hardware Reset(RESET) ...................................................................................................................................... 36
19.4 Erase/Program Operation...................................................................................................................................... 37
19.5 Erase/Program Performance ................................................................................................................................. 38
20.0 Crossing of First Word Boundary in Burst Read Mode ............................................................................................. 45
-4-
K8S1215E(T/B/Z)C
datasheet
Rev. 1.1
NOR FLASH MEMORY
512M Bit (32M x16) Muxed Burst / Multi Bank SLC NOR Flash Memory
1.0 FEATURES
Single Voltage, 1.7V to 1.95V for Read and Write operations
Organization
- 33,554,432 x 16 bit (Word Mode Only)
Multiplexed Data and Address for reduction of interconnections
- A/DQ0 ~ A/DQ15
Read While Program/Erase Operation
Multiple Bank Architecture
- 16 Banks (32Mb Partition)
OTP Block : Extra 512-Word block
Read Access Time (@ C
L
=30pF)
- Asynchronous Random Access Time : 100ns
- Synchronous Random Access Time : 95ns
- Burst Access Time :
11ns (66MHz) / 9ns (83MHz) / 7ns (108MHz) /6ns (133MHz)
Burst Length :
- Continuous Linear Burst
- Linear Burst : 8-word & 16-word with Wrap
Block Architecture
- Uniform block part (K8S(10/11/12/13)15EZC) :
Five hundred twelve 64Kword blocks
- Boot block part (K8S(10/11/12/13)15ET(B)C) :
Four 16Kword blocks and five hundred eleven 64Kword blocks (Bank 0
contains four 16 Kword blocks and thirty-one 64Kword blocks, Bank 1 ~
Bank 15 contain four hundred eighty 64Kword blocks)
Reduce program time using the V
PP
Support 512-word Buffer Program
Power Consumption (Typical value, C
L
=30pF)
- Synchronous Read Current : 35mA at 133MHz
- Program/Erase Current : 25mA
- Read While Program/Erase Current : 45mA
- Standby Mode/Auto Sleep Mode : 30uA
Block Protection/Unprotection
- Using the software command sequence
- Last two boot blocks are protected by WP=V
IL
(Boot block part : K8S(10/11/12/13)15ET(B)C)
- Last one block (BA511) is protected by WP=V
IL
(Uniform block part : K8S(10/11/12/13)15EZC)
- All blocks are protected by V
PP
=V
IL
Handshaking Feature
- Provides host system with minimum latency by monitoring RDY
Erase Suspend/Resume
Program Suspend/Resume
Unlock Bypass Program/Erase
Blank Check Feature
Hardware Reset (RESET)
Deep Power Down Mode
Data Polling and Toggle Bits
- Provides a software method of detecting the status of program
or erase completion
Endurance
- 100K Program/Erase cycles
Extended Temperature : -25°C ~ 85°C
Support Common Flash Memory Interface
Low Vcc Write Inhibit
Output Driver Control by Configuration Register
Package : 64Ball FBGA type (9mm x 11mm), 0.5mm ball pitch
1.0mm(Max.)Thickness
2.0 GENERAL DESCRIPTION
The K8S(10/11/12/13)15E featuring single 1.8V power supply is a 512Mbit
Muxed Burst Multi Bank Flash Memory organized as 32Mx16. The memory
architecture of the device is designed to divide its memory arrays into
512blocks(Uniform block part)/515 blocks (Boot block part) with indepen-
dent hardware protection. This block architecture provides highly flexible
erase and program capability. The K8S(10/11/12/13)15E NOR Flash con-
sists of sixteen banks. This device is capable of reading data from one bank
while programming or erasing in the other bank. Regarding read access
time, the K8S10/1215E provides an 11ns burst access time and an 95ns
initial access time at 66MHz. At 83MHz, the K8S10/1215E provides an 9ns
burst access time and an 95ns initial access time. At 108MHz, the K8S11/
1315E provides an 7ns burst access time and an 95ns initial access time.
At 133MHz, the K8S11/1315E provides an 6ns burst access time and an
95ns initial access time. The device performs a program operation in units
of 16 bits (Word) and erases in units of a block. Single or multiple blocks
can be erased. The block erase operation is completed within typically
0.6sec. The device requires 25mA as program/erase current in the
extended temperature ranges.
The K8S(10/11/12/13)15E NOR Flash Memory is created by using Sam-
sung's advanced CMOS process technology.
3.0 PIN DESCRIPTION
Pin Name
A16 - A24
A/DQ0 - A/DQ15
CE
OE
RESET
V
PP
WE
WP
CLK
RDY
AVD
DPD
Vcc
V
SS
Address Inputs
Multiplexed Address/Data input/output
Chip Enable
Output Enable
Hardware Reset
Accelerates Programming
Write Enable
Hardware Write Protection Input
Clock
Ready Output
Address Valid Input
Deep Power Down
Power Supply
Ground
Pin Function
-5-
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