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MX25L3206EPI-12G

Flash, 16MX2, PDIP8, 0.300 INCH, HALOGEN FREE AND ROHS COMPLIANT, PLASTIC, MS-001, DIP-8

器件类别:存储    存储   

厂商名称:Macronix

厂商官网:http://www.macronix.com/en-us/Pages/default.aspx

器件标准:  

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器件参数
参数名称
属性值
是否无铅
不含铅
是否Rohs认证
符合
厂商名称
Macronix
零件包装代码
DIP
包装说明
DIP, DIP8,.3
针数
8
Reach Compliance Code
unknow
ECCN代码
EAR99
备用内存宽度
1
最大时钟频率 (fCLK)
86 MHz
数据保留时间-最小值
20
耐久性
100000 Write/Erase Cycles
JESD-30 代码
R-PDIP-T8
长度
9.27 mm
内存密度
33554432 bi
内存集成电路类型
FLASH
内存宽度
2
功能数量
1
端子数量
8
字数
16777216 words
字数代码
16000000
工作模式
SYNCHRONOUS
最高工作温度
85 °C
最低工作温度
-40 °C
组织
16MX2
封装主体材料
PLASTIC/EPOXY
封装代码
DIP
封装等效代码
DIP8,.3
封装形状
RECTANGULAR
封装形式
IN-LINE
并行/串行
SERIAL
峰值回流温度(摄氏度)
260
电源
3/3.3 V
编程电压
3.3 V
认证状态
Not Qualified
座面最大高度
5.33 mm
串行总线类型
SPI
最大待机电流
0.00002 A
最大压摆率
0.025 mA
最大供电电压 (Vsup)
3.6 V
最小供电电压 (Vsup)
2.7 V
标称供电电压 (Vsup)
3.3 V
表面贴装
NO
技术
CMOS
温度等级
INDUSTRIAL
端子形式
THROUGH-HOLE
端子节距
2.54 mm
端子位置
DUAL
处于峰值回流温度下的最长时间
40
类型
NOR TYPE
宽度
7.62 mm
写保护
HARDWARE/SOFTWARE
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MX25L3206E
MX25L3206E DATASHEET
P/N: PM1568
1
REV. 1.5, DEC. 04, 2013
MX25L3206E
Contents
FEATURES .................................................................................................................................................................. 5
GENERAL DESCRIPTION ......................................................................................................................................... 6
PIN CONFIGURATIONS ............................................................................................................................................. 7
PIN DESCRIPTION ...................................................................................................................................................... 8
BLOCK DIAGRAM....................................................................................................................................................... 9
MEMORY ORGANIZATION ....................................................................................................................................... 10
Table 1. Memory Organization .......................................................................................................................... 10
DEVICE OPERATION ................................................................................................................................................ 11
Figure 1.
Serial Modes Supported ........................................................................................................11
DATA PROTECTION.................................................................................................................................................. 12
Table 2. Protected Area Sizes ............................................................................................................................ 13
Table 3. 512 bits Secured OTP Definition
......................................................................................................... 13
HOLD FEATURES ..................................................................................................................................................... 14
Figure 2. Hold Condition Operation
........................................................................................................ 14
COMMAND DESCRIPTION ....................................................................................................................................... 15
Table 4. COMMAND DEFINITION ..................................................................................................................... 15
(1) Write Enable (WREN) ................................................................................................................................... 16
(2) Write Disable (WRDI) .................................................................................................................................... 16
(3) Read Status Register (RDSR) ...................................................................................................................... 16
(4) Write Status Register (WRSR)...................................................................................................................... 17
Table 5. Protection Modes .................................................................................................................................. 18
(5) Read Data Bytes (READ) ............................................................................................................................. 19
(6) Read Data Bytes at Higher Speed (FAST_READ) ....................................................................................... 19
(7) Dual Output Mode (DREAD) ......................................................................................................................... 19
(8) Sector Erase (SE) ......................................................................................................................................... 19
(9) Block Erase (BE)........................................................................................................................................... 20
(10) Chip Erase (CE) .......................................................................................................................................... 20
(11) Page Program (PP) ..................................................................................................................................... 20
(12) Deep Power-down (DP) .............................................................................................................................. 21
(13) Release from Deep Power-down (RDP), Read Electronic Signature (RES) ............................................. 21
(14) Read Identification (RDID)
.......................................................................................................................... 22
(15) Read Electronic Manufacturer ID & Device ID (REMS) .............................................................................. 22
Table 6. ID DEFINITIONS ................................................................................................................................. 22
(16) Enter Secured OTP (ENSO) ....................................................................................................................... 22
(17) Exit Secured OTP (EXSO) .......................................................................................................................... 22
(18) Read Security Register (RDSCUR) ............................................................................................................ 23
Table 7. SECURITY REGISTER DEFINITION ................................................................................................... 23
(19) Write Security Register (WRSCUR) ............................................................................................................ 23
P/N: PM1568
2
REV. 1.5, DEC. 04, 2013
MX25L3206E
(20) Read SFDP Mode (RDSFDP)..................................................................................................................... 24
Read Serial Flash Discoverable Parameter (RDSFDP) Sequence .................................................................... 24
Table a. Signature and Parameter Identification Data Values
........................................................................... 25
Table b. Parameter Table (0): JEDEC Flash Parameter Tables ......................................................................... 26
Table c. Parameter Table (1): Macronix Flash Parameter Tables ....................................................................... 28
POWER-ON STATE ................................................................................................................................................... 30
ELECTRICAL SPECIFICATIONS .............................................................................................................................. 31
ABSOLUTE MAXIMUM RATINGS ..................................................................................................................... 31
Figure 3. Maximum Negative Overshoot Waveform .......................................................................................... 31
CAPACITANCE TA = 25°C, f = 1.0 MHz............................................................................................................. 31
Figure 4. Maximum Positive Overshoot Waveform ............................................................................................ 31
Figure 5. INPUT TEST WAVEFORMS AND MEASUREMENT LEVEL
.............................................................. 32
Figure 6. OUTPUT LOADING ........................................................................................................................... 32
Table 8. DC CHARACTERISTICS...................................................................................................................... 33
Table 9. AC CHARACTERISTICS ...................................................................................................................... 34
Timing Analysis ........................................................................................................................................................ 35
Figure 7. Serial Input Timing .............................................................................................................................. 35
Figure 8. Output Timing ...................................................................................................................................... 35
Figure 9. Hold Timing ......................................................................................................................................... 36
Figure 10. WP# Disable Setup and Hold Timing during WRSR when SRWD=1 ............................................... 36
Figure 11. Write Enable (WREN) Sequence (Command 06) ............................................................................. 37
Figure 12. Write Disable (WRDI) Sequence (Command 04).............................................................................. 37
Figure 13. Read Status Register (RDSR) Sequence (Command 05) ................................................................ 38
Figure 14. Write Status Register (WRSR) Sequence (Command 01)............................................................... 38
Figure 15. Read Data Bytes (READ) Sequence (Command 03) ...................................................................... 38
Figure 16. Read at Higher Speed (FAST_READ) Sequence (Command 0B)................................................... 39
Figure 17. Dual Output Read Mode Sequence (Command 3B) ......................................................................... 40
Figure 18. Sector Erase (SE) Sequence (Command 20) .................................................................................. 40
Figure 19. Block Erase (BE) Sequence (Command 52 or D8) .......................................................................... 40
Figure 20. Chip Erase (CE) Sequence (Command 60 or C7) ........................................................................... 41
Figure 21. Page Program (PP) Sequence (Command 02)................................................................................ 41
Figure 22. Deep Power-down (DP) Sequence (Command B9)......................................................................... 42
Figure 23. Release from Deep Power-down (RDP) Sequence (Command AB) ............................................... 42
Figure 24. Read Electronic Signature (RES) Sequence (Command AB) .......................................................... 42
Figure 25. Read Identification (RDID) Sequence (Command 9F)
...................................................................... 43
Figure 26. Read Electronic Manufacturer & Device ID (REMS) Sequence (Command 90).............................. 43
Figure 27. Read Security Register (RDSCUR) Sequence (Command 2B) ........................................................ 44
Figure 28. Write Security Register (WRSCUR) Sequence (Command 2F) ....................................................... 44
Figure 29. Program/Erase flow with read array data
.......................................................................................... 45
P/N: PM1568
3
REV. 1.5, DEC. 04, 2013
MX25L3206E
Figure 30. Power-up Timing ............................................................................................................................... 46
Table 10. Power-Up Timing ............................................................................................................................... 46
OPERATING CONDITIONS ....................................................................................................................................... 47
Figure 31. AC Timing at Device Power-Up ......................................................................................................... 47
Figure 32. Power-Down Sequence .................................................................................................................... 48
ERASE AND PROGRAMMING PERFORMANCE .................................................................................................... 49
DATA RETENTION .................................................................................................................................................... 49
LATCH-UP CHARACTERISTICS .............................................................................................................................. 49
ORDERING INFORMATION ...................................................................................................................................... 50
PART NAME DESCRIPTION ..................................................................................................................................... 51
PACKAGE INFORMATION ........................................................................................................................................ 52
REVISION HISTORY ................................................................................................................................................. 58
P/N: PM1568
4
REV. 1.5, DEC. 04, 2013
MX25L3206E
32M-BIT [x 1 / x 2] CMOS SERIAL FLASH
FEATURES
GENERAL
• Single Power Supply Operation
- 2.7 to 3.6 volt for read, erase, and program operations
• Serial Peripheral Interface compatible -- Mode 0 and Mode 3
33,554,432 x 1 bit structure or 16,777,216 x 2 bits (Dual Output mode) structure
• 1024 Equal Sectors with 4K byte each
- Any Sector can be erased individually
• 64 Equal Blocks with 64K byte each
- Any Block can be erased individually
• Program Capability
- Byte base
- Page base (256 bytes)
• Latch-up protected to 100mA from -1V to Vcc +1V
PERFORMANCE
• High Performance
- Fast access time: 86MHz serial clock
- Serial clock of Dual Output mode : 80MHz
- Fast program time: 0.6ms(typ.) and 3ms(max.)/page
- Byte program time: 9us (typical)
- Fast erase time: 40ms(typ.) /sector ; 0.4s(typ.) /block
• Low Power Consumption
- Low active read current: 25mA(max.) at 86MHz
- Low active programming current: 15mA (typ.)
- Low active sector erase current: 9mA (typ.)
- Standby current: 15uA (max.)
- Deep power-down mode 2uA (typical)
• Typical 100,000 erase/program cycles
• 20 years of data retention
SOFTWARE FEATURES
• Input Data Format
- 1-byte Command code
• Advanced Security Features
- Block lock protection
The BP3~BP0 status bit defines the size of the area to be software protection against program and erase instruc-
tions
- Additional 512 bits secured OTP for unique identifier
• Auto Erase and Auto Program Algorithm
-
Automatically erases and verifies data at selected sector
-
Automatically programs and verifies data at selected page by an internal algorithm that automatically times the
program pulse widths (Any page to be programed should have page in the erased state first)
P/N: PM1568
5
REV. 1.5, DEC. 04, 2013
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参数对比
与MX25L3206EPI-12G相近的元器件有:MX25L3206EZUI-12G、MX25L3206EM2I-12G、MX25L3206EZNI-12G、MX25L3206EXCI-12G、MX25L3206EMI-12G。描述及对比如下:
型号 MX25L3206EPI-12G MX25L3206EZUI-12G MX25L3206EM2I-12G MX25L3206EZNI-12G MX25L3206EXCI-12G MX25L3206EMI-12G
描述 Flash, 16MX2, PDIP8, 0.300 INCH, HALOGEN FREE AND ROHS COMPLIANT, PLASTIC, MS-001, DIP-8 16M X 2 FLASH 3.3V PROM, PDSO8 IC FLASH 32M SPI 86MHZ 8SOP IC FLASH 32M SPI 86MHZ 8WSON IC FLASH 32M SPI 86MHZ 24CSPBGA IC FLASH 32M SPI 86MHZ 16SOP
是否Rohs认证 符合 符合 符合 符合 符合 符合
厂商名称 Macronix Macronix Macronix Macronix Macronix Macronix
包装说明 DIP, DIP8,.3 HVSON, SOLCC8,.15,32 SOP, SOP8,.31 6 X 5 MM, 0.80 MM HEIGHT, 1.27 PITCH, HALOGEN FREE AND ROHS COMPLIANT, MO-220, WSON-8 TBGA, BGA24,5X5,40 SOP, SOP16,.4
Reach Compliance Code unknow unknow compliant unknown unknown compliant
备用内存宽度 1 1 1 1 1 1
最大时钟频率 (fCLK) 86 MHz 86 MHz 86 MHz 86 MHz 86 MHz 86 MHz
数据保留时间-最小值 20 20 20 20 20 20
耐久性 100000 Write/Erase Cycles 100000 Write/Erase Cycles 100000 Write/Erase Cycles 100000 Write/Erase Cycles 100000 Write/Erase Cycles 100000 Write/Erase Cycles
JESD-30 代码 R-PDIP-T8 S-PDSO-N8 R-PDSO-G8 R-PDSO-N8 R-PBGA-B24 R-PDSO-G16
长度 9.27 mm 4 mm 5.28 mm 6 mm 8 mm 10.3 mm
内存密度 33554432 bi 33554432 bi 33554432 bit 33554432 bit 33554432 bit 33554432 bit
内存集成电路类型 FLASH FLASH FLASH FLASH FLASH FLASH
内存宽度 2 2 2 2 2 2
功能数量 1 1 1 1 1 1
端子数量 8 8 8 8 24 16
字数 16777216 words 16777216 words 16777216 words 16777216 words 16777216 words 16777216 words
字数代码 16000000 16000000 16000000 16000000 16000000 16000000
工作模式 SYNCHRONOUS SYNCHRONOUS SYNCHRONOUS SYNCHRONOUS SYNCHRONOUS SYNCHRONOUS
最高工作温度 85 °C 85 °C 85 °C 85 °C 85 °C 85 °C
最低工作温度 -40 °C -40 °C -40 °C -40 °C -40 °C -40 °C
组织 16MX2 16MX2 16MX2 16MX2 16MX2 16MX2
封装主体材料 PLASTIC/EPOXY PLASTIC/EPOXY PLASTIC/EPOXY PLASTIC/EPOXY PLASTIC/EPOXY PLASTIC/EPOXY
封装代码 DIP HVSON SOP HVSON TBGA SOP
封装等效代码 DIP8,.3 SOLCC8,.15,32 SOP8,.31 SOLCC8,.25 BGA24,5X5,40 SOP16,.4
封装形状 RECTANGULAR SQUARE RECTANGULAR RECTANGULAR RECTANGULAR RECTANGULAR
封装形式 IN-LINE SMALL OUTLINE, HEAT SINK/SLUG, VERY THIN PROFILE SMALL OUTLINE SMALL OUTLINE, HEAT SINK/SLUG, VERY THIN PROFILE GRID ARRAY, THIN PROFILE SMALL OUTLINE
并行/串行 SERIAL SERIAL SERIAL SERIAL SERIAL SERIAL
峰值回流温度(摄氏度) 260 260 260 260 NOT SPECIFIED 260
电源 3/3.3 V 3/3.3 V 3/3.3 V 3/3.3 V 3/3.3 V 3/3.3 V
编程电压 3.3 V 3.3 V 3.3 V 3.3 V 3.3 V 3.3 V
认证状态 Not Qualified Not Qualified Not Qualified Not Qualified Not Qualified Not Qualified
座面最大高度 5.33 mm 0.6 mm 2.16 mm 0.8 mm 1.2 mm 2.65 mm
串行总线类型 SPI SPI 3-WIRE SPI SPI SPI
最大待机电流 0.00002 A 0.00002 A 0.00004 A 0.00002 A 0.00002 A 0.00002 A
最大压摆率 0.025 mA 0.025 mA 0.025 mA 0.025 mA 0.025 mA 0.025 mA
最大供电电压 (Vsup) 3.6 V 3.6 V 3.6 V 3.6 V 3.6 V 3.6 V
最小供电电压 (Vsup) 2.7 V 2.7 V 2.7 V 2.7 V 2.7 V 2.7 V
标称供电电压 (Vsup) 3.3 V 3.3 V 3.3 V 3.3 V 3 V 3.3 V
表面贴装 NO YES YES YES YES YES
技术 CMOS CMOS CMOS CMOS CMOS CMOS
温度等级 INDUSTRIAL INDUSTRIAL INDUSTRIAL INDUSTRIAL INDUSTRIAL INDUSTRIAL
端子形式 THROUGH-HOLE NO LEAD GULL WING NO LEAD BALL GULL WING
端子节距 2.54 mm 0.8 mm 1.27 mm 1.27 mm 1 mm 1.27 mm
端子位置 DUAL DUAL DUAL DUAL BOTTOM DUAL
处于峰值回流温度下的最长时间 40 40 40 40 NOT SPECIFIED 40
类型 NOR TYPE NOR TYPE NOR TYPE NOR TYPE NOR TYPE NOR TYPE
宽度 7.62 mm 4 mm 5.23 mm 5 mm 6 mm 7.52 mm
写保护 HARDWARE/SOFTWARE HARDWARE/SOFTWARE HARDWARE/SOFTWARE HARDWARE/SOFTWARE HARDWARE/SOFTWARE HARDWARE/SOFTWARE
是否无铅 不含铅 不含铅 不含铅 不含铅 - 不含铅
零件包装代码 DIP SON SOIC QFN - SOIC
针数 8 8 8 8 - 16
ECCN代码 EAR99 EAR99 3A991.B.1.A 3A991.B.1.A - 3A991.B.1.A
Factory Lead Time - 16 weeks 16 weeks 16 weeks 16 weeks 16 weeks
JESD-609代码 - e3 e3 e3 - e3
湿度敏感等级 - 3 3 3 - 3
端子面层 - Matte Tin (Sn) - annealed Matte Tin (Sn) Matte Tin (Sn) - Tin (Sn)
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