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performance may vary over time. All operating parameters, including “Typicals” must be validated for each customer application by customer’s technical experts. APD SEMICONDUCTOR does not convey any license
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O 引 言 Z扫描是一种应用于光学非线性测量的方法，使用这种方法可以测量光学材料非线性折射率的大小、正负以及非线性吸收系数。因为通过光学材料的激光能量大小与光电接收器转换后获得的电压幅值成某种比例关系，因此通过测量光电接收器转换后的电压幅值就可以很方便地计算出光学材料的非线性折射率大小、正负以及非线性吸收系数。由于光脉冲的宽度较窄，其宽度约为几个ns，因此通常采用高频数字示波器测量其信号的幅...[详细]
微控制器 MCU
