首页 > 器件类别 > 分立半导体 > 晶体管

SSW1N50A

Power Field-Effect Transistor, 1.5A I(D), 500V, 5.5ohm, 1-Element, N-Channel, Silicon, Metal-oxide Semiconductor FET, D2PAK-3

器件类别:分立半导体    晶体管   

厂商名称:Fairchild

厂商官网:http://www.fairchildsemi.com/

下载文档
器件参数
参数名称
属性值
是否Rohs认证
不符合
厂商名称
Fairchild
包装说明
SMALL OUTLINE, R-PSSO-G2
针数
3
Reach Compliance Code
unknown
雪崩能效等级(Eas)
113 mJ
外壳连接
DRAIN
配置
SINGLE WITH BUILT-IN DIODE
最小漏源击穿电压
500 V
最大漏极电流 (Abs) (ID)
1.5 A
最大漏极电流 (ID)
1.5 A
最大漏源导通电阻
5.5 Ω
FET 技术
METAL-OXIDE SEMICONDUCTOR
JESD-30 代码
R-PSSO-G2
JESD-609代码
e0
元件数量
1
端子数量
2
工作模式
ENHANCEMENT MODE
最高工作温度
150 °C
封装主体材料
PLASTIC/EPOXY
封装形状
RECTANGULAR
封装形式
SMALL OUTLINE
峰值回流温度(摄氏度)
NOT SPECIFIED
极性/信道类型
N-CHANNEL
最大功率耗散 (Abs)
36 W
最大脉冲漏极电流 (IDM)
5 A
认证状态
Not Qualified
表面贴装
YES
端子面层
Tin/Lead (Sn/Pb)
端子形式
GULL WING
端子位置
SINGLE
处于峰值回流温度下的最长时间
NOT SPECIFIED
晶体管应用
SWITCHING
晶体管元件材料
SILICON
文档预览
Advanced Power MOSFET
FEATURES
Avalanche Rugged Technology
Rugged Gate Oxide Technology
Lower Input Capacitance
Improved Gate Charge
Extended Safe Operating Area
Lower Leakage Current : 10
µ
A (Max.) @ V
DS
= 500V
Lower R
DS(ON)
: 4.046
(Typ.)
SSW/I1N50A
BV
DSS
= 500 V
R
DS(on)
= 5.5
I
D
= 1.5 A
D
2
-PAK
2
I
2
-PAK
1
1
3
2
3
1. Gate 2. Drain 3. Source
Absolute Maximum Ratings
Symbol
V
DSS
I
D
I
DM
V
GS
E
AS
I
AR
E
AR
dv/dt
P
D
Characteristic
Drain-to-Source Voltage
Continuous Drain Current (T
C
=25
C
)
Continuous Drain Current (T
C
=100
C
)
Drain Current-Pulsed
Gate-to-Source Voltage
Single Pulsed Avalanche Energy
Avalanche Current
Repetitive Avalanche Energy
Peak Diode Recovery dv/dt
Total Power Dissipation (T
A
=25
C
) *
Ο
Ο
Ο
Value
500
1.5
0.97
1
O
2
O
1
O
1
O
3
O
Units
V
A
A
V
mJ
A
mJ
V/ns
W
W
W/
C
Ο
5
+
30
_
113
1.5
3.6
3.5
3.1
36
0.29
- 55 to +150
Total Power Dissipation (T
C
=25
C
)
Ο
Linear Derating Factor
T
J
, T
STG
T
L
Operating Junction and
Storage Temperature Range
Maximum Lead Temp. for Soldering
Purposes, 1/8” from case for 5-seconds
Ο
C
300
Thermal Resistance
Symbol
R
θ
JC
R
θ
JA
R
θ
JA
Characteristic
Junction-to-Case
Junction-to-Ambient *
Junction-to-Ambient
Typ.
--
--
--
Max.
3.44
40
62.5
Ο
Units
C
/W
*
When mounted on the minimum pad size recommended (PCB Mount).
Rev. B
©1999 Fairchild Semiconductor Corporation
IRFW/I640A
Ο
N-CHANNEL
POWER MOSFET
Electrical Characteristics
(T
C
=25
C
unless otherwise specified)
Symbol
BV
DSS
BV/
T
J
V
GS(th)
I
GSS
I
DSS
R
DS(on)
g
fs
C
iss
C
oss
C
rss
t
d(on)
t
r
t
d(off)
t
f
Q
g
Q
gs
Q
gd
Characteristic
Drain-Source Breakdown Voltage
Breakdown Voltage Temp. Coeff.
Gate Threshold Voltage
Gate-Source Leakage , Forward
Gate-Source Leakage , Reverse
Drain-to-Source Leakage Current
Static Drain-Source
On-State Resistance
Forward Transconductance
Input Capacitance
Output Capacitance
Reverse Transfer Capacitance
Turn-On Delay Time
Rise Time
Turn-Off Delay Time
Fall Time
Total Gate Charge
Gate-Source Charge
Gate-Drain(‘Miller”) Charge
Min. Typ. Max. Units
500
--
2.0
--
--
--
--
--
--
--
--
--
--
--
--
--
--
--
--
--
0.63
--
--
--
--
--
--
1.1
220
30
11
12
13
42
15
11
1.6
5.5
--
--
4.0
100
-100
10
100
5.5
--
290
35
13
35
35
90
40
16
--
--
nC
ns
pF
µ
A
V
V/
C
V
nA
Ο
Test Condition
V
GS
=0V,I
D
=250
µ
A
See Fig 7
V
DS
=5V,I
D
=250
µ
A
V
GS
=30V
V
GS
=-30V
V
DS
=500V
V
DS
=400V,T
C
=125
C
V
GS
=10V,I
D
=0.75A
V
DS
=50V,I
D
=0.75A
4
O
4
O
Ο
I
D
=250
µ
A
V
GS
=0V,V
DS
=25V,f =1MHz
See Fig 5
V
DD
=250V,I
D
=1.5A,
R
G
=24
See Fig 13
V
DS
=400V,V
GS
=10V,
I
D
=1.5A
See Fig 6 & Fig 12
4
5
OO
4
5
OO
Source-Drain Diode Ratings and Characteristics
Symbol
I
S
I
SM
V
SD
t
rr
Q
rr
Characteristic
Continuous Source Current
Pulsed-Source Current
Diode Forward Voltage
Reverse Recovery Time
Reverse Recovery Charge
1
O
4
O
Min. Typ. Max. Units
--
--
--
--
--
--
--
--
162
0.54
1.5
5
1.15
--
--
A
V
ns
µ
C
Test Condition
Integral reverse pn-diode
in the MOSFET
T
J
=25
C
I
S
=1.5A,V
GS
=0V
T
J
=25
C
,I
F
=1.5A
di
F
/dt=100A/
µ
s
4
O
Ο
Ο
Notes ;
1
O
Repetitive Rating : Pulse Width Limited by Maximum Junction Temperature
2
O
L=90mH, I
AS
=1.5A, V
DD
=50V, R
G
=27
, Starting T
J
=25
oo
C
3
<
_
_
O
I
SD
<
1.5A, di/dt
_
70A/
µ
s, V
DD
<
BV
DSS
, Starting T
J
=25 C
_
s,
4
Pulse Test : Pulse Width = 250
µ
Duty Cycle
<
2%
O
5
O
Essentially Independent of Operating Temperature
N-CHANNEL
POWER MOSFET
Fig 1. Output Characteristics
V
GS
15V
10 V
8.0 V
7.0 V
6.0 V
5.5 V
5.0 V
Bottom : 4.5 V
IRFW/I1N50A
Fig 2. Transfer Characteristics
[A]
I
D
, Drain Current
10
0
[A]
Top :
I
D
, Drain Current
10
0
150
o
C
10
-1
25
o
C
@ Notes :
1. V = 0 V
GS
- 55 C
o
10
-1
@ Notes :
1. 250
µ
s Pulse Test
2. T = 25
o
C
C
10
-2
10
-1
10
0
10
1
2. V = 50 V
DS
3. 250
µ
s Pulse Test
6
8
10
10
-2
2
4
V
DS
, Drain-Source Voltage [V]
[A]
V
GS
, Gate-Source Voltage [V]
Fig 3. On-Resistance vs. Drain Current
R
DS(on)
, [ ]
Drain-Source On-Resistance
15
Fig 4. Source-Drain Diode Forward Voltage
I
DR
, Reverse Drain Current
1
0
0
10
V
GS
= 10 V
5
V
GS
= 20 V
1
-1
0
@Nts:
oe
1 V
GS
= 0 V
.
2 2 0
µ
s P l e T s
. 5
us et
08
.
10
.
12
.
10 C
5
2
o
C
5
1
-2
0
02
.
04
.
06
.
o
@ N t : T
J
= 25
o
C
oe
0
0
1
2
3
4
5
I
D
, Drain Current [A]
V
SD
, Source-Drain Voltage [V]
Fig 5. Capacitance vs. Drain-Source Voltage
40
0
C
iss
= C
gs
+ C ( C
ds
= s o t d )
hre
gd
C
oss
= C
ds
+ C
gd
Fig 6. Gate Charge vs. Gate-Source Voltage
[V]
[pF]
30
0
C
iss
V
GS
, Gate-Source Voltage
C
rss
= C
gd
1
0
0
V =10V
DS
V
DS
= 2 0 V
5
V
DS
= 4 0 V
0
Capacitance
20
0
@Nts:
oe
1 V
GS
= 0 V
.
2 f=1Mz
.
H
5
C
oss
10
0
C
rss
@ N t s : I
D
= 1 5 A
oe
.
0
0
2
4
6
8
1
0
1
2
0
0
1
0
1
10
V
DS
, Drain-Source Voltage [V]
Q
G
, Total Gate Charge [nC]
IRFW/I1N50A
BV
DSS
, (Normalized)
Drain-Source Breakdown Voltage
N-CHANNEL
POWER MOSFET
Fig 8. On-Resistance vs. Temperature
R
DS(on)
, (Normalized)
Drain-Source On-Resistance
3.0
Fig 7. Breakdown Voltage vs. Temperature
1.2
2.5
1.1
2.0
1.0
1.5
1.0
@ Notes :
1. V = 10 V
GS
2. I = 0.75 A
D
0.9
@ Notes :
1. V = 0 V
GS
2. I = 250
µ
A
D
0.5
0.8
-75
-50
-25
0
25
50
75
100
o
125
150
175
0.0
-75
-50
-25
0
25
50
75
100
o
125
150
175
T
J
, Junction Temperature [ C]
T
J
, Junction Temperature [ C]
Fig 9. Max. Safe Operating Area
[A]
1
10
Fig 10. Max. Drain Current vs. Case Temperature
2.0
Operation in This Area
is Limited by R
DS(on)
100
µ
s
1 ms
I
D
, Drain Current
I
D
, Drain Current
3
10
[A]
1.5
10 ms
1.0
0.5
2
10
0
10
DC
10
-1
@ Notes :
1. T = 25
o
C
C
2. T = 150
o
C
J
3. Single Pulse
10
-2
0
10
1
10
0.0
25
50
75
100
125
150
V
DS
, Drain-Source Voltage [V]
T
c
, Case Temperature [
o
C]
Fig 11. Thermal Response
Thermal Response
D=0.5
10
0
0.2
0.1
0.05
10
- 1
0.02
0.01
@ Notes :
1. Z
θ
J C
(t)=3.44
o
C/W Max.
2. Duty Factor, D=t /t
2
1
3. T
J M
-T
C
=P
D M
*Z
θ
J C
(t)
Z
θ
JC
(t) ,
P
DM
single pulse
t
1
t
2
10
- 5
10
- 4
10
- 3
10
- 2
10
- 1
10
0
10
1
t
1
, Square Wave Pulse Duration
[sec]
N-CHANNEL
POWER MOSFET
IRFW/I640A
Fig 12. Gate Charge Test Circuit & Waveform
“ Current Regulator ”
50K
12V
200nF
300nF
Same Type
as DUT
V
GS
Q
g
10V
V
DS
V
GS
DUT
3mA
Q
gs
Q
gd
R
1
Current Sampling (I
G
)
Resistor
R
2
Current Sampling (I
D
)
Resistor
Charge
Fig 13. Resistive Switching Test Circuit & Waveforms
R
L
V
out
V
in
R
G
DUT
10V
V
in
10%
V
out
V
DD
( 0.5 rated V
DS
)
90%
t
d(on)
t
on
t
r
t
d(off)
t
off
t
f
Fig 14. Unclamped Inductive Switching Test Circuit & Waveforms
L
L
V
DS
Vary t
p
to obtain
required peak I
D
BV
DSS
1
2
--------------------
E
AS
= ---- L
L
I
AS
2
BV
DSS
-- V
DD
BV
DSS
I
AS
C
V
DD
V
DD
t
p
I
D
R
G
DUT
10V
t
p
I
D
(t)
V
DS
(t)
Time
查看更多>
热门器件
热门资源推荐
器件捷径:
A0 A1 A2 A3 A4 A5 A6 A7 A8 A9 AA AB AC AD AE AF AG AH AI AJ AK AL AM AN AO AP AQ AR AS AT AU AV AW AX AY AZ B0 B1 B2 B3 B4 B5 B6 B7 B8 B9 BA BB BC BD BE BF BG BH BI BJ BK BL BM BN BO BP BQ BR BS BT BU BV BW BX BY BZ C0 C1 C2 C3 C4 C5 C6 C7 C8 C9 CA CB CC CD CE CF CG CH CI CJ CK CL CM CN CO CP CQ CR CS CT CU CV CW CX CY CZ D0 D1 D2 D3 D4 D5 D6 D7 D8 D9 DA DB DC DD DE DF DG DH DI DJ DK DL DM DN DO DP DQ DR DS DT DU DV DW DX DZ
需要登录后才可以下载。
登录取消