Am49PDL127AH/
Am49PDL129AH
Data Sheet
July 2003
The following document specifies Spansion memory products that are now offered by both Advanced
Micro Devices and Fujitsu. Although the document is marked with the name of the company that orig-
inally developed the specification, these products will be offered to customers of both AMD and
Fujitsu.
Continuity of Specifications
There is no change to this datasheet as a result of offering the device as a Spansion product. Any
changes that have been made are the result of normal datasheet improvement and are noted in the
document revision summary, where supported. Future routine revisions will occur when appropriate,
and changes will be noted in a revision summary.
Continuity of Ordering Part Numbers
AMD and Fujitsu continue to support existing part numbers beginning with “Am” and “MBM”. To order
these products, please use only the Ordering Part Numbers listed in this document.
For More Information
Please contact your local AMD or Fujitsu sales office for additional information about Spansion
memory solutions.
Publication Number
30535
Revision
A
Amendment
+1
Issue Date
December 18, 2003
THIS PAGE LEFT INTENTIONALLY BLANK.
ADVANCE INFORMATION
Am49PDL127AH/Am49PDL129AH
Stacked Multi-Chip Package (MCP) Flash Memory and pSRAM
128 Megabit (8 M x 16-Bit) CMOS 3.0 Volt-only, Simultaneous Operation Flash Memory and
16 Mbit (1 M x 16-Bit) CMOS Pseudo Static RAM
DISTINCTIVE CHARACTERISTICS
MCP Features
■
Power supply voltage of 2.7 to 3.3 volt
■
High performance
— Access time as fast as 65 ns initial / 25 ns page
■
Minimum 1 million erase cycle guarantee per sector
PERFORMANCE CHARACTERISTICS
■
High Performance
— Page access times as fast as 25 ns
— Random access times as fast as 65 ns
■
Package
— 73-Ball FBGA
■
Operating Temperature
— –40°C to +85°C
■
Power consumption (typical values at 10 MHz)
— 45 mA active read current
— 25 mA program/erase current
— 1 µA typical standby mode current
Flash Memory Features
ARCHITECTURAL ADVANTAGES
■
128 Mbit Page Mode device
— Page size of 8 words: Fast page read access from random
locations within the page
SOFTWARE FEATURES
■
Software command-set compatible with JEDEC 42.4
standard
— Backward compatible with Am29F and Am29LV families
■
Dual Chip Enable inputs (PDL129 only)
— Two CE# inputs control selection of each half of the memory
space
■
CFI (Common Flash Interface) complaint
— Provides device-specific information to the system, allowing
host software to easily reconfigure for different Flash devices
■
Single power supply operation
— Full Voltage range: 2.7 to 3.3 volt read, erase, and program
operations for battery-powered applications
■
Erase Suspend / Erase Resume
— Suspends an erase operation to allow read or program
operations in other sectors of same bank
■
Simultaneous Read/Write Operation
— Data can be continuously read from one bank while
executing erase/program functions in another bank
— Zero latency switching from write to read operations
■
Unlock Bypass Program command
— Reduces overall programming time when issuing multiple
program command sequences
■
FlexBank Architecture
— 4 separate banks, with up to two simultaneous operations
per device
HARDWARE FEATURES
■
Ready/Busy# pin (RY/BY#)
— Provides a hardware method of detecting program or erase
cycle completion
PDL127:
—
—
—
—
—
—
—
—
Bank A: 16 Mbit (4 Kw x 8 and 32 Kw x 31)
Bank B: 48 Mbit (32 Kw x 96)
Bank C: 48 Mbit (32 Kw x 96)
Bank D: 16 Mbit (4 Kw x 8 and 32 Kw x 31)
Bank 1A: 48 Mbit (32 Kw x 96)
Bank 1B: 16 Mbit (4 Kw x 8 and 32 Kw x 31)
Bank 2A: 16 Mbit (4 Kw x 8 and 32 Kw x 31)
Bank 2B: 48 Mbit (32 Kw x 96)
■
Hardware reset pin (RESET#)
— Hardware method to reset the device to reading array data
■
WP#/ACC (Write Protect/Acceleration) input
— At V
IL
, hardware level protection for the first and last two 4K
word sectors.
— At V
IH
, allows removal of sector protection
— At V
HH
, provides accelerated programming in a factory
setting
PDL129:
■
SecSi
TM
(Secured Silicon) Sector region
— Up to 64 factory-locked words
— Up to 64 customer-lockable words
■
Persistent Sector Protection
— A command sector protection method to lock combinations
of individual sectors and sector groups to prevent program or
erase operations within that sector
— Sectors can be locked and unlocked in-system at V
CC
level
— Up to 128 words accessible through a command sequence
■
Both top and bottom boot blocks in one device
■
Manufactured on 0.13 µm process technology
■
20-year data retention at 125°C
■
Password Sector Protection
— A sophisticated sector protection method to lock
combinations of individual sectors and sector groups to
prevent program or erase operations within that sector using
a user-defined 64-bit password
This document contains information on a product under development at Advanced Micro Devices. The information
is intended to help you evaluate this product. AMD reserves the right to change or discontinue work on this proposed
product without notice.
Publication Number:
30535
Rev:
A
Amendment:
+1
Issue Date:
December 18, 2003
A D V A N C E
PSRAM FEATURES
■
Power dissipation
— Operating: 40 mA maximum
— Standby: 70 µA maximum
— Deep power-down standby: 5 µA
I N F O R M A T I O N
■
CE1s# and CE2ps Chip Select
■
Power down features using CE1s# and CE2ps
■
Data retention supply voltage: 2.7 to 3.3 volt
■
Byte data control: LB#s (DQ7–DQ0), UB#s (DQ15–DQ8)
■
8-word page mode access
2
Am49PDL127AH/Am49PDL129AH
December 18, 2003
A D V A N C E
I N F O R M A T I O N
GENERAL DESCRIPTION (PDL129)
The Am29PDL129H is a 128 Mbit, 3.0 volt-only Page Mode
and Simultaneous Read/Write Flash memory device orga-
nized as 8 Mwords. The word-wide data (x16) appears on
DQ15-DQ0. This device can be programmed in-system or in
standard EPROM programmers. A 12.0 V V
PP
is not re-
quired for write or erase operations.
The device offers fast page access time of 25 and 30 ns,
with corresponding random access times of 65 and 70 ns,
respectively, allowing high speed microprocessors to oper-
ate without wait states. To eliminate bus contention the de-
vice has separate chip enable (CE#f1, CE#f2), write enable
(WE#) and output enable (OE#) controls. Dual Chip Enables
allow access to two 64 Mbit partitions of the 128 Mbit mem-
ory space.
The device is entirely command set compatible with the
JEDEC 42.4 single-power-supply Flash standard.
Com-
mands are written to the command register using standard
microprocessor write timing. Register contents serve as in-
puts to an internal state-machine that controls the erase and
programming circuitry. Write cycles also internally latch ad-
dresses and data needed for the programming and erase
operations. Reading data out of the device is similar to read-
ing from other Flash or EPROM devices.
Device programming occurs by executing the program com-
mand sequence. The Unlock Bypass mode facilitates faster
programming times by requiring only two write cycles to pro-
gram data instead of four. Device erasure occurs by execut-
ing the erase command sequence.
The host system can detect whether a program or erase op-
eration is complete by reading the DQ7 (Data# Polling) and
DQ6 (toggle)
status bits.
After a program or erase cycle has
been completed, the device is ready to read array data or ac-
cept another command.
The sector erase architecture allows memory sectors to be
erased and reprogrammed without affecting the data con-
tents of other sectors. The device is fully erased when
shipped from the factory.
Hardware data protection
measures include a low V
CC
de-
tector that automatically inhibits write operations during
power transitions. The hardware sector protection feature
disables both program and erase operations in any combina-
tion of sectors of memory. This can be achieved in-system or
via programming equipment.
The Erase Suspend/Erase Resume
feature enables the
user to put erase on hold for any period of time to read data
from, or program data to, any sector that is not selected for
erasure. True background erase can thus be achieved. If a
read is needed from the SecSi Sector area (One Time Pro-
gram area) after an erase suspend, then the user must use
the proper command sequence to enter and exit this region.
The device offers two power-saving features. When ad-
dresses have been stable for a specified amount of time, the
device enters the
automatic sleep mode.
The system can
also place the device into the standby mode. Power con-
sumption is greatly reduced in both these modes.
AMD’s Flash technology combined years of Flash memory
manufacturing experience to produce the highest levels of
quality, reliability and cost effectiveness. The device electri-
cally erases all bits within a sector simultaneously via
Fowler-Nordheim tunneling. The data is programmed using
hot electron injection.
Simultaneous Read/Write Operation with
Zero Latency
The Simultaneous Read/Write architecture provides
simul-
taneous operation
by dividing the memory space into 4
banks, which can be considered to be four separate memory
arrays as far as certain operations are concerned. The de-
vice can improve overall system performance by allowing a
host system to program or erase in one bank, then immedi-
ately and simultaneously read from another bank with zero
latency (with two simultaneous operations operating at any
one time). This releases the system from waiting for the
completion of a program or erase operation, greatly improv-
ing system performance.
The device can be organized in both top and bottom sector
configurations. The banks are organized as follows:
Chip Enable Configuration
CE#f1 Control
Bank 1A
48 Mbit (32 Kw x 96)
Bank 1B
16 Mbit (4 Kw x 8 and 32 Kw x 31)
CE#f2 Control
Bank 2A
16 Mbit (4 Kw x 8 and 32 Kw x 31)
Bank 2B
48 Mbit (32 Kw x 96)
Page Mode Features
The page size is 8 words. After initial page access is accom-
plished, the page mode operation provides fast read access
speed of random locations within that page.
Standard Flash Memory Features
The device requires a
single 3.0 volt power supply
(2.7 V
to 3.3 V) for both read and write functions. Internally gener-
ated and regulated voltages are provided for the program
and erase operations.
December 18, 2003
Am49PDL127AH/Am49PDL129AH
3
