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FQB19N20CTM

MOSFET N-CH 200V 19A D2PAK

器件类别:分立半导体    晶体管   

厂商名称:ON Semiconductor(安森美)

厂商官网:http://www.onsemi.cn

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器件参数
参数名称
属性值
Brand Name
ON Semiconductor
是否无铅
不含铅
厂商名称
ON Semiconductor(安森美)
包装说明
SMALL OUTLINE, R-PSSO-G2
制造商包装代码
418AJ
Reach Compliance Code
not_compliant
ECCN代码
EAR99
Factory Lead Time
8 weeks
雪崩能效等级(Eas)
433 mJ
外壳连接
DRAIN
配置
SINGLE WITH BUILT-IN DIODE
最小漏源击穿电压
200 V
最大漏极电流 (Abs) (ID)
19 A
最大漏极电流 (ID)
19 A
最大漏源导通电阻
0.17 Ω
FET 技术
METAL-OXIDE SEMICONDUCTOR
JESD-30 代码
R-PSSO-G2
JESD-609代码
e3
湿度敏感等级
1
元件数量
1
端子数量
2
工作模式
ENHANCEMENT MODE
最高工作温度
150 °C
封装主体材料
PLASTIC/EPOXY
封装形状
RECTANGULAR
封装形式
SMALL OUTLINE
峰值回流温度(摄氏度)
NOT SPECIFIED
极性/信道类型
N-CHANNEL
最大功率耗散 (Abs)
139 W
最大脉冲漏极电流 (IDM)
76 A
认证状态
Not Qualified
表面贴装
YES
端子面层
Tin (Sn)
端子形式
GULL WING
端子位置
SINGLE
处于峰值回流温度下的最长时间
NOT SPECIFIED
晶体管应用
SWITCHING
晶体管元件材料
SILICON
Base Number Matches
1
文档预览
Is Now Part of
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www.onsemi.com
Please note: As part of the Fairchild Semiconductor integration, some of the Fairchild orderable part numbers
will need to change in order to meet ON Semiconductor’s system requirements. Since the ON Semiconductor
product management systems do not have the ability to manage part nomenclature that utilizes an underscore
(_), the underscore (_) in the Fairchild part numbers will be changed to a dash (-). This document may contain
device numbers with an underscore (_). Please check the ON Semiconductor website to verify the updated
device numbers. The most current and up-to-date ordering information can be found at
www.onsemi.com.
Please
email any questions regarding the system integration to
Fairchild_questions@onsemi.com.
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FQB19N20C — N-Channel QFET
®
MOSFET
November
2013
FQB19N20C
N-Channel
QFET
®
MOSFET
200
V,
19
A,
170
Description
This N-Channel enhancement mode power MOSFET is
produced using Fairchild Semiconductor’s proprietary
planar stripe and DMOS technology. This advanced
MOSFET technology has been especially tailored to
reduce on-state resistance, and to provide superior
switching performance and high avalanche energy
strength. These devices are suitable for switched mode
power supplies, active power factor correction (PFC),
and electronic lamp ballasts.
Features
19.0
A,
200
V, R
DS(on)
=
170
mΩ (Max.) @ V
GS
= 10 V,
I
D
=
9.5
A
• Low Gate Charge (Typ.
40.5
nC)
• Low C
rss
(Typ.
85
pF)
• 100% Avalanche Tested
• RoHS
Compliant
D
D
G
G
S
D
2
-PAK
S
Absolute Maximum Ratings
Symbol
V
DSS
I
D
I
DM
V
GSS
E
AS
I
AR
E
AR
dv/dt
P
D
Drain-Source Voltage
Drain Current
T
C
= 25°C unless otherwise noted.
Parameter
- Continuous (T
C
= 25°C)
- Continuous (T
C
= 100°C)
Drain Current
Gate-Source voltage
Single Pulsed Avalanche Energy
Avalanche Current
Repetitive Avalanche Energy
Peak Diode Recovery dv/dt
Power Dissipation
Power Dissipation
(T
A
= 25°C)*
(T
C
= 25°C)
- Derate above 25°C
(Note 2)
(Note 1)
(Note 1)
(Note 3)
FQB19N20CTM
200
19.0
12.1
(Note 1)
Unit
V
A
A
A
V
mJ
A
mJ
V/ns
W
W
W/°C
°C
°C
- Pulsed
76.0
±
30
433
19.0
13.9
5.5
3.13
139
1.11
-55 to +150
300
T
J,
T
STG
T
L
Operating and Storage Temperature Range
Maximum Lead Temperature for Soldering Purpose,
1/8” from Case for 5 Seconds
Thermal Characteristics
Symbol
R
JC
R
JA
Parameter
Thermal Resistance, Junction to Case, Max.
Thermal Resistance, Junction to Ambient (Minimum
Pad
of 2-oz
Copper),
Max.
Thermal Resistance, Junction to Ambient (*1 in
2
Pad
of 2-oz
Copper),
Max.
1
FQB19N20CTM
0.9
62.5
40
Unit
o
C/W
©2004 Fairchild Semiconductor Corporation
FQB19N20C
Rev. C1
www.fairchildsemi.com
FQB19N20C — N-Channel QFET
®
MOSFET
Package Marking and Ordering Information
Device Marking
FQB19N20C
Device
FQB19N20CTM
Package
D
2
-PAK
Reel Size
330 mm
Tape Width
24 mm
Quantity
800
units
Electrical Characteristics
Symbol
Off Characteristics
BV
DSS
∆BV
DSS
/
∆T
J
I
DSS
I
GSSF
I
GSSR
V
GS(th)
R
DS(on)
g
FS
C
iss
C
oss
C
rss
t
d(on)
t
r
t
d(off)
t
f
Q
g
Q
gs
Q
gd
I
S
I
SM
V
SD
t
rr
Q
rr
Notes:
T
C
= 25°C unless otherwise noted.
Parameter
Drain-Source Breakdown Voltage
Breakdown Voltage Temperature
Coefficient
Zero Gate Voltage Drain Current
Gate-Body Leakage Current, Forward
Gate-Body Leakage Current, Reverse
Gate Threshold Voltage
Static Drain-Source
On-Resistance
Forward Transconductance
Input Capacitance
Output Capacitance
Reverse Transfer Capacitance
Turn-On Delay Time
Turn-On Rise Time
Turn-Off Delay Time
Turn-Off Fall Time
Total Gate Charge
Gate-Source Charge
Gate-Drain Charge
Conditions
V
GS
= 0 V, I
D
= 250
µA
I
D
= 250
µA,
Referenced to 25°C
V
DS
=
200
V, V
GS
= 0 V
V
DS
=
160
V, T
C
= 125°C
V
GS
= 30 V, V
DS
= 0 V
V
GS
= -30 V, V
DS
= 0 V
V
DS
= V
GS
, I
D
= 250
µA
V
GS
= 10 V, I
D
=
9.5
A
V
DS
= 40 V, I
D
=
9.5
A
V
DS
= 25 V, V
GS
= 0 V,
f = 1.0 MHz
Min
200
--
--
--
--
--
2.0
--
--
--
--
--
Typ
--
0.24
--
--
--
--
--
0.14
10.8
830
195
85
10
150
135
115
40.5
6.0
22.5
--
--
--
208
1.63
Max
--
--
10
100
100
-100
4.0
0.17
--
1080
255
110
40
310
280
240
53
--
--
19.0
76.0
1.5
--
--
Unit
V
V/
ο
C
µA
µA
nA
nA
V
S
pF
pF
pF
ns
ns
ns
ns
nC
nC
nC
A
A
V
ns
µC
On Characteristics
Dynamic Characteristics
Switching Characteristics
V
DD
=
100
V, I
D
=
19.0
A
R
G
= 25
(Note 4)
--
--
--
--
--
--
(Note 4)
V
DS
=
160
V, I
D
=
19.0
A
V
GS
= 10 V
--
--
--
--
--
--
Drain-Source Diode Characteristics and Maximum Ratings
Maximum Continuous Drain-Source Diode Forward Current
Maximum Pulsed Drain-Source Diode Forward Current
Drain-Source Diode Forward Voltage
Reverse Recovery Time
Reverse Recovery Charge
V
GS
= 0 V, I
S
=
19.0
A
V
GS
= 0 V, I
S
=
19.0
A
dI
F
/dt =100 A/µs
1. Repetitive
rating: pulse-width
limited by maximum junction temperature.
2. L =
1.8
mH, I
AS
=
19.0
A, V
DD
= 50 V, R
G
= 25
Ω,
starting
T
J
= 25°C.
3. I
SD
19.0
A, di/dt
300
A/µs, V
DD
BV
DSS,
starting
T
J
= 25°C.
4.
Essentially
independent
of
operating temperature.
©2004 Fairchild Semiconductor Corporation
FQB19N20C
Rev. C1
2
www.fairchildsemi.com
FQB19N20C — N-Channel QFET
®
MOSFET
Typical Characteristics
Top :
I
D
, Drain Current [A]
I
D
, Drain Current [A]
10
1
V
GS
15.0 V
10.0 V
8.0 V
7.0 V
6.5 V
6.0 V
5.5 V
5.0 V
Bottom : 4.5 V
10
1
150 C
o
25 C
10
0
o
-55 C
o
10
0
Notes :
1. 250µ s Pulse Test
2. T
C
= 25
-1
10
10
0
10
1
10
-1
Notes :
1. V
DS
= 40V
2. 250µ s Pulse Test
2
4
6
8
10
V
DS
, Drain-Source Voltage [V]
V
GS
, Gate-Source Voltage [V]
Figure 1. On-Region Characteristics
Figure 2. Transfer Characteristics
0.8
R
DS(ON)
[Ω ],
Drain-Source On-Resistance
0.6
I
DR
, Reverse Drain Current [A]
10
1
0.4
V
GS
= 10V
10
0
150
0.2
V
GS
= 20V
Note : T
J
= 25
25
Notes :
1. V
GS
= 0V
2. 250µ s Pulse Test
0.0
0
10
20
30
40
50
60
10
-1
0.0
0.4
0.8
1.2
1.6
2.0
2.4
I
D
, Drain Current [A]
V
SD
, Source-Drain voltage [V]
Figure 3. On-Resistance Variation vs
Drain Current and Gate Voltage
Figure 4. Body Diode Forward Voltage
Variation with Source Current
and Temperature
3000
2500
C
iss
= C
gs
+ C
gd
(C
ds
= shorted)
C
oss
= C
ds
+ C
gd
C
rss
= C
gd
12
V
GS
, Gate-Source Voltage [V]
10
V
DS
= 40V
V
DS
= 100V
V
DS
= 160V
Capacitance [pF]
2000
8
C
iss
1500
C
oss
C
rss
Notes :
1. V
GS
= 0 V
2. f = 1 MHz
0
1
6
1000
4
500
2
Note : I
D
= 19.0A
0
-1
10
10
10
0
0
10
20
30
40
50
V
DS
, Drain-Source Voltage [V]
Q
G
, Total Gate Charge [nC]
Figure 5. Capacitance Characteristics
Figure 6. Gate Charge Characteristics
©2004 Fairchild Semiconductor Corporation
FQB19N20C
Rev. C1
3
www.fairchildsemi.com
FQB19N20C — N-Channel QFET
®
MOSFET
Typical Characteristics
(Continued)
1.2
3.0
BV
DSS
, (Normalized)
Drain-Source Breakdown Voltage
1.1
R
DS(ON)
, (Normalized)
Drain-Source On-Resistance
2.5
2.0
1.0
1.5
1.0
Notes :
1. V
GS
= 10 V
2. I
D
= 9.5 A
0.9
Notes :
1. V
GS
= 0 V
2. I
D
= 250 µA
0.5
0.8
-100
-50
0
50
100
o
150
200
0.0
-100
-50
0
50
100
o
150
200
T
J
, Junction Temperature [ C]
T
J
, Junction Temperature [ C]
Figure 7. Breakdown Voltage Variation
vs Temperature
Figure 8. On-Resistance Variation
vs Temperature
Operation in This Area
is Limited by R
DS(on)
20
10
2
I
D
, Drain Current [A]
100
µ
s
1 ms
10
1
15
10 ms
DC
I
D
, Drain Current [A]
10
10
0
Notes :
1. T
C
= 25 C
2. T
J
= 150 C
3. Single Pulse
o
o
5
10
-1
10
0
10
1
10
2
0
25
50
75
100
125
150
V
DS
, Drain-Source Voltage [V]
T
C
, Case Temperature [
]
Figure 9. Maximum Safe Operating Area
Figure 10. Maximum Drain Current
vs Case Temperature
Z
θJC
(t), Thermal Response [
o
C/W]
10
0
D = 0 .5
0 .2
10
-1
0 .1
0 .0 5
0 .0 2
0 .0 1
N o te s :
1 . Z
θ
J C
( t) = 0 . 9 0
/W M a x .
2 . D u t y F a c to r , D = t
1
/t
2
3 . T
J M
- T
C
= P
D M
* Z
θ
J C
( t)
P
DM
s in g le p u ls e
t
1
10
-2
t
2
10
-5
10
-4
10
-3
10
-2
10
-1
10
0
10
1
t
1
, S q u a r e W a v e P u ls e D u r a t io n [ s e c ]
Figure 11. Transient Thermal Response Curve
©2004 Fairchild Semiconductor Corporation
FQB19N20C
Rev. C1
4
www.fairchildsemi.com
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参数对比
与FQB19N20CTM相近的元器件有:FQI19N20CTU。描述及对比如下:
型号 FQB19N20CTM FQI19N20CTU
描述 MOSFET N-CH 200V 19A D2PAK MOSFET N-CH 200V 19A I2PAK
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