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- DFT1 ClockScan (_optional)
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课时1:Introduction What Is Testing
课时2:Introduction Types Of Tests
课时3:Introduction TestQuality
课时4:Introduction Test Economics
课时5:ReferenceDedication (_optional)
课时6:LogicSim Intro
课时7:LogicSim Model
课时8:LogicSim CompliedCode
课时9:LogicSim EventDriven
课时10:LogicSim Parallel
课时11:LogicSim Issues (_ optional)
课时12:FaultModeling Intro
课时13:FaultModeling SSF
课时14:FaultModeling BridgeFault
课时15:FaultModeling DelayFault
课时16:FaultModeling TransistorFault (_ optional)
课时17:FaultModeling_ FaultDetect,FaultCoverage
课时18:Equivalent Fault Collapsing
课时19:Dominance Fault Collapsing, DFC (_optional)
课时20:FaultSim Intro
课时21:FaultSim Parallel
课时22:FaultSim Deductive
课时23:Concurrent Fault Simulation
课时24:FaultSim DiffFsim
课时25:FaultSim Alternatives
课时26:FaultSim IssueConclusion (_optional)
课时27:Testability Intro
课时28:Testability SCOAPseq (_optional)
课时29:Testability COP
课时30:Combinational ATPG Introduction
课时31:Combinational ATPG (Boolean Difference)
课时32:Combinational ATPG (Single Path Sensitization)
课时33:Combinational ATPG, D_algorithm
课时34:Combinational ATPG, PODEM
课时35:Combinational ATPG, FAN
课时36:Combinational ATPG, SAT
课时37:Combinational ATPG, acceleration techniques
课时38:Sequential ATPG Introduction
课时39:Sequential ATPG (9_valued)
课时40:Sequential ATPG (Backward Time Frame Processing)
课时41:Sequential ATPG Simulation (_optional)
课时42:Sequential ATPG Conclusion (_optional)
课时43:DelayTest Intro
课时44:Delay Test _ Path Sensitize
课时45:DelayTest PathTG
课时46:DelayTest PathFsim
课时47:DelayTest TransitionFsimTG
课时48:Diagnosis Intro
课时49:Diagnosis StaticCE
课时50:Diagnosis DynamicCE
课时51:Diagnosis EffectCause
课时52:Diagnosis, Chain Diagnosis (_optional)
课时53:DFT1 Intro
课时54:DFT1 ScanConcepts
课时55:DFT1 _ Test Mode Operation (SSF & Delay Test LOS_LOC)
课时56:DFT1 Muxed_D Scan ATPG model (_optional)
课时57:DFT1 ClockScan (_optional)
课时58:DFT1 LSSD
课时59:DFT1 ScanDesignFlow
课时60:DFT1 IssueSol
课时61:DFT2 JTAG Intro
课时62:DFT2 JTAG Registers
课时63:DFT2 JTAG Instruction
课时64:DFT2 JTAG Instruction (old version)
课时65:DFT2 Instruction2Conclude
课时66:BIST1 Intro
课时67:BIST1 LFSR
课时68:BIST1 _ LFSR seed solving
课时69:BIST1 LFSRpolynomial
课时70:BIST1 CA
课时71:BIST2 Intro
课时72:BIST2 SerialORA
课时73:BIST2 Parallel ORA MISR
课时74:BIST2 Architecture
课时75:BIST2 Design Phase Shifter for LFSR TPG
课时76:BIST2 IssuesConclude (_optional)_2
课时77:TestCompress Intro
课时78:TestCompress SoftwareSTC
课时79:Test Compress Hardware Stimulus (updated 5_10_2020)
课时80:TestCompress HardwareResponse (_optional)
课时81:MemTest Intro
课时82:Memory Test _ Classical algorithm
课时83:MemTest March
课时84:FunctionTest Intro
课时85:FunctionTest CheckExp
课时86:FunctionTest IOV
课时87:FunctionTest SV (_optional)
课程介绍共计87课时,1天9小时52分46秒
Lecture notes available on course website http://cc.ee.ntu.edu.tw/~cmli/VLSItes...
This course is based on the teaching materials of late Professor McCluskey, Stanford University